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Physics > Instrumentation and Detectors

arXiv:1610.00967 (physics)
[Submitted on 4 Oct 2016]

Title:Device for measurement of thermal emissivity at cryogenic temperatures

Authors:Tomas Kralik, Pavel Hanzelka, Vera Musilova, Ales Srnka
View a PDF of the paper titled Device for measurement of thermal emissivity at cryogenic temperatures, by Tomas Kralik and 3 other authors
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Abstract:In the described device, the thermal emissivity or absorptivity of the sample is measured by substitution of the radiative heat flow between two parallel surfaces by thermal output of a heater. Fast measurements of the mutual emissivity for the range of the temperature of the radiating surface 25 K-150 K are possible. The absorbing surface has a temperature between 5 K and 10 K when LHe is used as cryoliquid. The desired measurement sensitivity is 1 mK for temperature and 0.1 {\mu}W for heat power, respectively. The diameter of the whole device is 50 mm and so it is possible to use a commercial dewar can for the cooling. The form of the sample is a round plate 40 mm in diameter and 1 mm in thickness with one tested side. The emissivity and its temperature dependency for various surface treatments can be checked immediately before application in a cryogenic system.
Comments: The eighth Cryogenics 2004 IIR international conference proceedings, Prague, Czech Republic
Subjects: Instrumentation and Detectors (physics.ins-det)
ACM classes: J.2
Cite as: arXiv:1610.00967 [physics.ins-det]
  (or arXiv:1610.00967v1 [physics.ins-det] for this version)
  https://doi.org/10.48550/arXiv.1610.00967
arXiv-issued DOI via DataCite

Submission history

From: Tomas Kralik [view email]
[v1] Tue, 4 Oct 2016 13:07:29 UTC (259 KB)
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