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Physics > Optics

arXiv:1606.04064 (physics)
[Submitted on 13 Jun 2016 (v1), last revised 6 Oct 2016 (this version, v2)]

Title:Non-destructive profilometry of optical nanofibres

Authors:Lars S. Madsen, Christopher Baker, Halina Rubinsztein-Dunlop, Warwick P. Bowen
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Abstract:Single-mode optical nanofibres are a central component of a broad range of applications and emerging technologies. Their fabrication has been extensively studied over the past decade, but imaging of the final sub-micrometre products has been restricted to destructive or low-precision techniques. Here we demonstrate an optical scattering-based scanning method that uses a probe nanofibre to locally scatter the evanescent field of a sample nanofibre. The method does not damage the sample nanofibre and is easily implemented only using the same equipment as in a standard fibre puller setup. We demonstrate sub-nanometre radial resolution at video rates (0.7 nm in 10 ms) on single mode nanofibres, allowing for a complete high-precision profile to be obtained within minutes of fabrication. The method thus enables non-destructive, fast and precise characterisation of optical nanofibers, with applications ranging from optical sensors and cold atom traps to non-linear optics.
Subjects: Optics (physics.optics)
Cite as: arXiv:1606.04064 [physics.optics]
  (or arXiv:1606.04064v2 [physics.optics] for this version)
  https://doi.org/10.48550/arXiv.1606.04064
arXiv-issued DOI via DataCite
Related DOI: https://doi.org/10.1021/acs.nanolett.6b02460
DOI(s) linking to related resources

Submission history

From: Lars Skovgaard Madsen [view email]
[v1] Mon, 13 Jun 2016 18:49:49 UTC (4,648 KB)
[v2] Thu, 6 Oct 2016 22:17:44 UTC (8,047 KB)
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