Showing 1–1 of 1 results for author: Stillman, A

A Single Shot, Sub-picosecond Beam Bunch Characterization with Electro-optic Techniques

Authors: Y. K. Semertzidis, R. Burns, V. Castillo, R. Larsen, D. M. Lazarus, D. Nikas, C. Ozben, T. Srinivasan-Rao, A. Stillman, T. Tsang, L. Kowalski

Abstract: In the past decade, the bunch lengths of electrons in accelerators have decreased dramatically to the range of a few picoseconds \cite{Uesaka94,Trotz97}. Measurement of the length as well as the longitudinal profile of these short bunches have been a topic of research in a number of institutions \cite{Uesaka97,Liu97,Hutchins00}. One of the techniques uses the electric field induced by the passag… ▽ More In the past decade, the bunch lengths of electrons in accelerators have decreased dramatically to the range of a few picoseconds \cite{Uesaka94,Trotz97}. Measurement of the length as well as the longitudinal profile of these short bunches have been a topic of research in a number of institutions \cite{Uesaka97,Liu97,Hutchins00}. One of the techniques uses the electric field induced by the passage of electrons in the vicinity of a birefringent crystal to change its optical characteristics. Well-established electro-optic techniques can then be used to measure the temporal characteristics of the electron bunch. In this paper we present a novel, non-invasive, single-shot approach to improve the resolution to tens of femtoseconds so that sub-millimeter bunch length can be measured. △ Less

Submitted 17 October, 2001; originally announced October 2001.

Comments: 3 pages, 1 figure. The paper was presented as contribution to working group T9 at Snowmass2001

Journal ref: eConf C010630 (2001) T901