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Mumott -- a Python package for the analysis of multi-modal tensor tomography data
Authors:
Leonard C. Nielsen,
Mads Carlsen,
Sici Wang,
Arthur Baroni,
Torne Tänzer,
Marianne Liebi,
Paul Erhart
Abstract:
Small and wide angle x-ray scattering tensor tomography are powerful methods for studying anisotropic nanostructures in a volume-resolved manner, and are becoming increasingly available to users of synchrotron facilities. The analysis of such experiments requires, however, advanced procedures and algorithms, which creates a barrier for the wider adoption of these techniques. Here, in response to t…
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Small and wide angle x-ray scattering tensor tomography are powerful methods for studying anisotropic nanostructures in a volume-resolved manner, and are becoming increasingly available to users of synchrotron facilities. The analysis of such experiments requires, however, advanced procedures and algorithms, which creates a barrier for the wider adoption of these techniques. Here, in response to this challenge, we introduce the mumott package. It is written in Python with computationally demanding tasks handled via just-in-time compilation using both CPU and GPU resources. The package is being developed with a focus on usability and extensibility, while achieving a high computational efficiency. Following a short introduction to the common workflow, we review key features, outline the underlying object-oriented framework, and demonstrate the computational performance. By developing the mumott package and making it generally available, we hope to lower the threshold for the adoption of tensor tomography and to make these techniques accessible to a larger research community.
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Submitted 23 April, 2025;
originally announced April 2025.
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Resolving the sodiation process in hard carbon anodes with nanostructure specific X-ray imaging
Authors:
Martina Olsson,
Antoine Klein,
Nataliia Mozhzhukhina,
Shizhao Xiong,
Christian Appel,
Mads Carlsen,
Leonard Nielsen,
Linnea Rensmo,
Marianne Liebi,
Aleksandar Matic
Abstract:
Hard carbons show significant promise as anode materials for sodium-ion batteries. However, monitoring the sodiation process in the hard carbon electrode during cycling and understanding the sodiation mechanism remain challenging. This article reports on operando 2D scanning small- and wide-angle X-ray scattering (SWAXS) and ex situ 3D SAXS tomography of hard carbon electrodes during the sodiation…
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Hard carbons show significant promise as anode materials for sodium-ion batteries. However, monitoring the sodiation process in the hard carbon electrode during cycling and understanding the sodiation mechanism remain challenging. This article reports on operando 2D scanning small- and wide-angle X-ray scattering (SWAXS) and ex situ 3D SAXS tomography of hard carbon electrodes during the sodiation process. Structural changes are monitored with spatial and temporal resolution during the electrochemical process and shows that sodiation through micropore filling is the more dominating mechanism in the later stages of sodiation, i.e. in the plateau region of the voltage profile, while intercalation occurs continuously. Spatial inhomogeneities are resolved over the electrode and reveal an increased level of inhomogeneity at higher degree of sodiation with regions of different degrees of micropore filling. Resolving the processes spatially enables us to correlate plating, starting from the interface between the electrode and the current collector, to a higher degree of micropore filling. The work demonstrates how SWAXS imaging can contribute to understanding the sodiation of hard carbon anodes, not only by spatially resolved analysis, but also as a method to decouple contributions from different components in a cell, enabling more accurate scattering analysis in in situ environments.
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Submitted 23 May, 2025; v1 submitted 17 February, 2025;
originally announced February 2025.
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Texture tomography with high angular resolution utilizing sparsity
Authors:
Mads Carlsen,
Florencia Malamud,
Peter Modregger,
Anna Wildeis,
Markus Hartmann,
Robert Brandt,
Andreas Menzel,
Marianne Liebi
Abstract:
We demonstrate a novel approach to the reconstruction of scanning probe x-ray diffraction tomography data with anisotropic poly crystalline samples. The method involves reconstructing a voxel map containing an orientation distribution function in each voxel of an extended 3D sample. This method differs from existing approaches by not relying on a peak-finding and is therefore applicable to sample…
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We demonstrate a novel approach to the reconstruction of scanning probe x-ray diffraction tomography data with anisotropic poly crystalline samples. The method involves reconstructing a voxel map containing an orientation distribution function in each voxel of an extended 3D sample. This method differs from existing approaches by not relying on a peak-finding and is therefore applicable to sample systems consisting of small and highly mosaic crystalline domains that are not handled well by existing methods. Samples of interest include bio-minerals and a range of small-graines microstructures common in engineering metals. By choosing a particular kind of basis functions, we can effectively utilize non-negativity in orientation-space for samples with sparse texture. This enables us to achieve stable solutions at high angular resolutions where the problem would otherwise be under determined. We demonstrate the new approach using data from a shot peened martensite sample where we are able to map the twinning micro structure in the interior of a bulk sample without resolving the individual lattice domains. We also demonstrate the approach on a piece of gastropods shell with a mosaic micro structure.
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Submitted 23 September, 2024; v1 submitted 1 July, 2024;
originally announced July 2024.
