Showing 1–16 of 16 results for author: Poulsen, H F

Oblique diffraction geometry for the observation of several non-coplanar Bragg reflections under identical illumination

Authors: C. Detlefs, A. Henningsson, B. Kanesalingam, A. A. W. Cretton, C. Corley-Wiciak, F. T. Frankus, D. Pal, S. Irvine, S. Borgi, H. F. Poulsen, C. Yildirim, L. E. Dresselhaus-Marais

Abstract: We present a method to determine the strain tensor and local lattice rotation with Dark Field X-ray Microscopy. Using a set of at least 3 non-coplanar, symmetry-equivalent Bragg reflections, the illuminated volume of the sample can be kept constant for all reflections, facilitating easy registration of the measured lattice variations. This requires an oblique diffraction geometry, i.e.~the diffrac… ▽ More We present a method to determine the strain tensor and local lattice rotation with Dark Field X-ray Microscopy. Using a set of at least 3 non-coplanar, symmetry-equivalent Bragg reflections, the illuminated volume of the sample can be kept constant for all reflections, facilitating easy registration of the measured lattice variations. This requires an oblique diffraction geometry, i.e.~the diffraction plane is neither horizontal nor vertical. We derive a closed, analytical expression that allows determination of the strain and lattice rotation from the deviation of experimental observables (e.g.~goniometer angles) from their nominal position for an unstrained lattice. △ Less

Submitted 11 April, 2025; originally announced April 2025.

Comments: 8 pages, 1 figure. Submitted to Journal of Applied Crystallography

Pink-Beam Dark Field X-ray Microscopy: Expanding 3D/4D Imaging for Complex and Deformed Microstructures

Authors: Can Yildirim, Aditya Shukla, Yubin Zhang, Nikolas Mavrikakis, Louis Lesage, Virginia Sanna, Marilyn Sarkis, Yaozhu Li, Michela La Bella, Carsten Detlefs, Henning Friis Poulsen

Abstract: Dark Field X-ray Microscopy (DFXM) has advanced 3D non-destructive, high-resolution imaging of strain and orientation in crystalline materials, enabling the study of embedded structures in bulk. However, the photon-intensive nature of monochromatic DFXM limits its applicability to highly deformed or weakly crystalline structures and constrains time-resolved studies in industrially relevant materia… ▽ More Dark Field X-ray Microscopy (DFXM) has advanced 3D non-destructive, high-resolution imaging of strain and orientation in crystalline materials, enabling the study of embedded structures in bulk. However, the photon-intensive nature of monochromatic DFXM limits its applicability to highly deformed or weakly crystalline structures and constrains time-resolved studies in industrially relevant materials. We present pink-beam DFXM (\pDFXM) at the ID03 beamline of ESRF, achieving a 27-fold increase in diffracted intensity while maintaining 100 nm spatial resolution. We validate \pDFXM{} by imaging a partially recrystallized aluminum grain, confirming sufficient angular resolution for microstructure mapping. The increased flux significantly enhances the diffracted signal, enabling the resolution of subgrain structures. Additionally, we image a highly deformed ferritic iron grain, previously inaccessible in monochromatic mode without focusing optics. Beyond static imaging, \pDFXM{} enables real-time tracking of grain growth during annealing, achieving hundred-millisecond temporal resolution. By combining high photon flux with non-destructive, high-resolution 3D mapping, \pDFXM{} expands diffraction-contrast imaging to poorly diffracting crystals, unlocking new opportunities for studying grain growth, fatigue, and corrosion in bulk materials. △ Less

Submitted 7 March, 2025; originally announced March 2025.

Tracking solid oxide cell electrode microstructural evolution during annealing by scanning 3D X-ray diffraction microscopy

Authors: A. Shukla, S. De Angelis, J. Wright, Y. Zhang, J. Oddershede, H. F. Poulsen, J. W. Andreasen

