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Computer Science > Computer Vision and Pattern Recognition

arXiv:2408.02427 (cs)
[Submitted on 5 Aug 2024]

Title:Attenuation-adjusted deep learning of pore defects in 2D radiographs of additive manufacturing powders

Authors:Andreas Bjerregaard, David Schumacher, Jon Sporring
View a PDF of the paper titled Attenuation-adjusted deep learning of pore defects in 2D radiographs of additive manufacturing powders, by Andreas Bjerregaard and David Schumacher and Jon Sporring
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Abstract:The presence of gas pores in metal feedstock powder for additive manufacturing greatly affects the final AM product. Since current porosity analysis often involves lengthy X-ray computed tomography (XCT) scans with a full rotation around the sample, motivation exists to explore methods that allow for high throughput -- possibly enabling in-line porosity analysis during manufacturing. Through labelling pore pixels on single 2D radiographs of powders, this work seeks to simulate such future efficient setups. High segmentation accuracy is achieved by combining a model of X-ray attenuation through particles with a variant of the widely applied UNet architecture; notably, F1-score increases by $11.4\%$ compared to the baseline UNet. The proposed pore segmentation is enabled by: 1) pretraining on synthetic data, 2) making tight particle cutouts, and 3) subtracting an ideal particle without pores generated from a distance map inspired by Lambert-Beers law. This paper explores four image processing methods, where the fastest (yet still unoptimized) segments a particle in mean $0.014s$ time with F1-score $0.78$, and the most accurate in $0.291s$ with F1-score $0.87$. Due to their scalable nature, these strategies can be involved in making high throughput porosity analysis of metal feedstock powder for additive manufacturing.
Comments: Implementation on this https URL
Subjects: Computer Vision and Pattern Recognition (cs.CV); Machine Learning (cs.LG); Image and Video Processing (eess.IV)
MSC classes: 68U10 (Primary) 68T45, 68T07, 94A08 (Secondary)
ACM classes: I.4.6; I.4.1; J.2; I.2.10; I.5.4
Cite as: arXiv:2408.02427 [cs.CV]
  (or arXiv:2408.02427v1 [cs.CV] for this version)
  https://doi.org/10.48550/arXiv.2408.02427
arXiv-issued DOI via DataCite

Submission history

From: Andreas Bjerregaard [view email]
[v1] Mon, 5 Aug 2024 12:34:49 UTC (3,590 KB)
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