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Condensed Matter > Materials Science

arXiv:cond-mat/0305687 (cond-mat)
[Submitted on 29 May 2003 (v1), last revised 30 May 2003 (this version, v2)]

Title:Magnetic anisotropy and magnetoresistance of sputtered [(FeTaN)/(TaN)](n) multilayers

Authors:H.B. Nie, S. Y. Xu, J. Li, C.K. Ong, J.P. Wang
View a PDF of the paper titled Magnetic anisotropy and magnetoresistance of sputtered [(FeTaN)/(TaN)](n) multilayers, by H.B. Nie and 4 other authors
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Abstract: We studied the in-plane magnetic anisotropy of rf (radio frequency) sputtered [(FeTaN)/(TaN)](n) multilayers synthesized on Si substrates. In the multilayers where n=5, the FeTaN thickness is fixed at 30 nm and the thickness of TaN, t(TaN), is varied from 0 to 6.0 nm, we observed a clear trend that, with increasing t(TaN), the values of coercivity, grain size, and amplitude of maximum magnetoresistance (MR) of the samples all decrease first and then increase after reaching a minimum when t(TaN) is around 2.0-4.0 nm. This trend is also associated with an evolution of in-plane magnetic anisotropy, where the multilayers change from uniaxial anisotropy to biaxial at t(TaN) around 4.0 nm and above. We attribute the phenomena to the interlayer coupling effect of FeTaN films as a function of the coupling layer (TaN) thickness, rather than to the thickness dependence observed in single-layered FeTaN films, where the direction of easy axis switches 90degrees when the film is thicker than 300 nm. The in-plane anisotropy of the [(FeTaN)/(TaN)](n) multilayers also shows signs of oscillation when the number of coupling layers varies. The MR effects observed are mainly due to anisotropy MR (AMR), while the grain size and exchange coupling may also contribute to the change of maximum MR ratios in the multilayers with changing t(TaN).
Subjects: Materials Science (cond-mat.mtrl-sci)
Cite as: arXiv:cond-mat/0305687 [cond-mat.mtrl-sci]
  (or arXiv:cond-mat/0305687v2 [cond-mat.mtrl-sci] for this version)
  https://doi.org/10.48550/arXiv.cond-mat/0305687
arXiv-issued DOI via DataCite
Journal reference: JOURNAL OF APPLIED PHYSICS 91 (10): 7532-7534 Part 2 MAY 15 2002

Submission history

From: Hb Nie [view email]
[v1] Thu, 29 May 2003 14:44:23 UTC (378 KB)
[v2] Fri, 30 May 2003 04:28:22 UTC (378 KB)
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