Abstract: Ni particle coarsening is a primary degradation mechanism in Ni/YSZ solid oxide cells, limiting the lifespan of these devices. In this study, we demonstrate the use of Scanning 3D X-ray diffraction (S3DXRD) with an unprecedented spatial resolution of 100 nm, to monitor the microstructural evolution within the 3D volume of a solid oxide cell subjected to ex situ heat treatment. Unlike conventional… ▽ More Ni particle coarsening is a primary degradation mechanism in Ni/YSZ solid oxide cells, limiting the lifespan of these devices. In this study, we demonstrate the use of Scanning 3D X-ray diffraction (S3DXRD) with an unprecedented spatial resolution of 100 nm, to monitor the microstructural evolution within the 3D volume of a solid oxide cell subjected to ex situ heat treatment. Unlike conventional tomography, S3DXRD combines crystallographic information with spatial maps, enabling precise identification of grain boundaries and the determination of local curvature changes in the Ni microstructure. Our study reveals that the Ni phase undergoes significant structural changes during annealing, driven by grain growth. This transformation is characterized by a reduction in local curvature, particularly in regions where grains disappear. We observe that the disappearing grains are the smallest grains in the size distribution and are often located near pores. As a result, the most notable reduction in local curvature occurs at the Ni-pore interface. The quantitative characterization of polycrystalline microstructural evolution in Ni/YSZ system provides new insights into the mechanisms of Ni particle coarsening in SOC devices, potentially guiding strategies to enhance the long-term stability of SOC devices. △ Less

Submitted 14 October, 2024; originally announced October 2024.

Accelerated ray-tracing simulations using McXtrace

Authors: Steffen Sloth, Peter Kjær Willendrup, Hans Henrik Brandenborg Sørensen, Morten Christensen, Henning Friis Poulsen

Abstract: McXtrace is an established Monte Carlo based ray-tracing tool to simulate synchrotron beamlines and X-ray laboratory instruments. This work explains and demonstrates the new capability of GPU-accelerated McXtrace ray-tracing simulations. The openACC implementation is presented, followed by a demonstration of the achieved speed-up factor for several types of instruments across different types of ha… ▽ More McXtrace is an established Monte Carlo based ray-tracing tool to simulate synchrotron beamlines and X-ray laboratory instruments. This work explains and demonstrates the new capability of GPU-accelerated McXtrace ray-tracing simulations. The openACC implementation is presented, followed by a demonstration of the achieved speed-up factor for several types of instruments across different types of hardware. The instruments achieve speed-up factors around \SIrange{250}{600}{} dependent on the instrument complexity. Instruments requiring repeated memory access might require optimised memory access procedures to avoid severe penalties in the simulation time when using GPUs. The importance of reducing the simulations was demonstrated for an aviation security application by comparing the simulation time of a projection of an energy-dispersive X-ray computed tomography instrument. △ Less

Submitted 11 October, 2024; originally announced October 2024.

Grain boundary strain localization in CdTe solar cell revealed by Scanning 3D X-ray diffraction microscopy

Authors: A. Shukla, J. Wright, A. Henningsson, H. Stieglitz, E. Colegrove, L. Besley, C. Baur, S De Angelis, M. Stuckelberger, H. F. Poulsen, J. W. Andreasen

Abstract: Cadmium Telluride (CdTe) solar cell technology is a promising candidate to help boost green energy production. However, impurities and structural defects are major barriers to improving the solar power conversion efficiency. Grain boundaries often act as aggregation sites for impurities, resulting in strain localization in areas of high diffusion. In this study, we demonstrate the use of scanning… ▽ More Cadmium Telluride (CdTe) solar cell technology is a promising candidate to help boost green energy production. However, impurities and structural defects are major barriers to improving the solar power conversion efficiency. Grain boundaries often act as aggregation sites for impurities, resulting in strain localization in areas of high diffusion. In this study, we demonstrate the use of scanning 3D X-ray diffraction microscopy to non-destructively make 3D maps of the grains, their phase, orientation, and local strain within a CdTe solar cell absorber layer with a resolution of 100 nm. We quantify twin boundaries and suggest how they affect grain size and orientation distribution. Local strain analysis reveals that strain is primarily associated with high misorientation grain boundaries, whereas twin boundaries do not show high strain values. We also observe that high-strain grain boundaries form a continuous pathway connected to the CdS layer. Hence, this high-strain region is believed to be associated with the diffusion of sulfur from the CdS layer along grain boundaries. This hypothesis is supported by SEM EDS and X-ray fluorescence experiments. The method and analysis demonstrated in this work can be applied to different polycrystalline materials where the characterization of grain boundary properties is essential to understand the microstructural phenomena. △ Less

Submitted 11 February, 2024; originally announced February 2024.

