The development of IBIC microscopy at the 100 kV ion implanter of the University of Torino (LIUTo) and the application for the assessment of the radiation hardness of a silicon photodiode
Authors:
Emilio Corte,
Alberto Bortone,
Elena Nieto Hernández,
Carlo Ceresa,
Georgios Provatas,
Karla Ivanković Nizić,
Milko Jaksić,
Ettore Vittone,
Sviatoslav Ditalia Tchernij
Abstract:
The Ion Beam Induced Charge (IBIC) technique is widely used to characterize the electronic properties of semiconductor materials and devices. Its main advantage over other charge collection microscopies stems in the use of MeV ion probes, which provide both measurable induced charge signals from single ions, and high spatial resolution, which is maintained along the ion range. It is a fact, howeve…
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The Ion Beam Induced Charge (IBIC) technique is widely used to characterize the electronic properties of semiconductor materials and devices. Its main advantage over other charge collection microscopies stems in the use of MeV ion probes, which provide both measurable induced charge signals from single ions, and high spatial resolution, which is maintained along the ion range. It is a fact, however, that the use of low-energy ions in the keV range can provide the IBIC technique with complementary analytical capabilities, that are not available with MeV ions, for example the higher sensitivity to the status, contamination and morphology of the surface and the fact that the induced signal depends on the transport of only one type of charge carrier. This paper outlines the upgrade that was made at the 100 kV ion implanter of the University of Torino, originally installed for material and surface modification, to explore the rather unexplored keV-IBIC field and to assess its potential to characterize semiconductor devices. Finally, we report the first IBIC application of our apparatus, which regards the assessment of the radiation damage of a commercially available silicon photodiode, adopting the IAEA experimental protocol and the relevant interpretative model.
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Submitted 31 January, 2025;
originally announced January 2025.
IBIC analysis of a linear position sensitive detector: model and experiment
Authors:
Ettore Vittone,
Georgios Provatas,
Karla Ivanković Nizić,
Milko Jaksic
Abstract:
The ion beam-induced charge (IBIC) analysis of a commercial silicon photodiode configured as a Position Sensitive Detector (PSD) for energetic charged particles is the subject of this report. Although the photodiode is designed for detecting the position of incident light and optimized for use in the UV region, we present evidence that it also performs well as a detector for ions, with energies in…
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The ion beam-induced charge (IBIC) analysis of a commercial silicon photodiode configured as a Position Sensitive Detector (PSD) for energetic charged particles is the subject of this report. Although the photodiode is designed for detecting the position of incident light and optimized for use in the UV region, we present evidence that it also performs well as a detector for ions, with energies in the MeV range. The device consists of a uniform p-type layer formed on a high-resistivity n-type semiconductor substrate, a pair of electrodes on both ends of the resistive layer, and a common electrode located on the backside of the substrate. The IBIC experiment was carried out at the Laboratory for Ion Beam Interaction (LIBI) of the Ruder Boskovic Institute in Zagreb (HR), using 2 MeV proton microbeam raster scanning the 2.5x0.6 mm2 active area of the PSD. Each of the three electrodes was connected to independent standard NIM charge-sensitive electronic chain and the induced charge pulses associated with the position of individual ions were then digitized using a multi-channel analyzer interfaced with the SPECTOR software. The longitudinal Charge Collection Efficiency (CCE) profiles acquired from the top electrodes show linear behaviors with opposite slopes, whereas the profile relevant to the signals from the back electrode is almost constant. A model based on the IBIC theory satisfactorily interprets these results. It offers an alternative viewpoint to the commonly adopted Lateral Effect Photodiode principle and paves the way for the development of new PSDs for the identification of the impact position of a MeV ion with a resolution at the micrometer scale.
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Submitted 14 December, 2024;
originally announced December 2024.
