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Mixed Finite Element Analysis of Flexoelectric Response: Exploring Unit Cell Stacking and Strain Gradient Modulation
Authors:
Arash Kazemi,
Kshiteej J Deshmukh,
Susan Trolier-McKinstry,
Shad Roundy
Abstract:
Flexoelectricity, a coupling between strain gradients and electric polarization, has attracted significant interest due to its critical role in enhanced effects at small scales and its applicability across a diverse range of materials. Modeling flexoelectricity is challenging, especially in 3D, due to the higher-order equations involved, which require continuity conditions that limit the use of st…
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Flexoelectricity, a coupling between strain gradients and electric polarization, has attracted significant interest due to its critical role in enhanced effects at small scales and its applicability across a diverse range of materials. Modeling flexoelectricity is challenging, especially in 3D, due to the higher-order equations involved, which require continuity conditions that limit the use of standard finite element methods. This study employs a modified mixed finite element formulation, specifically designed to account for spurious oscillations that can hinder convergence, particularly in large-scale problems solved with iterative solvers. A numerical analysis has been conducted to evaluate the effectiveness of stacking individual flexoelectric unit cells to achieve an enhanced overall flexoelectric response. The study also seeks to determine the feasibility of locally modifying the strain gradient to induce localized enhancements in the flexoelectric effect.
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Submitted 26 February, 2025;
originally announced February 2025.
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Reward based optimization of resonance-enhanced piezoresponse spectroscopy
Authors:
Yu Liu,
Boris Slautin,
Jason Bemis,
Roger Proksch,
Rohit Pant,
Ichiro Takeuchi,
Stanislav Udovenko,
Susan Trolier-McKinstry,
Sergei V. Kalinin
Abstract:
Dynamic spectroscopies in Scanning Probe Microscopy (SPM) are critical for probing material properties, such as force interactions, mechanical properties, polarization switching, and electrochemical reactions and ionic dynamics. However, the practical implementation of these measurements is constrained by the need to balance imaging time and data quality. Signal to noise requirements favor long ac…
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Dynamic spectroscopies in Scanning Probe Microscopy (SPM) are critical for probing material properties, such as force interactions, mechanical properties, polarization switching, and electrochemical reactions and ionic dynamics. However, the practical implementation of these measurements is constrained by the need to balance imaging time and data quality. Signal to noise requirements favor long acquisition times and high frequencies to improve signal fidelity. However, these are limited on the low end by contact resonant frequency and photodiode sensitivity, and on the high end by the time needed to acquire high-resolution spectra, or the propensity for samples degradation under high field excitation over long times. The interdependence of key parameters such as instrument settings, acquisition times, and sampling rates makes manual tuning labor-intensive and highly dependent on user expertise, often yielding operator-dependent results. These limitations are prominent in techniques like Dual Amplitude Resonance Tracking (DART) in Piezoresponse Force Microscopy (PFM) that utilize multiple concurrent feedback loops for topography and resonance frequency tracking. Here, a reward-driven workflow is proposed that automates the tuning process, adapting experimental conditions in real time to optimize data quality. This approach significantly reduces the complexity and time required for manual adjustments and can be extended to other SPM spectroscopic methods, enhancing overall efficiency and reproducibility.
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Submitted 18 November, 2024;
originally announced November 2024.
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Electrical Degradation in Dielectric and Piezoelectric Oxides: Review of Defect Chemistry and Associated Characterization Techniques
Authors:
Pedram Yousefian,
Betul Akkopru-Akgun,
Clive A. Randall,
Susan Trolier-McKinstry
Abstract:
The properties of dielectric and piezoelectric oxides are determined by their processing history, crystal structure, chemical composition, microstructure, dopants (or defect) distribution, and defect kinetics. These materials are essential in a diverse range of applications including aerospace, medical, military, transportation, power engineering, and communication, where they are used as ceramic…
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The properties of dielectric and piezoelectric oxides are determined by their processing history, crystal structure, chemical composition, microstructure, dopants (or defect) distribution, and defect kinetics. These materials are essential in a diverse range of applications including aerospace, medical, military, transportation, power engineering, and communication, where they are used as ceramic discs, thick and thin films, multilayer devices, etc. Significant advances in understanding the materials, processing, properties, and reliability of these materials have led to their widespread use in consumer electronics, military, and aerospace applications. This review delves into electrical degradation in dielectrics and piezoelectrics, focusing on defect chemistry and key characterization techniques. It also provides a detailed discussion of various spectroscopic, microscopic, and electronic characterization techniques essential for analyzing defects and degradation mechanisms.
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Submitted 10 March, 2024;
originally announced March 2024.
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Unique Ferroelectric Fatigue Behavior and Exceptional High Temperature Retention in Al0.93B0.07N Films
Authors:
Wanlin Zhu,
Fan He,
John Hayden,
Quyen Tran,
Jung In Yang,
Pannawit Tipsawat,
Brian Foley,
Thomas N. Jackson,
Jon-Paul Maria,
Susan Trolier-McKinstry
Abstract:
This paper reports the fatigue and retention behavior for Al1-xBxN thin films, a member of the novel family of wurtzite ferroelectrics, with an emphasis on the role of capacitor architecture. By modifying the capacitor architecture, and thus thermal and electrical boundary conditions, we create insight regarding the relative importance of intrinsic and extrinsic contributors to the degradation ten…
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This paper reports the fatigue and retention behavior for Al1-xBxN thin films, a member of the novel family of wurtzite ferroelectrics, with an emphasis on the role of capacitor architecture. By modifying the capacitor architecture, and thus thermal and electrical boundary conditions, we create insight regarding the relative importance of intrinsic and extrinsic contributors to the degradation tendencies. Our experiments suggest that bipolar cycling of metal (Pt/W)/Al0.93B0.07N/W/Al2O3 film stacks first induced wake-up, then a region of constant switchable polarization. On additional cycling, the film leakage current increased, and then films underwent dielectric breakdown. For unpatterned first generation Al0.93B0.07N films with 100 nm thick Pt top electrodes survive ~104 bipolar cycles, whereas films with 1000 nm W top electrodes survive ~10^5 cycles before thermal dielectric breakdown. Sentaurus modeling was used to design an SU8 field plate which improved the performance to ~10^6 fatigue cycles. It was found that the thermal failures during fatigue were not due to surface flashover events but were associated with hard breakdown events in the dielectric. The films showed excellent retention of the stored polarization state. As expected, data retention was slightly inferior in the opposite state (OS) measurements. However, it is noted that even after 3.6x10^6 sec (1000 hr). at 200°C, the OS signal margin still exceeded 200 uC/cm2. The predicted OS retention is 82% after 10 years baking at 200oC.
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Submitted 12 August, 2022;
originally announced August 2022.
