Skip to main content

Showing 1–3 of 3 results for author: Seppä, H

Searching in archive physics. Search in all archives.
.
  1. arXiv:2112.11933  [pdf, other

    cond-mat.mes-hall physics.app-ph

    Suppression of $1/f$ noise in graphene due to non-scalar mobility fluctuations induced by impurity motion

    Authors: Masahiro Kamada, Weijun Zeng, Antti Laitinen, Jayanta Sarkar, Sheng-Shiuan Yeh, Kirsi Tappura, Heikki Seppä, Pertti Hakonen

    Abstract: Low frequency resistance variations due to mobility fluctuations is one of the key factors of $1/f$ noise in metallic conductors. According to theory, such noise in a two-dimensional (2D) device can be suppressed to zero at small magnetic fields, implying important technological benefits for low noise 2D devices. In this work, we provide direct evidence of anisotropic mobility fluctuations by demo… ▽ More

    Submitted 22 December, 2021; originally announced December 2021.

    Comments: 17 pages, 4 figures

  2. arXiv:0806.2715  [pdf, ps, other

    cond-mat.supr-con physics.ins-det

    Superconducting transition detector in power amplification mode: a tool for cryogenic multiplexing

    Authors: P. Helistö, J. Hassel, A. Luukanen, H. Seppä

    Abstract: We demonstrate that substantial power gain can be obtained with superconducting transition detectors. We describe the properties of the detector as a power amplifier theoretically. In our first experiments power gain of 23 was reached in a good agreement with the theory. The gain facilitates noise matching of the readout circuit to the detectors in the case of time division multiplexing.

    Submitted 17 June, 2008; originally announced June 2008.

    Comments: 4 pages, 3 figures

  3. arXiv:0707.0637  [pdf

    physics.ins-det

    Microelectromechanical components in electrical metrology

    Authors: Antti Manninen, Anu Karkkainen, Nadine Pesonen, Aarne Oja, Heikki Seppa

    Abstract: Microelectromechanical systems (MEMS) can offer a competitive alternative for conventional technology in electrical precision measurements. This article summarises recent work in development of MEMS solutions for electrical metrology. MEMS-based voltage references, RMS-to-DC converters, high frequency power sensors, and reference oscillators are discussed. The main principle of operation of the… ▽ More

    Submitted 4 July, 2007; originally announced July 2007.

    Journal ref: A. Manninen, A. Karkkainen, N. Pesonen, A. Oja, and H. Seppa, Applications des MEMS a la metrologie electrique. Techniques de l Ingenieur, traite Mesures et Controle, juin 2007. R 1002, 12 pages (in French)