Real-time imaging of acoustic waves in bulk materials with X-ray microscopy

Authors: Theodor S. Holstad, Leora E. Dresselhaus-Marais, Trygve Magnus Ræder, Bernard Kozioziemski, Tim van Driel, Matthew Seaberg, Eric Folsom, Jon H. Eggert, Erik Bergbäck Knudsen, Martin Meedom Nielsen, Hugh Simons, Kristoffer Haldrup, Henning Friis Poulsen

Abstract: Materials modelling and processing require experiments to visualize and quantify how external excitations drive the evolution of deep subsurface structure and defects that determine properties. Today, 3D movies with ~100-nm resolution of crystalline structure are regularly acquired in minutes to hours using X-ray diffraction based imaging. We present an X-ray microscope that improves this time res… ▽ More Materials modelling and processing require experiments to visualize and quantify how external excitations drive the evolution of deep subsurface structure and defects that determine properties. Today, 3D movies with ~100-nm resolution of crystalline structure are regularly acquired in minutes to hours using X-ray diffraction based imaging. We present an X-ray microscope that improves this time resolution to <100 femtoseconds, with images attainable even from a single X-ray pulse. Using this, we resolve the propagation of 18-km/s acoustic waves in mm-sized diamond crystals, and demonstrate how mechanical energy thermalizes from picosecond to microsecond timescales. Our approach unlocks a vast range of new experiments of materials phenomena with intricate structural dynamics at ultrafast timescales. △ Less

Submitted 14 November, 2022; v1 submitted 2 November, 2022; originally announced November 2022.

Polychromatic neutron phase contrast imaging of weakly absorbing samples enabled by phase retrieval

Authors: Maja Østergaard, Estrid Buhl Naver, Anders Kaestner, Peter K. Willendrup, Annemarie Brüel, Henning Osholm Sørensen, Jesper Skovhus Thomsen, Søren Schmidt, Henning Friis Poulsen, Luise Theil Kuhn, Henrik Birkedal

Abstract: We demonstrate the use of a phase retrieval technique for propagation-based phase contrast neutron imaging with a polychromatic beam. This enables imaging samples with low absorption contrast and/or improving the signal-to-noise ratio to facilitate e.g. time resolved measurements. A metal sample, designed to be close to a pure phase object, and a bone sample with canals partially filled with D2O w… ▽ More We demonstrate the use of a phase retrieval technique for propagation-based phase contrast neutron imaging with a polychromatic beam. This enables imaging samples with low absorption contrast and/or improving the signal-to-noise ratio to facilitate e.g. time resolved measurements. A metal sample, designed to be close to a pure phase object, and a bone sample with canals partially filled with D2O were used for demonstrating the technique. These samples were imaged with a polychromatic neutron beam followed by phase retrieval. For both samples the signal-to-noise ratio were significantly improved and in case of the bone sample, the phase retrieval allowed for separation of bone and D2O, which is important for example for in situ flow experiments. The use of deuteration-contrast avoids the use of chemical contrast enhancement and makes neutron imaging an interesting complementary method to X-ray imaging of bone. △ Less

Submitted 4 October, 2022; originally announced October 2022.

Non-destructive determination of phase, size, and strain of individual grains in polycrystalline photovoltaic materials

Authors: Mariana Mar Lucas, Tiago Ramos, Peter S. Jørgensen, Stela Canulescu, Peter Kenesei, Jonathan Wright, Henning F. Poulsen, Jens W. Andreasen

Abstract: We demonstrate a non-destructive approach to provide structural properties on the grain level for the absorber layer of kesterite solar cells. Kesterite solar cells are notoriously difficult to characterize structurally due to the co-existence of several phases with very similar lattice parameters. Specifically, we present a comprehensive study of 597 grains in the absorber layer of a 1.64% effici… ▽ More We demonstrate a non-destructive approach to provide structural properties on the grain level for the absorber layer of kesterite solar cells. Kesterite solar cells are notoriously difficult to characterize structurally due to the co-existence of several phases with very similar lattice parameters. Specifically, we present a comprehensive study of 597 grains in the absorber layer of a 1.64% efficient Cu2ZnSnS4 (CZTS) thin-film solar cell, from which 15 grains correspond to the secondary phase ZnS. By means of three dimensional X-ray diffraction (3DXRD), we obtained statistics for the phase, size, orientation, and strain tensors of the grains, as well as their twin relations. We observe an average tensile stress in the plane of the film of ~ 70 MPa and a compressive stress along the normal to the film of ~ 145 MPa. At the grain level, we derive a 3D stress tensor that deviates from the biaxial model usually assumed for thin films. 41% of the grains are twins. We calculate the frequency of the six types of $Σ$3 boundaries, revealing that 180° rotations along axis <221> is the most frequent. This technique can be applied to polycrystalline thin film solar cells in general, where strain can influence the bandgap of the absorber layer material, and twin boundaries play a role in the charge transport mechanisms. △ Less

