Anisotropic and tunable optical conductivity of a two-dimensional semi-Dirac system in the presence of elliptically polarized radiation
Authors:
H. Y. Zhang,
Y. M. Xiao,
Q. N. Li,
L. Ding,
B. Van Duppen,
W. Xu,
F. M. Peeters
Abstract:
We investigate the effect of ellipticity ratio of the polarized radiation field on optoelectronic properties of a two-dimensional (2D) semi-Dirac (SD) system. The optical conductivity is calculated within the energy balance equation approach derived from the semiclassical Boltzmann equation. We find that there exists the anisotropic optical absorption induced via both the intra- and interband elec…
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We investigate the effect of ellipticity ratio of the polarized radiation field on optoelectronic properties of a two-dimensional (2D) semi-Dirac (SD) system. The optical conductivity is calculated within the energy balance equation approach derived from the semiclassical Boltzmann equation. We find that there exists the anisotropic optical absorption induced via both the intra- and interband electronic transition channels in the perpendicular $xx$ and $yy$ directions. Furthermore, we examine the effects of the ellipticity ratio, the temperature, the carrier density, and the band-gap parameter on the optical conductivity of the 2D SD system placed in transverse and vertical directions, respectively. It is shown that the ellipticity ratio, temperature, carrier density, and band-gap parameter can play the important roles in tuning the strength, peak position, and shape of the optical conductivity spectrum. The results obtained from this study indicate that the 2D SD system can be a promising anisotropic and tunable optical and optoelectronic material for applications in innovative 2D optical and optoelectronic devices, which are active in the infrared and terahertz bandwidths.
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Submitted 20 March, 2022;
originally announced March 2022.
A. hexahedron element formulation with a new multi-resolution analysis
Authors:
Yi Ming Xia,
Shao Lin Chen
Abstract:
A multi-resolution hexahedron element and method is presented with a new multi-resolution analysis (MRA) framework. The MRA framework is formulated out of a mutually nesting displacement subspace sequence, whose basis functions are constructed of scaling and shifting on the element domain of a basic node shape function. The basic node shape function is constructed from extending to other seven qua…
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A multi-resolution hexahedron element and method is presented with a new multi-resolution analysis (MRA) framework. The MRA framework is formulated out of a mutually nesting displacement subspace sequence, whose basis functions are constructed of scaling and shifting on the element domain of a basic node shape function. The basic node shape function is constructed from extending to other seven quadrants around a specific node of a node isoparametric shape function. The MRA endows the proposed element with the resolution level (RL) to adjust the element node number, thus modulating structural analysis accuracy accordingly. As a result, the traditional 8-node hexahedron element and method is a mono-resolution one and also a special case of the proposed element and method. The accuracy of a structural analysis is actually determined by the RL, not by the mesh. The simplicity and clarity of shape function construction with the Kronecker delta property and the rational MRA enable the proposed element method to be more rational, easier and efficient in its implementation than the conventional mono-resolution solid element method or other MRA methods. The multi-resolution hexahedron element is more adapted to dealing with the accurate computation of structural problems.
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Submitted 26 May, 2015; v1 submitted 26 May, 2014;
originally announced May 2014.
