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Physics > Instrumentation and Detectors

arXiv:2409.11207 (physics)
[Submitted on 17 Sep 2024]

Title:Comparison of Impedance Matching Networks for Scanning Microwave Microscopy

Authors:Johannes Hoffmann, Sophie de Preville, Bruno Eckmann, Hung-Ju Lin, Benedikt Herzog, Kamel Haddadi, Didier Theron, Georg Gramse, Damien Richert, Jose Moran-Meza, Francois Piquemal
View a PDF of the paper titled Comparison of Impedance Matching Networks for Scanning Microwave Microscopy, by Johannes Hoffmann and 9 other authors
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Abstract:In this paper, a definition of the gain and added noise of impedance matching networks for scanning microwave microscopy is given. This definition can be used to compare different impedance matching techniques independently of the instrument used to measure the S-parameter. As a demonstration, impedance matching devices consisting of a Beatty line, a tuner, and interferometric setups with and without amplifiers have been investigated. Measurement frequencies up to 28 GHz are used, and the maximal resulting gain found was 9504.7 per Siemens.
Comments: IEEE Transactions on Instrumentation and Measurement (2024)
Subjects: Instrumentation and Detectors (physics.ins-det)
Cite as: arXiv:2409.11207 [physics.ins-det]
  (or arXiv:2409.11207v1 [physics.ins-det] for this version)
  https://doi.org/10.48550/arXiv.2409.11207
arXiv-issued DOI via DataCite
Related DOI: https://doi.org/10.1109/TIM.2024.3378310
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From: Johannes Hoffmann [view email]
[v1] Tue, 17 Sep 2024 14:02:13 UTC (393 KB)
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