Increasing the resolution of transmission electron microscopy by computational ghost imaging
Authors:
P. Rosi,
L. Viani,
E. Rotunno,
S. Frabboni,
A. H. Tavabi,
R. E. Dunin-Borkowski,
A. Roncaglia,
V. Grillo
Abstract:
By means of numerical simulations, we demonstrate the innovative use of computational ghost imaging in transmission electron microscopy to retrieve images with a resolution that overcomes the limitations imposed by coherent aberrations. The method requires measuring the intensity on a single pixel detector with a series of structured illuminations. The success of the technique is improved if the p…
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By means of numerical simulations, we demonstrate the innovative use of computational ghost imaging in transmission electron microscopy to retrieve images with a resolution that overcomes the limitations imposed by coherent aberrations. The method requires measuring the intensity on a single pixel detector with a series of structured illuminations. The success of the technique is improved if the probes are made to resemble the sample and the patterns cover the area of interest evenly. By using a simple 8 electrode device as a specific example, a 2-fold increase in resolution beyond the aberration limit is demonstrated to be possible under realistic experimental conditions.
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Submitted 10 November, 2023;
originally announced January 2024.
Computational ghost imaging for transmission electron microscopy
Authors:
Akhil Kallepalli,
Lorenzo Viani,
Daan Stellinga,
Enzo Rotunno,
Ming-Jie Sun,
Richard Bowman,
Paolo Rosi,
Stefano Frabboni,
Roberto Balboni,
Andrea Migliori,
Vincenzo Grillo,
Miles Padgett
Abstract:
While transmission electron microscopes (TEM) can achieve a much higher resolution than optical microscopes, they face challenges of damage to samples during the high energy processes involved. Here, we explore using computational ghost imaging techniques in electron microscopy to reduce the total required intensity. The technological lack of the equivalent high-resolution, optical spatial light m…
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While transmission electron microscopes (TEM) can achieve a much higher resolution than optical microscopes, they face challenges of damage to samples during the high energy processes involved. Here, we explore using computational ghost imaging techniques in electron microscopy to reduce the total required intensity. The technological lack of the equivalent high-resolution, optical spatial light modulator for electrons means that a different approach needs to be pursued. To this end, we show a beam shaping technique based on the use of a distribution of electrically charged metal needles to structure the beam, alongside a novel reconstruction method to handle the resulting highly non-orthogonal patterns. Second, we illustrate the application of this ghost imaging approach in electron microscopy. To test the full extent of the capabilities of this technique, we realised an analogous optical setup method. In both regimes, the ability to reduce the amount of total illumination intensity is evident in comparison to raster scanning.
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Submitted 21 April, 2022;
originally announced April 2022.
