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Condensed Matter > Materials Science

arXiv:1901.00633 (cond-mat)
[Submitted on 3 Jan 2019 (v1), last revised 8 Sep 2019 (this version, v3)]

Title:Correlating 3D atomic defects and electronic properties of 2D materials with picometer precision

Authors:Xuezeng Tian, Dennis S. Kim, Shize Yang, Christopher J. Ciccarino, Yongji Gong, Yongsoo Yang, Yao Yang, Blake Duschatko, Yakun Yuan, Pulickel M. Ajayan, Juan-Carlos Idrobo, Prineha Narang, Jianwei Miao
View a PDF of the paper titled Correlating 3D atomic defects and electronic properties of 2D materials with picometer precision, by Xuezeng Tian and 11 other authors
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Abstract:The exceptional electronic, optical and chemical properties of two-dimensional materials strongly depend on the 3D atomic structure and crystal defects. Using Re-doped MoS2 as a model, here we develop scanning atomic electron tomography (sAET) to determine the 3D atomic positions and crystal defects such as dopants, vacancies and ripples with a precision down to 4 picometers. We measure the 3D bond distortion and local strain tensor induced by single dopants for the first time. By directly providing experimental 3D atomic coordinates to density functional theory (DFT), we obtain more truthful electronic band structures than those derived from conventional DFT calculations relying on relaxed 3D atomic models, which is confirmed by photoluminescence measurements. We anticipate that sAET is not only generally applicable to the determination of the 3D atomic coordinates of 2D materials, heterostructures and thin films, but also could transform ab initio calculations by using experimental 3D atomic coordinates as direct input to better predict and discover new physical, chemical and electronic properties.
Comments: 44 pages, 18 figures
Subjects: Materials Science (cond-mat.mtrl-sci)
Cite as: arXiv:1901.00633 [cond-mat.mtrl-sci]
  (or arXiv:1901.00633v3 [cond-mat.mtrl-sci] for this version)
  https://doi.org/10.48550/arXiv.1901.00633
arXiv-issued DOI via DataCite

Submission history

From: Jianwei Miao [view email]
[v1] Thu, 3 Jan 2019 07:05:18 UTC (3,871 KB)
[v2] Tue, 26 Feb 2019 05:24:12 UTC (3,454 KB)
[v3] Sun, 8 Sep 2019 16:07:54 UTC (3,868 KB)
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