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Condensed Matter > Materials Science

arXiv:2201.07549 (cond-mat)
[Submitted on 19 Jan 2022 (v1), last revised 23 Feb 2022 (this version, v2)]

Title:Simulating dark-field x-ray microscopy images with wave front propagation techniques

Authors:Mads Carlsen, Carsten Detlefs, Can Yildirim, Trygve Ræder, Hugh Simons
View a PDF of the paper titled Simulating dark-field x-ray microscopy images with wave front propagation techniques, by Mads Carlsen and 4 other authors
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Abstract:Dark-Field X-ray Microscopy (DFXM) is a diffraction-based synchrotron imaging techique capable of imaging defects in the bulk of extended crystalline samples. We present numerical simulations of image-formation in such a microscope using numerical integration of the dynamical Takagi-Taupin Equations (TTE) and wave front propagation. We validate our approach by comparing simulated images to experimental data from a near-perfect single crystal of diamond containing a single stacking fault defect in the illuminated volume.
Subjects: Materials Science (cond-mat.mtrl-sci)
Cite as: arXiv:2201.07549 [cond-mat.mtrl-sci]
  (or arXiv:2201.07549v2 [cond-mat.mtrl-sci] for this version)
  https://doi.org/10.48550/arXiv.2201.07549
arXiv-issued DOI via DataCite

Submission history

From: Mads Allerup Carlsen [view email]
[v1] Wed, 19 Jan 2022 11:59:56 UTC (5,206 KB)
[v2] Wed, 23 Feb 2022 09:52:10 UTC (1,911 KB)
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