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Physics > Applied Physics

arXiv:2311.05692 (physics)
[Submitted on 9 Nov 2023]

Title:Phase-Field Model of Silicon Carbide Growth During Isothermal Condition

Authors:Elias J. Munoz, Vahid Attari, Marco Martinez, Matthew B. Dickerson, Miladin Radovic, Raymundo Arroyave
View a PDF of the paper titled Phase-Field Model of Silicon Carbide Growth During Isothermal Condition, by Elias J. Munoz and 5 other authors
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Abstract:Silicon carbide (SiC) emerges as a promising ceramic material for high-temperature structural applications, especially within the aerospace sector. The utilization of SiC-based ceramic matrix composites (CMCs) instead of superalloys in components like engine shrouds, combustors, and nozzles offers notable advantages, including a 25% improvement in fuel efficiency, over 10% enhanced thrust, and the capability to withstand up to 500$^{\circ}$C higher operating temperatures. Employing a CALPHAD-reinforced multi-phase-field model, our study delves into the evolution of the SiC layer under isothermal solidification conditions. By modeling the growth of SiC between liquid Si and solid C at 1450$^{\circ}$C, we compared results with experimental microstructures and quantitatively examined the evolution of SiC thickness over time. Efficient sampling across the entire model space mitigated uncertainty in high-temperature kinetic parameters, allowing us to predict a range of growth rates and morphologies for the SiC layer. The model accounts for parameter uncertainty stemming from limited experimental knowledge and successfully predicts relevant morphologies for the system. Experimental results validated the kinetic parameters of the simulations, offering valuable insights and potential constraints on the reaction kinetics. We further explored the significance of multi-phase-field model parameters on two key outputs, and found that the diffusion coefficient of liquid Si emerges as the most crucial parameter significantly impacting the SiC average layer thickness and grain count over time. This study provides valuable insights into the microstructure evolution of the Si-C binary system, offering pertinent information for the engineering of CMCs in industrial applications.
Subjects: Applied Physics (physics.app-ph); Mesoscale and Nanoscale Physics (cond-mat.mes-hall)
Cite as: arXiv:2311.05692 [physics.app-ph]
  (or arXiv:2311.05692v1 [physics.app-ph] for this version)
  https://doi.org/10.48550/arXiv.2311.05692
arXiv-issued DOI via DataCite
Related DOI: https://doi.org/10.1016/j.commatsci.2024.113058
DOI(s) linking to related resources

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From: Vahid Attari [view email]
[v1] Thu, 9 Nov 2023 19:04:26 UTC (4,550 KB)
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