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Condensed Matter > Materials Science

arXiv:1805.05832 (cond-mat)
[Submitted on 15 May 2018]

Title:Charge-carrier lifetime measurements in early-stage photovoltaic materials: intuition, uncertainties, and opportunities

Authors:Jeremy R. Poindexter (1), Edward S. Barnard (2), Rachel C. Kurchin (1), Tonio Buonassisi (1) ((1) Massachusetts Institute of Technology, Cambridge, Massachusetts, (2) The Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California)
View a PDF of the paper titled Charge-carrier lifetime measurements in early-stage photovoltaic materials: intuition, uncertainties, and opportunities, by Jeremy R. Poindexter (1) and 9 other authors
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Abstract:Measurements of charge-carrier lifetime in many early-stage thin-film photovoltaic materials can be arduous due to the prevalence of defects and limited information about material properties. In this perspective, we give a brief overview of typical techniques for measuring lifetimes and discuss the intuition involved in estimating lifetimes from such techniques, focusing on time-resolved photoluminescence as an example. We then delve into the underlying assumptions and uncertainties involved in analyzing lifetime measurements. Finally, we outline opportunities for improving accuracy of lifetime measurements by utilizing two emerging techniques to decouple different recombination mechanisms: two-photon spectroscopy, which we demonstrate on BiI3 thin films, and temperature- and injection-dependent current-voltage measurements.
Comments: 20 pages, 3 figures, 2 tables
Subjects: Materials Science (cond-mat.mtrl-sci)
Cite as: arXiv:1805.05832 [cond-mat.mtrl-sci]
  (or arXiv:1805.05832v1 [cond-mat.mtrl-sci] for this version)
  https://doi.org/10.48550/arXiv.1805.05832
arXiv-issued DOI via DataCite

Submission history

From: Jeremy Poindexter [view email]
[v1] Tue, 15 May 2018 15:05:59 UTC (2,186 KB)
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