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Condensed Matter > Materials Science

arXiv:cond-mat/0411177 (cond-mat)
[Submitted on 7 Nov 2004]

Title:Sub 20 nm Short Channel Carbon Nanotube Transistors

Authors:R. V. Seidel, A. P. Graham, J. Kretz, B. Rajasekharan, G. S. Duesberg, M. Liebau, E. Unger, F. Kreupl, W. Hoenlein
View a PDF of the paper titled Sub 20 nm Short Channel Carbon Nanotube Transistors, by R. V. Seidel and 8 other authors
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Abstract: Carbon nanotube field-effect transistors with sub 20 nm long channels and on/off current ratios of > 1000000 are demonstrated. Individual single-walled carbon nanotubes with diameters ranging from 0.7 nm to 1.1 nm grown from structured catalytic islands using chemical vapor deposition at 700 degree Celsius form the channels. Electron beam lithography and a combination of HSQ, calix[6]arene and PMMA e-beam resists were used to structure the short channels and source and drain regions. The nanotube transistors display on-currents in excess of 15 microA for drain-source biases of only 0.4 Volt.
Comments: Nano Letters in press
Subjects: Materials Science (cond-mat.mtrl-sci)
Cite as: arXiv:cond-mat/0411177 [cond-mat.mtrl-sci]
  (or arXiv:cond-mat/0411177v1 [cond-mat.mtrl-sci] for this version)
  https://doi.org/10.48550/arXiv.cond-mat/0411177
arXiv-issued DOI via DataCite
Related DOI: https://doi.org/10.1021/nl048312d
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Submission history

From: Franz Kreupl [view email]
[v1] Sun, 7 Nov 2004 14:03:59 UTC (280 KB)
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