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Condensed Matter > Materials Science

arXiv:1304.7221 (cond-mat)
[Submitted on 26 Apr 2013 (v1), last revised 21 Jan 2014 (this version, v4)]

Title:Optical investigation of the natural electron doping in thin MoS2 films deposited on dielectric substrates

Authors:D. Sercombe, S. Schwarz, O. Del Pozo-Zamudio, F. Liu, B. J. Robinson, E. A. Chekhovich, I. I. Tartakovskii, O. Kolosov, A. I. Tartakovskii
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Abstract:Two-dimensional (2D) compounds provide unique building blocks for novel layered devices and hybrid photonic structures. However, large surface-to-volume ratio in thin films enhances the significance of surface interactions and charging effects requiring new understanding. Here we use micro-photoluminescence (PL) and ultrasonic force microscopy to explore the influence of the dielectric environment on optical properties of a few monolayer MoS2 films. PL spectra for MoS2 films deposited on SiO2 substrates are found to vary widely. This film-to-film variation is suppressed by additional capping of MoS2 with SiO2 and SiN, improving mechanical coupling of MoS2 with surrounding dielectrics. We show that the observed PL non-uniformities are related to strong variation in the local electron charging of MoS2 films. In completely encapsulated films, negative charging is enhanced leading to uniform optical properties. Observed great sensitivity of optical characteristics of 2D films to surface interactions has important implications for optoelectronics applications of layered materials.
Comments: latest version
Subjects: Materials Science (cond-mat.mtrl-sci)
Cite as: arXiv:1304.7221 [cond-mat.mtrl-sci]
  (or arXiv:1304.7221v4 [cond-mat.mtrl-sci] for this version)
  https://doi.org/10.48550/arXiv.1304.7221
Journal reference: Scientific Reports 3, 3489 (2013)
Related DOI: https://doi.org/10.1038/srep03489

Submission history

From: Alexander Tartakovskii [view email]
[v1] Fri, 26 Apr 2013 16:41:54 UTC (1,065 KB)
[v2] Tue, 14 May 2013 08:24:38 UTC (1,089 KB)
[v3] Thu, 13 Jun 2013 10:25:36 UTC (1,088 KB)
[v4] Tue, 21 Jan 2014 23:46:19 UTC (1,089 KB)
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