Submitted 23 December, 2020; originally announced December 2020.

Comments: 28 pages, 12 figures, 4 tables

MSC Class: 78A45 ACM Class: J.2

Geometrical Optics Formalism to Model Contrast in Dark-Field X-ray Microscopy

Authors: H. F. Poulsen, L. E. Dresselhaus-Marais, M. A. Carlsen, C. Detlefs, G. Winther

Abstract: Dark-field X-ray microscopy is a new full-field imaging technique that nondestructively maps the structure and local strain inside deeply embedded crystalline elements in three dimensions. Placing an objective lens in the diffracted beam generates a magnified projection image of a local volume. We provide a general formalism based on geometrical optics for the diffraction imaging, valid for any cr… ▽ More Dark-field X-ray microscopy is a new full-field imaging technique that nondestructively maps the structure and local strain inside deeply embedded crystalline elements in three dimensions. Placing an objective lens in the diffracted beam generates a magnified projection image of a local volume. We provide a general formalism based on geometrical optics for the diffraction imaging, valid for any crystallographic space group. This allows simulation of diffraction images based on micro-mechanical models. We present example simulations with the formalism, demonstrating how it may be used to design new experiments or interpret existing ones. In particular, we show how modifications to the experimental design may tailor the reciprocal-space resolution function to map specific components of the deformation gradient tensor. The formalism supports multi-length scale experiments, as it enables DFXM to be interfaced with 3DXRD. The formalism is demonstrated by comparison to experimental images of the strain field around a straight dislocation. △ Less

Submitted 18 July, 2020; originally announced July 2020.

Journal ref: Journal of Applied Crystallography, 54, 6 (2021)

Revisiting neutron propagation-based phase contrast imaging and tomography: use of phase retrieval to amplify the effective degree of brilliance

Authors: David M. Paganin, Morten Sales, Peter M. Kadletz, Winfried Kockelmann, Mario A. Beltran, Henning F. Poulsen, Søren Schmidt

Abstract: Propagation-based neutron phase-contrast tomography was demonstrated using the ISIS pulsed spallation source. The proof-of-concept tomogram with Paganin-type phase-retrieval filter applied exhibited an effective net boost of $23\pm 1$ in the signal-to-noise ratio as compared to an attenuation-based tomogram, implying a boost in the effective degree of neutron brilliance of over two orders of magni… ▽ More Propagation-based neutron phase-contrast tomography was demonstrated using the ISIS pulsed spallation source. The proof-of-concept tomogram with Paganin-type phase-retrieval filter applied exhibited an effective net boost of $23\pm 1$ in the signal-to-noise ratio as compared to an attenuation-based tomogram, implying a boost in the effective degree of neutron brilliance of over two orders of magnitude. This comparison is for phase retrieval versus conventional absorption with no additional collimation in place. Expressions are provided for the optimal phase-contrast geometry as well as conditions for the validity of the method. The underpinning theory is derived under the assumption of the sample being composed of a single material. The effective boost in brilliance may be employed to give reduced acquisition time, or may instead be used to keep exposure times fixed while improving the measured contrast. △ Less

Submitted 11 October, 2022; v1 submitted 22 September, 2019; originally announced September 2019.

