Showing 1–7 of 7 results for author: Zwolinski, M

SEA Cache: A Performance-Efficient Countermeasure for Contention-based Attacks

Authors: Xiao Liu, Mark Zwolinski, Basel Halak

Abstract: Many cache designs have been proposed to guard against contention-based side-channel attacks. One well-known type of cache is the randomized remapping cache. Many randomized remapping caches provide fixed or over protection, which leads to permanent performance degradation, or they provide flexible protection, but sacrifice performance against strong contention-based attacks. To improve the secure… ▽ More Many cache designs have been proposed to guard against contention-based side-channel attacks. One well-known type of cache is the randomized remapping cache. Many randomized remapping caches provide fixed or over protection, which leads to permanent performance degradation, or they provide flexible protection, but sacrifice performance against strong contention-based attacks. To improve the secure cache design, we extend an existing secure cache design, CEASER-SH cache, and propose the SEA cache. The novel cache configurations in both caches are logical associativity, which allows the cache line to be placed not only in its mapped cache set but also in the subsequent cache sets. SEA cache allows each user or each process to have a different local logical associativity. Hence, only those users or processes that request extra protection against contention-based attacks are protected with high logical associativity. Other users or processes can access the cache with lower latency and higher performance. Compared to a CEASER-SH cache with logical associativity of 8, an SEA cache with logical associativity of 1 for normal protection users and 16 for high protection users has a Cycles Per Instruction penalty that is about 0.6% less for users under normal protections and provides better security against contention-based attacks. Based on a 45nm technology library, and compared to a conventional cache, we estimate the power overhead is about 20% and the area overhead is 3.4%. △ Less

Submitted 30 May, 2024; originally announced May 2024.

Using Formal Verification to Evaluate Single Event Upsets in a RISC-V Core

Authors: Bing Xue, Mark Zwolinski

Abstract: Reliability has been a major concern in embedded systems. Higher transistor density and lower voltage supply increase the vulnerability of embedded systems to soft errors. A Single Event Upset (SEU), which is also called a soft error, can reverse a bit in a sequential element, resulting in a system failure. Simulation-based fault injection has been widely used to evaluate reliability, as suggested… ▽ More Reliability has been a major concern in embedded systems. Higher transistor density and lower voltage supply increase the vulnerability of embedded systems to soft errors. A Single Event Upset (SEU), which is also called a soft error, can reverse a bit in a sequential element, resulting in a system failure. Simulation-based fault injection has been widely used to evaluate reliability, as suggested by ISO26262. However, it is practically impossible to test all faults for a complex design. Random fault injection is a compromise that reduces accuracy and fault coverage. Formal verification is an alternative approach. In this paper, we use formal verification, in the form of model checking, to evaluate the hardware reliability of a RISC-V Ibex Core in the presence of soft errors. Backward tracing is performed to identify and categorize faults according to their effects (no effect, Silent Data Corruption, crashes, and hangs). By using formal verification, the entire state space and fault list can be exhaustively explored. It is found that misaligned instructions can amplify fault effects. It is also found that some bits are more vulnerable to SEUs than others. In general, most of the bits in the Ibex Core are vulnerable to Silent Data Corruption, and the second pipeline stage is more vulnerable to Silent Data Corruption than the first. △ Less

Submitted 20 May, 2024; originally announced May 2024.

EPP: interpretable score of model predictive power

Authors: Alicja Gosiewska, Mateusz Bakala, Katarzyna Woznica, Maciej Zwolinski, Przemyslaw Biecek

Abstract: The most important part of model selection and hyperparameter tuning is the evaluation of model performance. The most popular measures, such as AUC, F1, ACC for binary classification, or RMSE, MAD for regression, or cross-entropy for multilabel classification share two common weaknesses. First is, that they are not on an interval scale. It means that the difference in performance for the two model… ▽ More The most important part of model selection and hyperparameter tuning is the evaluation of model performance. The most popular measures, such as AUC, F1, ACC for binary classification, or RMSE, MAD for regression, or cross-entropy for multilabel classification share two common weaknesses. First is, that they are not on an interval scale. It means that the difference in performance for the two models has no direct interpretation. It makes no sense to compare such differences between datasets. Second is, that for k-fold cross-validation, the model performance is in most cases calculated as an average performance from particular folds, which neglects the information how stable is the performance for different folds. In this talk, we introduce a new EPP rating system for predictive models. We also demonstrate numerous advantages for this system, First, differences in EPP scores have probabilistic interpretation. Based on it we can assess the probability that one model will achieve better performance than another. Second, EPP scores can be directly compared between datasets. Third, they can be used for navigated hyperparameter tuning and model selection. Forth, we can create embeddings for datasets based on EPP scores. △ Less

Submitted 24 August, 2019; originally announced August 2019.

