Single-Shot Electron Diffraction using a Cold Atom Electron Source
Authors:
Rory W. Speirs,
Corey T. Putkunz,
Andrew J. McCulloch,
Keith A. Nugent,
Benjamin M. Sparkes,
Robert E. Scholten
Abstract:
Cold atom electron sources are a promising alternative to traditional photocathode sources for use in ultrafast electron diffraction due to greatly reduced electron temperature at creation, and the potential for a corresponding increase in brightness. Here we demonstrate single-shot, nanosecond electron diffraction from monocrystalline gold using cold electron bunches generated in a cold atom elec…
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Cold atom electron sources are a promising alternative to traditional photocathode sources for use in ultrafast electron diffraction due to greatly reduced electron temperature at creation, and the potential for a corresponding increase in brightness. Here we demonstrate single-shot, nanosecond electron diffraction from monocrystalline gold using cold electron bunches generated in a cold atom electron source. The diffraction patterns have sufficient signal to allow registration of multiple single-shot images, generating an averaged image with significantly higher signal-to-noise ratio than obtained with unregistered averaging. Reflection high-energy electron diffraction (RHEED) was also demonstrated, showing that cold atom electron sources may be useful in resolving nanosecond dynamics of nanometre scale near-surface structures.
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Submitted 24 September, 2015; v1 submitted 23 June, 2015;
originally announced June 2015.
Femtosecond X-ray Laser induced transient electronic phase change observed in fullerene C60
Authors:
Brian Abbey,
Ruben A. Dilanian,
Connie Darmanin,
Rebecca A. Ryan,
Corey T. Putkunz,
Andrew V. Martin,
Victor Streltsov,
Michael W. M. Jones,
Naylyn Gaffney,
Felix Hofmann,
Garth J. Williams,
Sebastian Boutet,
Marc Messerschmidt,
M. Marvin Siebert,
Sophie Williams,
Evan Curwood,
Eugeniu Balaur,
Andrew G. Peele,
Keith A. Nugent,
Harry M. Quiney
Abstract:
X-ray Free-Electron Lasers (XFELs) deliver X-ray pulses with a coherent flux that is approximately eight orders of magnitude greater than that available from a modern third generation synchrotron source. The power density in an XFEL pulse may be so high that it can modify the electronic properties of a sample on a femtosecond timescale. Exploration of the interaction of intense coherent X-ray puls…
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X-ray Free-Electron Lasers (XFELs) deliver X-ray pulses with a coherent flux that is approximately eight orders of magnitude greater than that available from a modern third generation synchrotron source. The power density in an XFEL pulse may be so high that it can modify the electronic properties of a sample on a femtosecond timescale. Exploration of the interaction of intense coherent X-ray pulses and matter is of both intrinsic scientific interest, and of critical importance to the interpretation of experiments that probe the structures of materials using high-brightness femtosecond XFEL pulses. In this letter, we report observations of the diffraction of an extremely intense 32 fs nanofocused X-ray pulses by a powder sample of crystalline C60. We find that the diffraction pattern at the highest available incident power exhibits significant structural signatures that are absent in data obtained at both third-generation synchrotron sources or from XFEL sources operating at low output power. These signatures are consistent with a highly ordered structure that does not correspond with any previously known phase of crystalline C60. We argue that these data indicate the formation of a transient phase that is formed by a dynamic electronic distortion induced by inner-shell ionisation of at least one carbon atom in each C60 molecule.
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Submitted 24 September, 2012;
originally announced September 2012.