Electrical Engineering and Systems Science > Image and Video Processing
[Submitted on 7 Sep 2020 (this version), latest version 28 Mar 2023 (v3)]
Title:Edge effect removal in Fourier ptychographic microscopy via perfect Fourier transformation (PFT)
View PDFAbstract:Edge effect may degrade the imaging precision and is caused by the aperiodic image extension of fast Fourier transform (FFT). In this letter, a perfect Fourier transform algorithm termed PFT was reported to remove the artifacts with comparable efficiency to FFT. Although we demonstrated the performance of PFT in Fourier ptychographic microscopy (FPM) only, it can be expanded in any occasion where the conventional FFT is used.
Submission history
From: An Pan [view email][v1] Mon, 7 Sep 2020 14:48:39 UTC (1,219 KB)
[v2] Wed, 27 Apr 2022 02:19:57 UTC (3,141 KB)
[v3] Tue, 28 Mar 2023 01:43:07 UTC (4,204 KB)
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