Comments: 8 pages, 4 figures

Implications of Burn-In Stress on NBTI Degradation

Authors: Mohd Azman Abdul Latif, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin, Mark Zwolinski

Abstract: Burn-in is accepted as a way to evaluate ageing effects in an accelerated manner. It has been suggested that burn-in stress may have a significant effect on the Negative Bias Temperature Instability (NBTI) of subthreshold CMOS circuits. This paper analyses the effect of burn-in on NBTI in the context of a Digital to Analogue Converter (DAC) circuit. Analogue circuits require matched device pairs;… ▽ More Burn-in is accepted as a way to evaluate ageing effects in an accelerated manner. It has been suggested that burn-in stress may have a significant effect on the Negative Bias Temperature Instability (NBTI) of subthreshold CMOS circuits. This paper analyses the effect of burn-in on NBTI in the context of a Digital to Analogue Converter (DAC) circuit. Analogue circuits require matched device pairs; NBTI may cause mismatches and hence circuit failure. The NBTI degradation observed in the simulation analysis indicates that under severe stress conditions, a significant voltage threshold mismatch in the DAC beyond the design specification of 2 mV limit can result. Experimental results confirm the sensitivity of the DAC circuit design to NBTI resulting from burn-in. △ Less

Submitted 5 October, 2015; originally announced October 2015.

In-Field Logic Repair of Deep Sub-Micron CMOS Processors

Authors: Massoud Mokhtarpour Ghahroodi, Mark Zwolinski

Abstract: Ultra Deep-Sub-Micron CMOS chips have to function correctly and reliably, not only during their early post-fabrication life, but also for their entire life span. In this paper, we present an architectural-level in-field repair technique. The key idea is to trade area for reliability by adding repair features to the system while keeping the power and the performance overheads as low as possible. In… ▽ More Ultra Deep-Sub-Micron CMOS chips have to function correctly and reliably, not only during their early post-fabrication life, but also for their entire life span. In this paper, we present an architectural-level in-field repair technique. The key idea is to trade area for reliability by adding repair features to the system while keeping the power and the performance overheads as low as possible. In the case of permanent faults, spare blocks will replace the faulty blocks on the fly. Meanwhile by shutting down the main logic blocks, partial threshold voltage recovery can be achieved which will alleviate the ageing-related delays and timing issues. The technique can avoid fatal shut-downs in the system and will decrease the down-time, hence the availability of such a system will be preserved. We have implemented the proposed idea on a pipelined processor core using a conventional ASIC design flow. The simulation results show that by tolerating about 70% area overhead and less than 18% power overhead we can dramatically increase the reliability and decrease the downtime of the processor. △ Less

Submitted 30 September, 2015; originally announced September 2015.

Fault Tolerance in Distributed Neural Computing

Authors: Anton Kulakov, Mark Zwolinski, Jeff Reeve

Abstract: With the increasing complexity of computing systems, complete hardware reliability can no longer be guaranteed. We need, however, to ensure overall system reliability. One of the most important features of artificial neural networks is their intrinsic fault-tolerance. The aim of this work is to investigate whether such networks have features that can be applied to wider computational systems. This… ▽ More With the increasing complexity of computing systems, complete hardware reliability can no longer be guaranteed. We need, however, to ensure overall system reliability. One of the most important features of artificial neural networks is their intrinsic fault-tolerance. The aim of this work is to investigate whether such networks have features that can be applied to wider computational systems. This paper presents an analysis, in both the learning and operational phases, of a distributed feed-forward neural network with decentralised event-driven time management, which is insensitive to intermittent faults caused by unreliable communication or faulty hardware components. The learning rules used in the model are local in space and time, which allows efficient scalable distributed implementation. We investigate the overhead caused by injected faults and analyse the sensitivity to limited failures in the computational hardware in different areas of the network. △ Less

Submitted 30 September, 2015; originally announced September 2015.

Reversible Logic to Cryptographic Hardware: A New Paradigm

Authors: Himanshu Thapliyal, Mark Zwolinski

Abstract: Differential Power Analysis (DPA) presents a major challenge to mathematically-secure cryptographic protocols. Attackers can break the encryption by measuring the energy consumed in the working digital circuit. To prevent this type of attack, this paper proposes the use of reversible logic for designing the ALU of a cryptosystem. Ideally, reversible circuits dissipate zero energy. Thus, it would… ▽ More Differential Power Analysis (DPA) presents a major challenge to mathematically-secure cryptographic protocols. Attackers can break the encryption by measuring the energy consumed in the working digital circuit. To prevent this type of attack, this paper proposes the use of reversible logic for designing the ALU of a cryptosystem. Ideally, reversible circuits dissipate zero energy. Thus, it would be of great significance to apply reversible logic to designing secure cryptosystems. As far as is known, this is the first attempt to apply reversible logic to developing secure cryptosystems. In a prototype of a reversible ALU for a crypto-processor, reversible designs of adders and Montgomery multipliers are presented. The reversible designs of a carry propagate adder, four-to-two and five-to-two carry save adders are presented using a reversible TSG gate. One of the important properties of the TSG gate is that it can work singly as a reversible full adder. In order to design the reversible Montgomery multiplier, novel reversible sequential circuits are also proposed which are integrated with the proposed adders to design a reversible modulo multiplier. It is intended that this paper will provide a starting point for developing cryptosystems secure against DPA attacks. △ Less

Submitted 14 October, 2006; originally announced October 2006.

Comments: Published in the proceedings of the The 49th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS 2006), Puerto Rico, August 2006. Nominated for the Student Paper Award