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Condensed Matter > Materials Science

arXiv:0802.0867 (cond-mat)
[Submitted on 6 Feb 2008]

Title:X-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism investigation of size effects on field-induced Néel-cap reversal

Authors:Fabien Cheynis (NEEL), Nicolas Rougemaille (NEEL), Rachid Belkhou (SSOLEIL), Jean-Christophe Toussaint (NEEL), Olivier Fruchart (NEEL)
View a PDF of the paper titled X-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism investigation of size effects on field-induced N\'eel-cap reversal, by Fabien Cheynis (NEEL) and 4 other authors
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Abstract: X-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism is used to investigate the influence of an applied magnetic field on Néel caps (i.e., surface terminations of asymmetric Bloch walls). Self-assembled micron-sized Fe(110) dots displaying a moderate distribution of size and aspect ratios serve as model objects. Investigations of remanent states after application of an applied field along the direction of Néel-cap magnetization give clear evidence for the magnetization reversal of the Néel caps around 120 mT, with a $\pm$20 mT dispersion. No clear correlation could be found between the value of the reversal field and geometrical features of the dots.
Subjects: Materials Science (cond-mat.mtrl-sci)
Cite as: arXiv:0802.0867 [cond-mat.mtrl-sci]
  (or arXiv:0802.0867v1 [cond-mat.mtrl-sci] for this version)
  https://doi.org/10.48550/arXiv.0802.0867
arXiv-issued DOI via DataCite
Journal reference: Journal of Applied Physics 103 (2008) 07D915
Related DOI: https://doi.org/10.1063/1.2832332
DOI(s) linking to related resources

Submission history

From: Nicolas Rougemaille [view email] [via CCSD proxy]
[v1] Wed, 6 Feb 2008 19:50:19 UTC (897 KB)
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