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Optically excited spin dynamics of thermally metastable skyrmions in Fe$_{0.75}$Co$_{0.25}$Si
Authors:
Jantje Kalin,
Sibylle Sievers,
Heiko Füser,
Hans Werner Schumacher,
Felipe García-Sánchez,
Andreas Bauer,
Christian Pfleiderer,
Mark Bieler
Abstract:
We investigate the microwave spin excitations of the cubic chiral magnet Fe$_{0.75}$Co$_{0.25}$Si as driven by the thermal modulation of magnetic interactions via laser heating and probed by time-resolved measurements of the magneto-optical Kerr effect. Focusing on the topologically nontrivial skyrmion lattice state, the dynamic properties in thermodynamic equilibrium are compared with those of a…
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We investigate the microwave spin excitations of the cubic chiral magnet Fe$_{0.75}$Co$_{0.25}$Si as driven by the thermal modulation of magnetic interactions via laser heating and probed by time-resolved measurements of the magneto-optical Kerr effect. Focusing on the topologically nontrivial skyrmion lattice state, the dynamic properties in thermodynamic equilibrium are compared with those of a metastable state prepared by means of rapid field cooling. In both cases, we find precessional and exponential contributions to the dynamic response, characteristic of a breathing mode and energy dissipation, respectively. When taking into account the universal scaling as a function of temperature, the precession frequencies in the equilibrium and metastable skyrmion state are in excellent quantitative agreement. This finding highlights that skyrmion states far from thermal equilibrium promise great flexibility, for instance with respect to temperature and field scales, both for possible microwave applications and the study of fundamental properties.
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Submitted 29 June, 2022; v1 submitted 8 February, 2022;
originally announced February 2022.
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Magnetic field robust high quality factor NbTiN superconducting microwave resonators
Authors:
Manuel Müller,
Thomas Luschmann,
Andreas Faltermeier,
Stefan Weichselbaumer,
Leon Koch,
Gerhard B. P. Huber,
Hans Werner Schumacher,
Niels Ubbelohde,
David Reifert,
Thomas Scheller,
Frank Deppe,
Achim Marx,
Stefan Filipp,
Matthias Althammer,
Rudolf Gross,
Hans Huebl
Abstract:
We systematically study the performance of compact lumped element planar microwave $\mathrm{Nb_{70}Ti_{30}N}$ (NbTiN) resonators operating at 5 GHz in external in-plane magnetic fields up to 440 mT, a broad temperature regime from 2.2 K up to 13 K, as well as mK temperatures. For comparison, the resonators have been fabricated on thermally oxidized and pristine, (001) oriented silicon substrates.…
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We systematically study the performance of compact lumped element planar microwave $\mathrm{Nb_{70}Ti_{30}N}$ (NbTiN) resonators operating at 5 GHz in external in-plane magnetic fields up to 440 mT, a broad temperature regime from 2.2 K up to 13 K, as well as mK temperatures. For comparison, the resonators have been fabricated on thermally oxidized and pristine, (001) oriented silicon substrates. When operating the resonators in the multi-photon regime at $T=2.2$ K, we find internal quality factors $Q_{\mathrm{int}}\simeq$ $2\cdot10^5$ for NbTiN resonators grown on pristine Si substrates, while resonators grown on thermally oxidized substrates show a reduced value of $Q_{\mathrm{int}}\simeq$ $1\cdot10^4$, providing evidence for additional loss channels for the latter substrate. In addition, we investigate the $Q$-factors of the resonators on pristine Si substrates at millikelvin temperatures to asses their applicability for quantum applications. We find $Q_{\mathrm{int}}\simeq$ $2\cdot10^5$ in the single photon regime and $Q_{\mathrm{int}}\simeq$ $5\cdot10^5$ in the high power regime at $T=7$ mK.
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Submitted 15 December, 2021;
originally announced December 2021.
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Silicon carbide stacking-order-induced doping variation in epitaxial graphene
Authors:
Davood Momeni Pakdehi,
Philip Schädlich,
T. T. Nhung Nguyen,
Alexei A. Zakharov,
Stefan Wundrack,
Florian Speck,
Klaus Pierz,
Thomas Seyller,
Christoph Tegenkamp,
Hans. W. Schumacher
Abstract:
Generally, it is supposed that the Fermi level in epitaxial graphene is controlled by two effects: p-type polarization doping induced by the bulk of the hexagonal SiC(0001) substrate and overcompensation by donor-like states related to the buffer layer. In this work, we evidence that this effect is also related to the specific underlying SiC terrace. We fabricated a periodic sequence of non-identi…
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Generally, it is supposed that the Fermi level in epitaxial graphene is controlled by two effects: p-type polarization doping induced by the bulk of the hexagonal SiC(0001) substrate and overcompensation by donor-like states related to the buffer layer. In this work, we evidence that this effect is also related to the specific underlying SiC terrace. We fabricated a periodic sequence of non-identical SiC terraces, which are unambiguously attributed to specific SiC surface terminations. A clear correlation between the SiC termination and the electronic graphene properties is experimentally observed and confirmed by various complementary surface-sensitive methods. We attribute this correlation to a proximity effect of the SiC termination-dependent polarization doping on the overlying graphene layer. Our findings open a new approach for a nano-scale doping-engineering by self-patterning of epitaxial graphene and other 2D layers on dielectric polar substrates.
