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Condensed Matter > Materials Science

arXiv:1908.07238 (cond-mat)
[Submitted on 20 Aug 2019]

Title:Materials Structure, Properties and Dynamics through Scanning Transmission Electron Microscopy

Authors:Stephen J. Pennycook, Changjian Li, Mengsha Li, Chunhua Tang, Eiji Okunishi, Maria Varela, Young-Min Kim, Jae Hyuck Jang
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Abstract:Scanning transmission electron microscopy (STEM) has advanced rapidly in the last decade thanks to the ability to correct the major aberrations of the probe forming lens. Now atomic-sized beams are routine, even at accelerating voltages as low as 40 kV, allowing knock-on damage to be minimized in beam sensitive materials. The aberration-corrected probes can contain sufficient current for high quality, simultaneous, imaging and analysis in multiple modes. Atomic positions can be mapped with picometer precision, revealing ferroelectric domain structures, composition can be mapped by energy dispersive X-ray spectroscopy (EDX) and electron energy loss spectroscopy (EELS) and charge transfer can be tracked unit cell by unit cell using the EELS fine structure. Furthermore, dynamics of point defects can be investigated through rapid acquisition of multiple image scans. Today STEM has become an indispensable tool for analytical science at the atomic level, providing a whole new level of insights into the complex interplays that control materials properties.
Subjects: Materials Science (cond-mat.mtrl-sci)
Cite as: arXiv:1908.07238 [cond-mat.mtrl-sci]
  (or arXiv:1908.07238v1 [cond-mat.mtrl-sci] for this version)
  https://doi.org/10.48550/arXiv.1908.07238
Related DOI: https://doi.org/10.1186/s40543-018-0142-4

Submission history

From: Maria Varela [view email]
[v1] Tue, 20 Aug 2019 09:30:53 UTC (2,739 KB)
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