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Physics > Optics

arXiv:1210.7212 (physics)
[Submitted on 26 Oct 2012]

Title:Quantifying the intrinsic amount of fabrication disorder in photonic-crystal waveguides from optical far-field intensity measurements

Authors:P. D. Garcia, A. Javadi, H. Thyrrestrup, P. Lodahl
View a PDF of the paper titled Quantifying the intrinsic amount of fabrication disorder in photonic-crystal waveguides from optical far-field intensity measurements, by P. D. Garcia and 3 other authors
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Abstract:Residual disorder due to fabrication imperfections has important impact in nanophotonics where it may degrade device performance by increasing radiation loss or spontaneously trap light by Anderson localization. We propose and demonstrate experimentally a method of quantifying the intrinsic amount of disorder in state-of-the-art photonic-crystal waveguides from far-field measurements of the Anderson-localized modes. This is achieved by comparing the spectral range that Anderson localization is observed to numerical simulations and the method offers sensitivity down to ~ 1 nm.
Subjects: Optics (physics.optics)
Cite as: arXiv:1210.7212 [physics.optics]
  (or arXiv:1210.7212v1 [physics.optics] for this version)
  https://doi.org/10.48550/arXiv.1210.7212
arXiv-issued DOI via DataCite
Related DOI: https://doi.org/10.1063/1.4788709
DOI(s) linking to related resources

Submission history

From: Pedro David Garcia Fernandez [view email]
[v1] Fri, 26 Oct 2012 18:40:10 UTC (274 KB)
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