A duality between surface charge and work function in scanning Kelvin probe microscopy
Authors:
Isaac C. D. Lenton,
Felix Pertl,
Lubuna Shafeek,
Scott R. Waitukaitis
Abstract:
Scanning Kelvin probe microscopy (SKPM) is a powerful technique for macroscopic imaging of the electrostatic potential above a surface. Though most often used to image work-function variations of conductive surfaces, it can also be used to probe the surface charge on insulating surfaces. In both cases, relating the measured potential to the underlying signal is non-trivial. Here, we derive general…
▽ More
Scanning Kelvin probe microscopy (SKPM) is a powerful technique for macroscopic imaging of the electrostatic potential above a surface. Though most often used to image work-function variations of conductive surfaces, it can also be used to probe the surface charge on insulating surfaces. In both cases, relating the measured potential to the underlying signal is non-trivial. Here, we derive general relationships between the measured SKPM voltage and the underlying source, revealing either can be cast as a convolution with an appropriately scaled point spread function (PSF). For charge that exists on a thin insulating layer above a conductor, the PSF has the same shape as what would occur from a work-function variation alone, differing by a simple scaling factor. We confirm this relationship by: (1) backing it out from finite-element simulations of work-function and charge signals, and (2) experimentally comparing the measured PSF from a small work-function target to that from a small charge spot. This scaling factor is further validated by comparing SKPM charge measurements with Faraday cup measurements for highly charged samples from contact-charging experiments. Our results highlight a hereto unappreciated connection between SKPM voltage and charge signals, offering a rigorous recipe to extract either from experimental data.
△ Less
Submitted 8 June, 2025;
originally announced June 2025.
Beyond the blur: using experimentally determined point spread functions to improve scanning Kelvin probe imaging
Authors:
Isaac C. D. Lenton,
Felix Pertl,
Lubuna Shafeek,
Scott R. Waitukaitis
Abstract:
Scanning Kelvin probe microscopy (SKPM) is a powerful technique for investigating the electrostatic properties of material surfaces, enabling the imaging of variations in work function, topology, surface charge density, or combinations thereof. Regardless of the underlying signal source, SKPM results in a voltage image which is spatially distorted due to the finite size of the probe, long-range el…
▽ More
Scanning Kelvin probe microscopy (SKPM) is a powerful technique for investigating the electrostatic properties of material surfaces, enabling the imaging of variations in work function, topology, surface charge density, or combinations thereof. Regardless of the underlying signal source, SKPM results in a voltage image which is spatially distorted due to the finite size of the probe, long-range electrostatic interactions, mechanical and electrical noise, and the finite response time of the electronics. In order to recover the underlying signal, it is necessary to deconvolve the measurement with an appropriate point spread function (PSF) that accounts the aforementioned distortions, but determining this PSF is difficult. Here we describe how such PSFs can be determined experimentally, and show how they can be used to recover the underlying information of interest. We first consider the physical principles that enable SKPM, and discuss how these affect the system PSF. We then show how one can experimentally measure PSFs by looking at well defined features, and that these compare well to simulated PSFs, provided scans are performed extremely slowly and carefully. Next, we work at realistic scan speeds, and show that the idealised PSFs fail to capture temporal distortions in the scan direction. While simulating PSFs for these situations would be quite challenging, we show that measuring PSFs with similar scan conditions works well. Our approach clarifies the basic principles of and inherent challenges to SKPM measurements, and gives practical methods to improve results
△ Less
Submitted 25 July, 2024; v1 submitted 4 April, 2024;
originally announced April 2024.