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Spatially resolved mapping of coherent twin relationships in DFXM measurements
Authors:
Mads Carlsen,
Marion Hoefling,
Carsten Detlefs,
Hugh Simons
Abstract:
With dark firld x-ray microscopy, it is possible to measure reciprocal space manps of localized volumes embedded deeply in a large sample. Ferroelastic materials contains elastic twins that display characteristing splitting of diffraction peaks. We show how to utilize established methods for analysing reciprocal space maps of elastically twinned materials to the analysis of dark-field x-ray micros…
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With dark firld x-ray microscopy, it is possible to measure reciprocal space manps of localized volumes embedded deeply in a large sample. Ferroelastic materials contains elastic twins that display characteristing splitting of diffraction peaks. We show how to utilize established methods for analysing reciprocal space maps of elastically twinned materials to the analysis of dark-field x-ray microscopy data to detemin the exact kind of domain wall present in each probed volume, even when the domains are not spatially resolved.
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Submitted 12 January, 2024;
originally announced January 2024.
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Simulating dark-field x-ray microscopy images with wave front propagation techniques
Authors:
Mads Carlsen,
Carsten Detlefs,
Can Yildirim,
Trygve Ræder,
Hugh Simons
Abstract:
Dark-Field X-ray Microscopy (DFXM) is a diffraction-based synchrotron imaging techique capable of imaging defects in the bulk of extended crystalline samples. We present numerical simulations of image-formation in such a microscope using numerical integration of the dynamical Takagi-Taupin Equations (TTE) and wave front propagation. We validate our approach by comparing simulated images to experim…
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Dark-Field X-ray Microscopy (DFXM) is a diffraction-based synchrotron imaging techique capable of imaging defects in the bulk of extended crystalline samples. We present numerical simulations of image-formation in such a microscope using numerical integration of the dynamical Takagi-Taupin Equations (TTE) and wave front propagation. We validate our approach by comparing simulated images to experimental data from a near-perfect single crystal of diamond containing a single stacking fault defect in the illuminated volume.
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Submitted 23 February, 2022; v1 submitted 19 January, 2022;
originally announced January 2022.
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X-ray Free Electron Laser based Dark-Field X-ray Microscopy
Authors:
Theodor Secanell Holstad,
Trygve Magnus Raeder,
Mads Allerup Carlsen,
Erik Bergback Knudsen,
Leora Dresselhaus-Marais,
Kristoffer Haldrup,
Hugh Simons,
Martin Meedom Nielsen,
Henning Friis Poulsen
Abstract:
Dark-field X-ray microscopy (DFXM) is a nondestructive full-field imaging technique providing three dimensional mapping of microstructure and local strain fields in deeply embedded crystalline elements. This is achieved by placing an objective lens in the diffracted beam, giving a magnified projection image. So far, the method has been applied with a time resolution of milliseconds to hours. In th…
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Dark-field X-ray microscopy (DFXM) is a nondestructive full-field imaging technique providing three dimensional mapping of microstructure and local strain fields in deeply embedded crystalline elements. This is achieved by placing an objective lens in the diffracted beam, giving a magnified projection image. So far, the method has been applied with a time resolution of milliseconds to hours. In this work, we consider the feasibility of DFXM at the picosecond time scale using an X-ray free electron laser source and a pump-probe scheme. We combine thermomechanical strain wave simulations with geometrical optics and wavefront propagation optics to simulate DFXM images of phonon dynamics in a diamond single crystal. Using the specifications of the XCS instrument at the Linac Coherent Light Source (LCLS) as an example results in simulated DFXM images clearly showing the propagation of a strain wave.
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Submitted 2 November, 2021;
originally announced November 2021.
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Geometrical Optics Formalism to Model Contrast in Dark-Field X-ray Microscopy
Authors:
H. F. Poulsen,
L. E. Dresselhaus-Marais,
M. A. Carlsen,
C. Detlefs,
G. Winther
Abstract:
Dark-field X-ray microscopy is a new full-field imaging technique that nondestructively maps the structure and local strain inside deeply embedded crystalline elements in three dimensions. Placing an objective lens in the diffracted beam generates a magnified projection image of a local volume. We provide a general formalism based on geometrical optics for the diffraction imaging, valid for any cr…
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Dark-field X-ray microscopy is a new full-field imaging technique that nondestructively maps the structure and local strain inside deeply embedded crystalline elements in three dimensions. Placing an objective lens in the diffracted beam generates a magnified projection image of a local volume. We provide a general formalism based on geometrical optics for the diffraction imaging, valid for any crystallographic space group. This allows simulation of diffraction images based on micro-mechanical models. We present example simulations with the formalism, demonstrating how it may be used to design new experiments or interpret existing ones. In particular, we show how modifications to the experimental design may tailor the reciprocal-space resolution function to map specific components of the deformation gradient tensor. The formalism supports multi-length scale experiments, as it enables DFXM to be interfaced with 3DXRD. The formalism is demonstrated by comparison to experimental images of the strain field around a straight dislocation.
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Submitted 18 July, 2020;
originally announced July 2020.
