Centimeter-sized Objects at Micrometer Resolution: Extending Field-of-View in Wavefront Marker X-ray Phase-Contrast Tomography
Authors:
Dominik John,
Junan Chen,
Christoph Gaßner,
Sara Savatović,
Lisa Marie Petzold,
Sami Wirtensohn,
Mirko Riedel,
Jörg U. Hammel,
Julian Moosmann,
Felix Beckmann,
Matthias Wieczorek,
Julia Herzen
Abstract:
Recent advancements in propagation-based phase-contrast imaging, such as hierarchical imaging, have enabled the visualization of internal structures in large biological specimens and material samples. However, wavefront marker-based techniques, which provide quantitative electron density information, face challenges when imaging larger objects due to stringent beam stability requirements and poten…
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Recent advancements in propagation-based phase-contrast imaging, such as hierarchical imaging, have enabled the visualization of internal structures in large biological specimens and material samples. However, wavefront marker-based techniques, which provide quantitative electron density information, face challenges when imaging larger objects due to stringent beam stability requirements and potential structural changes in objects during longer measurements. Extending the fields-of-view of these methods is crucial for obtaining comparable quantitative results across beamlines and adapting to the smaller beam profiles of fourth-generation synchrotron sources. We introduce a novel technique combining an adapted eigenflat optimization with deformable image registration to address the challenges and enable quantitative high-resolution scans of centimeter-sized objects with micrometre resolution. We demonstrate the potential of the method by obtaining an electron density map of a rat brain sample 15 mm in diameter using speckle-based imaging, despite the limited horizontal field-of-view of 6 mm of the beamline (PETRA III, P05, operated by Hereon at DESY). This showcases the ability of the technique to significantly widen the range of application of wavefront marker-based techniques in both biological and materials science research.
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Submitted 1 August, 2024;
originally announced August 2024.
High-speed processing of X-ray wavefront marking data with the Unified Modulated Pattern Analysis (UMPA) model
Authors:
Fabio De Marco,
Sara Savatović,
Ronan Smith,
Vittorio Di Trapani,
Marco Margini,
Ginevra Lautizi,
Pierre Thibault
Abstract:
Wavefront-marking X-ray imaging techniques use e.g., sandpaper or a grating to generate intensity fluctuations, and analyze their distortion by the sample in order to retrieve attenuation, phase-contrast, and dark-field information. Phase contrast yields an improved visibility of soft-tissue specimens, while dark-field reveals small-angle scatter from sub-resolution structures. Both have found man…
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Wavefront-marking X-ray imaging techniques use e.g., sandpaper or a grating to generate intensity fluctuations, and analyze their distortion by the sample in order to retrieve attenuation, phase-contrast, and dark-field information. Phase contrast yields an improved visibility of soft-tissue specimens, while dark-field reveals small-angle scatter from sub-resolution structures. Both have found many biomedical and engineering applications. The previously developed Unified Modulated Pattern Analysis (UMPA) model extracts these modalities from wavefront-marking data. We here present a new UMPA implementation, capable of rapidly processing large datasets and featuring capabilities to greatly extend the field of view. We also discuss possible artifacts and additional new features.
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Submitted 2 November, 2022;
originally announced November 2022.
