Active Learning For Repairable Hardware Systems With Partial Coverage
Authors:
Michael Potter,
Beyza Kalkanlı,
Deniz Erdoğmuş,
Michael Everett
Abstract:
Identifying the optimal diagnostic test and hardware system instance to infer reliability characteristics using field data is challenging, especially when constrained by fixed budgets and minimal maintenance cycles. Active Learning (AL) has shown promise for parameter inference with limited data and budget constraints in machine learning/deep learning tasks. However, AL for reliability model param…
▽ More
Identifying the optimal diagnostic test and hardware system instance to infer reliability characteristics using field data is challenging, especially when constrained by fixed budgets and minimal maintenance cycles. Active Learning (AL) has shown promise for parameter inference with limited data and budget constraints in machine learning/deep learning tasks. However, AL for reliability model parameter inference remains underexplored for repairable hardware systems. It requires specialized AL Acquisition Functions (AFs) that consider hardware aging and the fact that a hardware system consists of multiple sub-systems, which may undergo only partial testing during a given diagnostic test. To address these challenges, we propose a relaxed Mixed Integer Semidefinite Program (MISDP) AL AF that incorporates Diagnostic Coverage (DC), Fisher Information Matrices (FIMs), and diagnostic testing budgets. Furthermore, we design empirical-based simulation experiments focusing on two diagnostic testing scenarios: (1) partial tests of a hardware system with overlapping subsystem coverage, and (2) partial tests where one diagnostic test fully subsumes the subsystem coverage of another. We evaluate our proposed approach against the most widely used AL AF in the literature (entropy), as well as several intuitive AL AFs tailored for reliability model parameter inference. Our proposed AF ranked best on average among the alternative AFs across 6,000 experimental configurations, with respect to Area Under the Curve (AUC) of the Absolute Total Expected Event Error (ATEER) and Mean Squared Error (MSE) curves, with statistical significance calculated at a 0.05 alpha level using a Friedman hypothesis test.
△ Less
Submitted 23 July, 2025; v1 submitted 20 March, 2025;
originally announced March 2025.
Dependency-aware Maximum Likelihood Estimation for Active Learning
Authors:
Beyza Kalkanli,
Tales Imbiriba,
Stratis Ioannidis,
Deniz Erdogmus,
Jennifer Dy
Abstract:
Active learning aims to efficiently build a labeled training set by strategically selecting samples to query labels from annotators. In this sequential process, each sample acquisition influences subsequent selections, causing dependencies among samples in the labeled set. However, these dependencies are overlooked during the model parameter estimation stage when updating the model using Maximum L…
▽ More
Active learning aims to efficiently build a labeled training set by strategically selecting samples to query labels from annotators. In this sequential process, each sample acquisition influences subsequent selections, causing dependencies among samples in the labeled set. However, these dependencies are overlooked during the model parameter estimation stage when updating the model using Maximum Likelihood Estimation (MLE), a conventional method that assumes independent and identically distributed (i.i.d.) data. We propose Dependency-aware MLE (DMLE), which corrects MLE within the active learning framework by addressing sample dependencies typically neglected due to the i.i.d. assumption, ensuring consistency with active learning principles in the model parameter estimation process. This improved method achieves superior performance across multiple benchmark datasets, reaching higher performance in earlier cycles compared to conventional MLE. Specifically, we observe average accuracy improvements of 6\%, 8.6\%, and 10.5\% for $k=1$, $k=5$, and $k=10$ respectively, after collecting the first 100 samples, where entropy is the acquisition function and $k$ is the query batch size acquired at every active learning cycle.
△ Less
Submitted 7 March, 2025;
originally announced March 2025.