Comments: Revised version of the previous paper, as resubmitted to Physical Review Applied, with change of title and numerous updates to the text

Journal ref: Physical Review Applied 19, 034005 (2023)

X-ray coherent diffraction imaging with an objective lens: towards 3D mapping of thick polycrystals

Authors: Anders Filsøe Pedersen, Virginie Chamard, Carsten Detlefs, Tao Zhou, Dina Carbone, Henning Friis Poulsen

Abstract: We report on a new x-ray imaging method, which combines the high spatial resolution of coherent diffraction imaging with the ability of dark field microscopy to map grains within thick polycrystalline specimens. An x-ray objective serves to isolate a grain and avoid overlap of diffraction spots. Iterative oversampling routines are used to reconstruct the shape and strain field within the grain fro… ▽ More We report on a new x-ray imaging method, which combines the high spatial resolution of coherent diffraction imaging with the ability of dark field microscopy to map grains within thick polycrystalline specimens. An x-ray objective serves to isolate a grain and avoid overlap of diffraction spots. Iterative oversampling routines are used to reconstruct the shape and strain field within the grain from the far field intensity pattern. The limitation on resolution caused by the finite numerical aperture of the objective is overcome by the Fourier synthesis of several diffraction patterns. We demonstrate the method by an experimental study of a ~500 nm Pt grain for the two cases of a real and a virtual image plane. In the latter case the spatial resolution is 13 nm rms. Our results confirm that no information on the pupil function of the lens is required and that lens aberrations are not critical. △ Less

Submitted 31 August, 2018; originally announced October 2018.

Journal ref: Phys. Rev. Research 2, 033031 (2020)

Imbibition in plant seeds

Authors: Jean-François Louf, Yi Zheng, Aradhana Kumar, Tomas Bohr, Carsten Gundlach, Jesper Harholt, Henning Friis Poulsen, Kaare H. Jensen

Abstract: We describe imbibition in real and artificial plant seeds, using a combination of experiments and theory. In both systems, our experiments demonstrate that liquid permeates the substrate at a rate which decreases gradually over time. Tomographic imaging of soy seeds is used to confirmed this by observation of the permeating liquid using an iodine stain. To rationalize the experimental data, we pro… ▽ More We describe imbibition in real and artificial plant seeds, using a combination of experiments and theory. In both systems, our experiments demonstrate that liquid permeates the substrate at a rate which decreases gradually over time. Tomographic imaging of soy seeds is used to confirmed this by observation of the permeating liquid using an iodine stain. To rationalize the experimental data, we propose a model based on capillary action which predicts the temporal evolution of the radius of the wet front and the seed mass. The depth of the wetting front initially evolves as $t^{1/2}$ in accord with the Lucas-Washburn law. At later times, when the sphere is almost completely filled, the front radius scales as $(1-t/t_{\text{max}})^{1/2}$ where $t_{\text{max}}$ is the time required to complete imbibition. The data obtained on both natural and artificial seeds collapse onto a single curve that agrees well with our model, suggesting that capillary phenomena contribute to moisture uptake in soy seeds. △ Less

Submitted 20 June, 2018; originally announced June 2018.

Journal ref: Phys. Rev. E 98, 042403 (2018)

X-ray Fourier ptychographic microscopy

Authors: H. Simons, H. F. Poulsen, J. P. Guigay, C. Detlefs

Abstract: Following the recent developement of Fourier ptychographic microscopy (FPM) in the visible range by Zheng et al. (2013), we propose an adaptation for hard x-rays. FPM employs ptychographic reconstruction to merge a series of low-resolution, wide field of view images into a high-resolution image. In the x-ray range this opens the possibility to overcome the limited numerical aperture of existing x-… ▽ More Following the recent developement of Fourier ptychographic microscopy (FPM) in the visible range by Zheng et al. (2013), we propose an adaptation for hard x-rays. FPM employs ptychographic reconstruction to merge a series of low-resolution, wide field of view images into a high-resolution image. In the x-ray range this opens the possibility to overcome the limited numerical aperture of existing x-ray lenses. Furthermore, digital wave front correction (DWC) may be used to charaterize and correct lens imperfections. Given the diffraction limit achievable with x-ray lenses (below 100 nm), x-ray Fourier ptychographic microscopy (XFPM) should be able to reach resolutions in the 10 nm range. △ Less

Submitted 22 September, 2016; originally announced September 2016.

