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Condensed Matter > Materials Science

arXiv:1310.1977 (cond-mat)
[Submitted on 8 Oct 2013]

Title:Genuine driving voltage on polarization fatigue in (Pb,La)(Zr,Ti)O3 antiferroelectric thin films

Authors:Wenping Geng, Xiaojie Lou, Jianghong Xu, Fuping Zhang, Yang Liu, Brahim Dkhil, Xiaobing Ren, Ming Zhang, Hongliang He
View a PDF of the paper titled Genuine driving voltage on polarization fatigue in (Pb,La)(Zr,Ti)O3 antiferroelectric thin films, by Wenping Geng and 8 other authors
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Abstract:The polarization fatigue in (Pb0.97La0.02)(Zr0.95Ti0.05)O3 (PLZT) antiferroelectric thin films deposited onto silicon wafers is studied by investigating the effect of the peak/average/effective cycling voltage through varying the waveform of the electrical excitation. Interestingly, it is found that the fatigue endurance of the film is determined by the effective voltage of the external driving excitation rather than by the peak or average voltages. Our results can be well explained in the framework of the local phase decomposition model and indicate that the effective voltage should be considered as the genuine driving voltage determining the polarization fatigue in PLZT antiferroelectric films.
Comments: 17 pages, 3 figures, 1 table
Subjects: Materials Science (cond-mat.mtrl-sci)
Cite as: arXiv:1310.1977 [cond-mat.mtrl-sci]
  (or arXiv:1310.1977v1 [cond-mat.mtrl-sci] for this version)
  https://doi.org/10.48550/arXiv.1310.1977
arXiv-issued DOI via DataCite

Submission history

From: Xiaojie Lou [view email]
[v1] Tue, 8 Oct 2013 01:25:41 UTC (627 KB)
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