Centimeter-sized Objects at Micrometer Resolution: Extending Field-of-View in Wavefront Marker X-ray Phase-Contrast Tomography
Authors:
Dominik John,
Junan Chen,
Christoph Gaßner,
Sara Savatović,
Lisa Marie Petzold,
Sami Wirtensohn,
Mirko Riedel,
Jörg U. Hammel,
Julian Moosmann,
Felix Beckmann,
Matthias Wieczorek,
Julia Herzen
Abstract:
Recent advancements in propagation-based phase-contrast imaging, such as hierarchical imaging, have enabled the visualization of internal structures in large biological specimens and material samples. However, wavefront marker-based techniques, which provide quantitative electron density information, face challenges when imaging larger objects due to stringent beam stability requirements and poten…
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Recent advancements in propagation-based phase-contrast imaging, such as hierarchical imaging, have enabled the visualization of internal structures in large biological specimens and material samples. However, wavefront marker-based techniques, which provide quantitative electron density information, face challenges when imaging larger objects due to stringent beam stability requirements and potential structural changes in objects during longer measurements. Extending the fields-of-view of these methods is crucial for obtaining comparable quantitative results across beamlines and adapting to the smaller beam profiles of fourth-generation synchrotron sources. We introduce a novel technique combining an adapted eigenflat optimization with deformable image registration to address the challenges and enable quantitative high-resolution scans of centimeter-sized objects with micrometre resolution. We demonstrate the potential of the method by obtaining an electron density map of a rat brain sample 15 mm in diameter using speckle-based imaging, despite the limited horizontal field-of-view of 6 mm of the beamline (PETRA III, P05, operated by Hereon at DESY). This showcases the ability of the technique to significantly widen the range of application of wavefront marker-based techniques in both biological and materials science research.
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Submitted 1 August, 2024;
originally announced August 2024.
Nanoscale Dark-Field Imaging in Full-Field Transmission X-Ray Microscopy
Authors:
Sami Wirtensohn,
Peng Qi,
Christan David,
Julia Herzen,
Imke Greving,
Silja Flenner
Abstract:
The dark-field signal uncovers details beyond conventional X-ray attenuation contrast, which is especially valuable for material sciences. In particular, dark-field techniques are able to reveal structures beyond the spatial resolution of a setup. However, its implementation is yet limited to the micrometer regime. Therefore, we propose a technique to extend full-field transmission X-ray microscop…
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The dark-field signal uncovers details beyond conventional X-ray attenuation contrast, which is especially valuable for material sciences. In particular, dark-field techniques are able to reveal structures beyond the spatial resolution of a setup. However, its implementation is yet limited to the micrometer regime. Therefore, we propose a technique to extend full-field transmission X-ray microscopy by the dark-field signal. The proposed method is based on a well-defined illumination of a beam-shaping condenser, which allows to block the bright-field by motorized apertures in the back focal plane of the objective's lens. This method offers a simple implementation and enables rapid modality changes while maintaining short scan times, making dark-field imaging widely available at the nanometer scale.
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Submitted 3 May, 2024; v1 submitted 27 March, 2024;
originally announced March 2024.
