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Condensed Matter > Materials Science

arXiv:1906.01471 (cond-mat)
[Submitted on 4 Jun 2019]

Title:Depth, relaxation and temperature dependence of defect complexes in scanning transmission electron microscopy

Authors:Thomas Aarholt, Ymir Frodason, Øystein Prytz
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Abstract:We propose a new analysis approach for scanning transmission electron microscopy (STEM) based on the Voronoi-cell integration method to determine the three-dimensional position of the InZn and VZn defect complex in ZnO. Using state of the art simulation software and hardware, we propose using a method of calculating Michelson Contrast on simulated images to determine the optimal acceptance angles to use in an experimental setting. The effect of defect position, DFT-relaxation and cooling the sample to liquid nitrogen temperatures is investigated. DFT-relaxation is shown to be of consequence to accurately determine the three-dimensional position of the defect. Relaxation is also shown to have a significant impact on neighbouring columns at liquid nitrogen temperatures.
Subjects: Materials Science (cond-mat.mtrl-sci)
Cite as: arXiv:1906.01471 [cond-mat.mtrl-sci]
  (or arXiv:1906.01471v1 [cond-mat.mtrl-sci] for this version)
  https://doi.org/10.48550/arXiv.1906.01471

Submission history

From: Thomas Aarholt [view email]
[v1] Tue, 4 Jun 2019 14:21:13 UTC (1,959 KB)
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