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Condensed Matter > Materials Science

arXiv:1201.0109 (cond-mat)
[Submitted on 30 Dec 2011]

Title:Refractive index of vanadium determined by resonant diffraction of soft x-rays

Authors:Martin Magnuson, Coryn F. Hague
View a PDF of the paper titled Refractive index of vanadium determined by resonant diffraction of soft x-rays, by Martin Magnuson and Coryn F. Hague
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Abstract:The dispersive part of the refractive index of vanadium is determined by measuring the angular displacement of the first order diffraction peak of a V/Fe superlattice. The measurements were made using elliptically polarized synchrotron radiation which was scanned through the V L2,3 absorption edges for different incident scattering angles. The x-ray scattering technique provides access to direct determination of the dispersive part of the refractive index through an absorption resonance. The influence of absorption at the resonances is shown by comparing the absorption correction to the dispersion correction. The results demonstrate that 1-{\delta} is larger than unity at the L2,3 resonances of vanadium and the optical consequences are discussed.
Comments: 7 pages, 3 figures, this http URL
Subjects: Materials Science (cond-mat.mtrl-sci)
Cite as: arXiv:1201.0109 [cond-mat.mtrl-sci]
  (or arXiv:1201.0109v1 [cond-mat.mtrl-sci] for this version)
  https://doi.org/10.48550/arXiv.1201.0109
arXiv-issued DOI via DataCite
Journal reference: Journal of Electron Spectroscopy and Related Phenomena 137-140 519-522 (2004)
Related DOI: https://doi.org/10.1016/j.elspec.2004.02.103
DOI(s) linking to related resources

Submission history

From: Martin Magnuson [view email]
[v1] Fri, 30 Dec 2011 11:35:33 UTC (287 KB)
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