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Computer Science > Other Computer Science

arXiv:1510.01370 (cs)
[Submitted on 5 Oct 2015]

Title:Implications of Burn-In Stress on NBTI Degradation

Authors:Mohd Azman Abdul Latif, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin, Mark Zwolinski
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Abstract:Burn-in is accepted as a way to evaluate ageing effects in an accelerated manner. It has been suggested that burn-in stress may have a significant effect on the Negative Bias Temperature Instability (NBTI) of subthreshold CMOS circuits. This paper analyses the effect of burn-in on NBTI in the context of a Digital to Analogue Converter (DAC) circuit. Analogue circuits require matched device pairs; NBTI may cause mismatches and hence circuit failure. The NBTI degradation observed in the simulation analysis indicates that under severe stress conditions, a significant voltage threshold mismatch in the DAC beyond the design specification of 2 mV limit can result. Experimental results confirm the sensitivity of the DAC circuit design to NBTI resulting from burn-in.
Subjects: Other Computer Science (cs.OH)
Cite as: arXiv:1510.01370 [cs.OH]
  (or arXiv:1510.01370v1 [cs.OH] for this version)
  https://doi.org/10.48550/arXiv.1510.01370
Related DOI: https://doi.org/10.13140/RG.2.1.5057.0965

Submission history

From: Mark Zwolinski [view email]
[v1] Mon, 5 Oct 2015 21:24:18 UTC (288 KB)
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Mohd Azman Abdul Latif
Noohul Basheer Zain Ali
Fawnizu Azmadi Hussin
Mark Zwolinski
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