Comments: 9 pages, 1 figure

Extended formalism for simulating compound refractive lens-based x-ray microscopes

Authors: Hugh Simons, Sonja Rosenlund Ahl, Henning Friis Poulsen, Carsten Detlefs

Abstract: We present a comprehensive formalism for the simulation and optimisation of CRLs in both condensing and full-field imaging configurations. The approach extends ray transfer matrix analysis to account for x-ray attenuation by the lens material. Closed analytical expressions for critical imaging parameters such as numerical aperture, vignetting, chromatic aberration and focal length are provided for… ▽ More We present a comprehensive formalism for the simulation and optimisation of CRLs in both condensing and full-field imaging configurations. The approach extends ray transfer matrix analysis to account for x-ray attenuation by the lens material. Closed analytical expressions for critical imaging parameters such as numerical aperture, vignetting, chromatic aberration and focal length are provided for both thin- and thick-lens imaging geometries. △ Less

Submitted 8 February, 2016; originally announced February 2016.

Comments: 11 pages, 1 figure

Full-field hard x-ray microscopy with interdigitated silicon lenses

Authors: Hugh Simons, Frederik Stöhr, Jonas Michael-Lindhard, Flemming Jensen, Ole Hansen, Carsten Detlefs, Henning Friis Poulsen

Abstract: Full-field x-ray microscopy using x-ray objectives has become a mainstay of the biological and materials sciences. However, the inefficiency of existing objectives at x-ray energies above 15 keV has limited the technique to weakly absorbing or two-dimensional (2D) samples. Here, we show that significant gains in numerical aperture and spatial resolution may be possible at hard x-ray energies by us… ▽ More Full-field x-ray microscopy using x-ray objectives has become a mainstay of the biological and materials sciences. However, the inefficiency of existing objectives at x-ray energies above 15 keV has limited the technique to weakly absorbing or two-dimensional (2D) samples. Here, we show that significant gains in numerical aperture and spatial resolution may be possible at hard x-ray energies by using silicon-based optics comprising 'interdigitated' refractive silicon lenslets that alternate their focus between the horizontal and vertical directions. By capitalizing on the nano-manufacturing processes available to silicon, we show that it is possible to overcome the inherent inefficiencies of silicon-based optics and interdigitated geometries. As a proof-of-concept of Si-based interdigitated objectives, we demonstrate a prototype interdigitated lens with a resolution of ~255 nm at 17 keV. △ Less

Submitted 22 June, 2015; originally announced June 2015.

Comments: 10 pages, 5 figure. Submitted to Applied Physics Letters 31st March 2015, rejected 17th June 2015

The Atomic and Electronic Structure of Liquid N- Methylformamide as Determined from Diffraction Experiments

Authors: J. Neuefeind, M. D. Zeidler, H. F. Poulsen

Abstract: The structure of liquid N-methylformamide (NMF) has been investigated using synchrotron radiation at 77 and 95 keV. The use of high energy photons has several advantages, in this case especially the large accessible momentum transfer range, the low absorption and the direct comparability with neutron diffraction. The range of momentum transfer covered is 0.6 Å$^{-1} <$ Q $<$24.0 Å$^{-1}$. Neutro… ▽ More The structure of liquid N-methylformamide (NMF) has been investigated using synchrotron radiation at 77 and 95 keV. The use of high energy photons has several advantages, in this case especially the large accessible momentum transfer range, the low absorption and the direct comparability with neutron diffraction. The range of momentum transfer covered is 0.6 Å$^{-1} <$ Q $<$24.0 Å$^{-1}$. Neutron diffraction data on the same sample in the same momentum transfer range have been published previously. In that study two differently isotope - substituted species were investigated. In order to compare neutron and photon diffraction data properly Reverse Monte Carlo (RMC-) simulations have been performed. Some modifications had to be added to the standard RMC- code introducing different constraints for inter- and intramolecular distances as these distances partly overlap in liquid NMF. RMC- simulations having only the neutron data as input were carried out in order to test the quality of the X-ray data. The photon structure factor calculated from the RMC- configurations is found to agree well with the present experimental data, while it deviates considerably from earlier X-ray work using low energy photons (17 keV). Finally we discuss whether the different interaction mechanisms of neutrons and photons can be used to directly access the electronic structure in the liquid. Evidence is presented that the elastic self scattering part of liquid NMF is changed with respect to the independent atom approximation. This modification can be accounted for by a simple charged atoms model. △ Less

Submitted 3 November, 1995; originally announced November 1995.

Comments: Accepted for publication in Molecular Physics, LaTex file, 12 pages, figures not included

Journal ref: Mol. Phys. 87 (1996) 189