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Showing 1–1 of 1 results for author: Holland, S D

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  1. A Statistical Framework for Improved Automatic Flaw Detection in Nondestructive Evaluation Images

    Authors: Ye Tian, Ranjan Maitra, William Q. Meeker, Stephen D. Holland

    Abstract: Nondestructive evaluation (NDE) techniques are widely used to detect flaws in critical components of systems like aircraft engines, nuclear power plants and oil pipelines in order to prevent catastrophic events. Many modern NDE systems generate image data. In some applications an experienced inspector performs the tedious task of visually examining every image to provide accurate conclusions about… ▽ More

    Submitted 31 January, 2017; originally announced February 2017.

    Comments: To appear in Technometrics

    MSC Class: 62P30;