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Condensed Matter > Materials Science

arXiv:1810.11585 (cond-mat)
[Submitted on 27 Oct 2018 (v1), last revised 5 May 2019 (this version, v2)]

Title:Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces

Authors:Randall L. Headrick, Jeffrey G. Ulbrandt, Peco Myint, Jing Wan, Yang Li, Andrei Fluerasu, Yugang Zhang, Lutz Wiegart, Karl F. Ludwig Jr
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Abstract:The properties of artificially grown thin films are strongly affected by surface processes during growth. Coherent X-rays provide an approach to better understand such processes and fluctuations far from equilibrium. Here we report results for vacuum deposition of C$_{60}$ on a graphene-coated surface investigated with X-ray Photon Correlation Spectroscopy in surface-sensitive conditions. Step-flow is observed through measurement of the step-edge velocity in the late stages of growth after crystalline mounds have formed. We show that the step-edge velocity is coupled to the terrace length, and that there is a variation in the velocity from larger step spacing at the center of crystalline mounds to closely-spaced, more slowly propagating steps at their edges. The results extend theories of surface growth, since the behavior is consistent with surface evolution driven by processes that include surface diffusion, the motion of step-edges, and attachment at step edges with significant step-edge barriers.
Comments: 14 pages and 7 figures
Subjects: Materials Science (cond-mat.mtrl-sci)
Cite as: arXiv:1810.11585 [cond-mat.mtrl-sci]
  (or arXiv:1810.11585v2 [cond-mat.mtrl-sci] for this version)
  https://doi.org/10.48550/arXiv.1810.11585
Journal reference: Nature Communications 10, Article number: 2638 (2019)
Related DOI: https://doi.org/10.1038/s41467-019-10629-8

Submission history

From: Randall Headrick [view email]
[v1] Sat, 27 Oct 2018 03:00:33 UTC (4,071 KB)
[v2] Sun, 5 May 2019 15:21:41 UTC (4,456 KB)
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