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Showing 1–5 of 5 results for author: Naujoks, D

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  1. Analysis of the neutral fluxes in the divertor region of Wendelstein 7-X under attached and detached conditions using EMC3-EIRENE

    Authors: Dieter Boeyaerta, Yuhe Feng, Heinke Frerichs, Thierry Kremeyer, Dirk Naujoks, Felix Reimold, Oliver Schmitz, Victoria Winters, Sergey Bozhenkov, Joris Fellinger, Marcin Jakubowski, Ralf König, Maciej Krychowiak, Valeria Perseo, Georg Schlisio, Uwe Wenzel, W7-X team

    Abstract: This paper analyzes the neutral fluxes in the divertor region of the W7-X standard configuration for different input powers, both under attached and detached conditions. The performed analysis is conducted through EMC3-EIRENE simulations. They show the importance of the horizontal divertor to generate neutrals, and resolve the neutral plugging in the divertor region. Simulations of detached cases… ▽ More

    Submitted 14 November, 2023; originally announced November 2023.

  2. arXiv:2104.04392  [pdf

    cond-mat.mtrl-sci physics.data-an

    Deep learning for visualization and novelty detection in large X-ray diffraction datasets

    Authors: Lars Banko, Phillip M. Maffettone, Dennis Naujoks, Daniel Olds, Alfred Ludwig

    Abstract: We apply variational autoencoders (VAE) to X-ray diffraction (XRD) data analysis on both simulated and experimental thin-film data. We show that crystal structure representations learned by a VAE reveal latent information, such as the structural similarity of textured diffraction patterns. While other artificial intelligence (AI) agents are effective at classifying XRD data into known phases, a si… ▽ More

    Submitted 9 April, 2021; originally announced April 2021.

  3. arXiv:1910.09468  [pdf

    physics.app-ph cond-mat.mtrl-sci physics.comp-ph

    Mastering processing-microstructure complexity through the prediction of thin film structure zone diagrams by generative machine learning models

    Authors: Lars Banko, Yury Lysogorskiy, Dario Grochla, Dennis Naujoks, Ralf Drautz, Alfred Ludwig

    Abstract: Thin films are ubiquitous in modern technology and highly useful in materials discovery and design. For achieving optimal extrinsic properties their microstructure needs to be controlled in a multi-parameter space, which usually requires a too-high number of experiments to map. We propose to master thin film processing microstructure complexity and to reduce the cost of microstructure design by jo… ▽ More

    Submitted 21 October, 2019; originally announced October 2019.

    Journal ref: Banko, L., Lysogorskiy, Y., Grochla, D. et al. Predicting structure zone diagrams for thin film synthesis by generative machine learning. Commun Mater 1, 15 (2020)

  4. arXiv:1906.07457  [pdf, other

    physics.plasm-ph physics.comp-ph

    Validating the ASCOT modelling of NBI fast ions in Wendelstein 7-X stellarator

    Authors: S. Äkäslompolo, P. Drewelow, Y. Gao, A. Ali, C. Biedermann, S. Bozhenkov, C. P. Dhard, M. Endler, J. Fellinger, O. P. Ford, B. Geiger, J. Geiger, N. den Harderd, D. Hartmann, D. Hathiramani, M. Isobe, M. Jakubowski, Y. Kazakov, C. Killer, S. Lazerson, M. Mayerd, P. McNeely, D. Naujoks, T. W. C. Neelis, J. Kontula , et al. (15 additional authors not shown)

    Abstract: The first fast ion experiments in Wendelstein 7-X were performed in 2018. They are one of the first steps in demonstrating the optimised fast ion confinement of the stellarator. The fast ions were produced with a neutral beam injection (NBI) system and detected with infrared cameras (IR), a fast ion loss detector (FILD), fast ion charge exchange spectroscopy (FIDA), and post-mortem analysis of pla… ▽ More

    Submitted 10 September, 2019; v1 submitted 18 June, 2019; originally announced June 2019.

    Comments: Presented in the 3rd European Conference on Plasma Diagnostics; 6th to 9th of May 2019; Lisbon, Portugal

    Journal ref: S. Akaslompolo et al 2019 JINST 14 C10012

  5. arXiv:1806.02684  [pdf

    physics.ins-det physics.plasm-ph

    Simulation System for the Wendelstein 7-X Safety Control System

    Authors: J. Schacht, A. Woelk, S. Pingel, U. Herbst, D. Naujoks, the W7-X Team

    Abstract: The Wendelstein 7-X (W7-X) Safety Instrumented System (SIS) ensures personal safety and investment protection. The development and implementation of the SIS are based on the international safety standard for the process industry sector, IEC 61511. The SIS exhibits a distributed and hierarchical organized architecture consisting of a central Safety System (cSS) on the top and many local Safety Syst… ▽ More

    Submitted 6 June, 2018; originally announced June 2018.