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Condensed Matter > Materials Science

arXiv:1702.01904 (cond-mat)
[Submitted on 7 Feb 2017 (v1), last revised 21 Apr 2017 (this version, v3)]

Title:A Fast Image Simulation Algorithm for Scanning Transmission Electron Microscopy

Authors:Colin Ophus
View a PDF of the paper titled A Fast Image Simulation Algorithm for Scanning Transmission Electron Microscopy, by Colin Ophus
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Abstract:Image simulation for scanning transmission electron microscopy at atomic resolution for samples with realistic dimensions can require very large computation times using existing simulation algorithms. We present a new algorithm named PRISM that combines features of the two most commonly used algorithms, the Bloch wave and multislice methods. PRISM uses a Fourier interpolation factor $f$ that has typical values of 4-20 for atomic resolution simulations. We show that in many cases PRISM can provide a speedup that scales with $f^4$ compared to multislice simulations, with a negligible loss of accuracy. We demonstrate the usefulness of this method with large-scale scanning transmission electron microscopy image simulations of a crystalline nanoparticle on an amorphous carbon substrate.
Comments: 10 pages, 5 figures
Subjects: Materials Science (cond-mat.mtrl-sci); Computational Physics (physics.comp-ph)
Cite as: arXiv:1702.01904 [cond-mat.mtrl-sci]
  (or arXiv:1702.01904v3 [cond-mat.mtrl-sci] for this version)
  https://doi.org/10.48550/arXiv.1702.01904
arXiv-issued DOI via DataCite

Submission history

From: Colin Ophus [view email]
[v1] Tue, 7 Feb 2017 07:20:36 UTC (6,625 KB)
[v2] Thu, 9 Feb 2017 06:55:50 UTC (6,621 KB)
[v3] Fri, 21 Apr 2017 02:11:08 UTC (6,799 KB)
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