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Condensed Matter > Strongly Correlated Electrons

arXiv:1503.03601 (cond-mat)
[Submitted on 12 Mar 2015]

Title:High On/Off Ratio Memristive Switching of Manganite-Cuprate Bilayer by Interfacial Magnetoelectricity

Authors:Xiao Shen, Timothy J. Pennycook, David Hernandez-Martin, Ana Pérez, Maria Varela, Yevgeniy S. Puzyrev, Carlos Leon, Zouhair Sefrioui, Jacobo Santamaria, Sokrates T. Pantelides
View a PDF of the paper titled High On/Off Ratio Memristive Switching of Manganite-Cuprate Bilayer by Interfacial Magnetoelectricity, by Xiao Shen and 9 other authors
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Abstract:Memristive switching serves as the basis for a new generation of electronic devices. Memristors are two-terminal devices in which the current is turned on and off by redistributing point defects, e.g., vacancies, which is difficult to control. Memristors based on alternative mechanisms have been explored, but achieving both the high On/Off ratio and the low switching energy desirable for use in electronics remains a challenge. Here we report memristive switching in a La0.7Ca0.3MnO3/PrBa2Cu3O7 bilayer with an On/Off ratio greater than 10^3 and demonstrate that the phenomenon originates from a new type of interfacial magnetoelectricity. Using results from first-principles calculations, we show that an external electric-field induces subtle displacements of the interfacial Mn ions, which switches on/off an interfacial magnetic "dead" layer, resulting in memristive behavior for spin-polarized electron transport across the bilayer. The interfacial nature of the switching entails low energy cost about of a tenth of atto Joule for write/erase a "bit". Our results indicate new opportunities for manganite/cuprate systems and other transition-metal-oxide junctions in memristive applications.
Subjects: Strongly Correlated Electrons (cond-mat.str-el); Materials Science (cond-mat.mtrl-sci)
Cite as: arXiv:1503.03601 [cond-mat.str-el]
  (or arXiv:1503.03601v1 [cond-mat.str-el] for this version)
  https://doi.org/10.48550/arXiv.1503.03601
arXiv-issued DOI via DataCite
Journal reference: Advanced Materials Interfaces 3, 1600086 (2016)
Related DOI: https://doi.org/10.1002/admi.201600086
DOI(s) linking to related resources

Submission history

From: Xiao Shen [view email]
[v1] Thu, 12 Mar 2015 06:18:53 UTC (1,024 KB)
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