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Submitted 30 May, 2020;
originally announced June 2020.
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Uncertainty Analysis of Stray Field Measurements by Quantitative Magnetic Force Microscopy
Authors:
Xiukun Hu,
Gaoliang Dai,
Sibylle Sievers,
Alexander Fernández Scarioni,
Volker Neu,
Mark Bieler,
Hans Werner Schumacher
Abstract:
Magnetic force microscopy (MFM) measurements generally provide phase images which represent the signature of domain structures on the surface of nanomaterials. To quantitatively determine magnetic stray fields based on an MFM image requires calibrated properties of the magnetic tip. In this work, an approach is presented for calibrating a magnetic tip using a Co/Pt multilayered film as a reference…
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Magnetic force microscopy (MFM) measurements generally provide phase images which represent the signature of domain structures on the surface of nanomaterials. To quantitatively determine magnetic stray fields based on an MFM image requires calibrated properties of the magnetic tip. In this work, an approach is presented for calibrating a magnetic tip using a Co/Pt multilayered film as a reference sample which shows stable well-known magnetic properties and well-defined perpendicular band domains. The approach is based on a regularized deconvolution process in Fourier domain with a Wiener filter and the L-curve method for determining a suitable regularization parameter to get a physically reasonable result. The calibrated tip is applied for a traceable quantitative determination of the stray fields of a test sample which has a patial frequency spectrum covered by that of the reference sample. According to the "Guide to the expression of uncertainty in measurement", uncertainties of the processing algorithm are estimated considering the fact that the regularization influences significantly the quantitative analysis. We discuss relevant uncertainty components and their propagations between real domain and Fourier domain for both, the tip calibration procedure and the stray field calculation, and propose an uncertainty evaluation procedure for quantitative magnetic force microscopy.
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Submitted 19 February, 2020; v1 submitted 18 December, 2019;
originally announced December 2019.
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Traceably Calibrated Scanning Hall Probe Microscopy at Room Temperature
Authors:
Manuela Gerken,
Aurélie Solignac,
Davood Momeni Pakdehi,
Alessandra Manzin,
Thomas Weimann,
Klaus Pierz,
Sibylle Sievers,
Hans Werner Schumacher
Abstract:
Fabrication, characterization and comparison of gold and graphene micro- and nano-size Hall sensors for room temperature scanning magnetic field microscopy applications is presented. The Hall sensors with active areas from 5 $μ$m down to 50 nm were fabricated by electron-beam lithography. The calibration of the Hall sensors in an external magnetic field revealed a sensitivity of 3.2 mV/(AT) $\pm$…
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Fabrication, characterization and comparison of gold and graphene micro- and nano-size Hall sensors for room temperature scanning magnetic field microscopy applications is presented. The Hall sensors with active areas from 5 $μ$m down to 50 nm were fabricated by electron-beam lithography. The calibration of the Hall sensors in an external magnetic field revealed a sensitivity of 3.2 mV/(AT) $\pm$ 0.3 % for gold and 1615 V/(AT) $\pm$ 0.5 % for graphene at room temperature. The gold sensors were fabricated on silicon nitride cantilever chips suitable for integration into commercial scanning probe microscopes, allowing scanning Hall microscopy (SHM) under ambient conditions and controlled sensor-sample distance. The height dependent stray field distribution of a magnetic scale was characterized using a 5 $μ$m gold Hall sensor. The uncertainty of the entire Hall sensor based scanning and data acquisition process was analyzed allowing traceably calibrated SHM measurements. The measurement results show good agreement with numerical simulations within the uncertainty budget.
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Submitted 2 June, 2020; v1 submitted 28 October, 2019;
originally announced October 2019.
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Towards wafer scale inductive determination of magnetostatic and dynamic parameters of magnetic thin films and multilayers
Authors:
Sibylle Sievers,
Niklas Liebing,
Paul Nass,
Santiago Serrano-Guisan,
Massimo Pasquale,
Hans Werner Schumacher
Abstract:
We investigate an inductive probe head suitable for non-invasive characterization of the magnetostatic and dynamic parameters of magnetic thin films and multilayers on the wafer scale. The probe is based on a planar waveguide with rearward high frequency connectors that can be brought in close contact to the wafer surface. Inductive characterization of the magnetic material is carried out by vecto…
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We investigate an inductive probe head suitable for non-invasive characterization of the magnetostatic and dynamic parameters of magnetic thin films and multilayers on the wafer scale. The probe is based on a planar waveguide with rearward high frequency connectors that can be brought in close contact to the wafer surface. Inductive characterization of the magnetic material is carried out by vector network analyzer ferromagnetic resonance. Analysis of the field dispersion of the resonance allows the determination of key material parameters such as the saturation magnetization MS or the effective damping parameter Meff. Three waveguide designs are tested. The broadband frequency response is characterized and the suitability for inductive determination of MS and Meff is compared. Integration of such probes in a wafer prober could in the future allow wafer scale in-line testing of magnetostatic and dynamic key material parameters of magnetic thin films and multilayers.
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Submitted 24 October, 2013;
originally announced October 2013.
