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arXiv:1712.02786 (physics)
[Submitted on 8 Dec 2017 (v1), last revised 27 Apr 2018 (this version, v2)]

Title:Apparatus for measuring the uniformity of the optical transmittance of a semispherical surface at normal incidence

Authors:Shenghao Wang, Shijie Liu, Jianda Shao, Tianzhu Xu, Qi Lu, Shen Qi, Minghui Feng, Long Zhang
View a PDF of the paper titled Apparatus for measuring the uniformity of the optical transmittance of a semispherical surface at normal incidence, by Shenghao Wang and 7 other authors
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Abstract:In this paper, we build an apparatus for measuring the optical transmittance and its uniformity for a semispherical surface at normal incidence; the system is primarily comprised of a traditional double-beam photometric framework and a novel custom-made mechanical structure with multidimensional degrees of freedom. During the measurement process, a key aligning step is adopted to guarantee that the center point of the semispherical surface stands still in the light beam while scanning the hemispherical optical element point by point around the horizontal and vertical axes, which ensures that the laser beam is always normally incident onto the surface of the hemisphere. The experimental results show that the uniformity of the optical transmittance for a semispherical optical glass can be successfully characterized by the system, with a three-cycle repeatability error of 0.026% being demonstrated. Our system solves the problem of traditional spectrophotometers when measuring the spectral property of a hemispherical surface and thus can be popularized in similar applications.
Comments: 6 pages, 10 figures
Subjects: Optics (physics.optics); Instrumentation and Detectors (physics.ins-det)
Cite as: arXiv:1712.02786 [physics.optics]
  (or arXiv:1712.02786v2 [physics.optics] for this version)
  https://doi.org/10.48550/arXiv.1712.02786
arXiv-issued DOI via DataCite
Journal reference: Applied Optics, 57(13), pp. 3395-3400, 2018
Related DOI: https://doi.org/10.1364/ao.57.003395
DOI(s) linking to related resources

Submission history

From: Shenghao Wang [view email]
[v1] Fri, 8 Dec 2017 02:10:25 UTC (888 KB)
[v2] Fri, 27 Apr 2018 02:24:10 UTC (3,356 KB)
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