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Electrical Engineering and Systems Science > Image and Video Processing

arXiv:2009.08328 (eess)
[Submitted on 17 Sep 2020 (v1), last revised 8 Mar 2021 (this version, v7)]

Title:Review: Deep Learning in Electron Microscopy

Authors:Jeffrey M. Ede
View a PDF of the paper titled Review: Deep Learning in Electron Microscopy, by Jeffrey M. Ede
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Abstract:Deep learning is transforming most areas of science and technology, including electron microscopy. This review paper offers a practical perspective aimed at developers with limited familiarity. For context, we review popular applications of deep learning in electron microscopy. Afterwards, we discuss hardware and software needed to get started with deep learning and interface with electron microscopes. We then review neural network components, popular architectures, and their optimization. Finally, we discuss future directions of deep learning in electron microscopy.
Comments: 33 pages, 16 figures + 2 tables + 65 pages of references
Subjects: Image and Video Processing (eess.IV); Materials Science (cond-mat.mtrl-sci); Computer Vision and Pattern Recognition (cs.CV); Machine Learning (cs.LG)
Cite as: arXiv:2009.08328 [eess.IV]
  (or arXiv:2009.08328v7 [eess.IV] for this version)
  https://doi.org/10.48550/arXiv.2009.08328
arXiv-issued DOI via DataCite
Related DOI: https://doi.org/10.1088/2632-2153/abd614
DOI(s) linking to related resources

Submission history

From: Jeffrey Ede BSc MPhys [view email]
[v1] Thu, 17 Sep 2020 14:23:55 UTC (4,426 KB)
[v2] Fri, 18 Sep 2020 14:38:31 UTC (4,426 KB)
[v3] Mon, 5 Oct 2020 07:22:38 UTC (6,323 KB)
[v4] Tue, 3 Nov 2020 15:38:31 UTC (5,804 KB)
[v5] Sun, 27 Dec 2020 22:14:24 UTC (5,806 KB)
[v6] Thu, 31 Dec 2020 18:28:54 UTC (5,807 KB)
[v7] Mon, 8 Mar 2021 10:12:04 UTC (5,807 KB)
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