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Design, Fabrication, and Experimental Demonstration of Junction Surface Ion Traps
Authors:
D. L. Moehring,
C. Highstrete,
D. Stick,
K. M. Fortier,
R. Haltli,
C. Tigges,
M. G. Blain
Abstract:
We present the design, fabrication, and experimental implementation of surface ion traps with Y-shaped junctions. The traps are designed to minimize the pseudopotential variations in the junction region at the symmetric intersection of three linear segments. We experimentally demonstrate robust linear and junction shuttling with greater than one million round-trip shuttles without ion loss. By min…
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We present the design, fabrication, and experimental implementation of surface ion traps with Y-shaped junctions. The traps are designed to minimize the pseudopotential variations in the junction region at the symmetric intersection of three linear segments. We experimentally demonstrate robust linear and junction shuttling with greater than one million round-trip shuttles without ion loss. By minimizing the direct line of sight between trapped ions and dielectric surfaces, negligible day-to-day and trap-to-trap variations are observed. In addition to high-fidelity single-ion shuttling, multiple-ion chains survive splitting, ion-position swapping, and recombining routines. The development of two-dimensional trapping structures is an important milestone for ion-trap quantum computing and quantum simulations.
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Submitted 9 May, 2011;
originally announced May 2011.
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Integration of fluorescence collection optics with a microfabricated surface electrode ion trap
Authors:
Gregory R. Brady,
A. Robert Ellis,
David L. Moehring,
Daniel Stick,
Clark Highstrete,
Kevin M. Fortier,
Matthew G. Blain,
Raymond A. Haltli,
Alvaro A. Cruz-Cabrera,
Ronald D. Briggs,
Joel R. Wendt,
Tony R. Carter,
Sally Samora,
Shanalyn A. Kemme
Abstract:
We have successfully demonstrated an integrated optical system for collecting the fluorescence from a trapped ion. The system, consisting of an array of transmissive, dielectric micro-optics and an optical fiber array, has been intimately incorporated into the ion-trapping chip without negatively impacting trapping performance. Epoxies, vacuum feedthrough, and optical component materials were care…
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We have successfully demonstrated an integrated optical system for collecting the fluorescence from a trapped ion. The system, consisting of an array of transmissive, dielectric micro-optics and an optical fiber array, has been intimately incorporated into the ion-trapping chip without negatively impacting trapping performance. Epoxies, vacuum feedthrough, and optical component materials were carefully chosen so that they did not degrade the vacuum environment, and we have demonstrated light detection as well as ion trapping and shuttling behavior comparable to trapping chips without integrated optics, with no modification to the control voltages of the trapping chip.
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Submitted 23 September, 2010; v1 submitted 17 August, 2010;
originally announced August 2010.
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Demonstration of a microfabricated surface electrode ion trap
Authors:
D Stick,
K M Fortier,
R Haltli,
C Highstrete,
D L Moehring,
C Tigges,
M G Blain
Abstract:
In this paper we present the design, modeling, and experimental testing of surface electrode ion traps fabricated in a heterostructure configuration comprising a silicon substrate, silicon dioxide insulators, and aluminum electrodes. This linear trap has a geometry with symmetric RF leads, two interior DC electrodes, and 40 individual lateral DC electrodes. Plasma enhanced chemical vapor depositio…
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In this paper we present the design, modeling, and experimental testing of surface electrode ion traps fabricated in a heterostructure configuration comprising a silicon substrate, silicon dioxide insulators, and aluminum electrodes. This linear trap has a geometry with symmetric RF leads, two interior DC electrodes, and 40 individual lateral DC electrodes. Plasma enhanced chemical vapor deposition (PECVD) was used to grow silicon dioxide pillars to electrically separate overhung aluminum electrodes from an aluminum ground plane. In addition to fabrication, we report techniques for modeling the control voltage solutions and the successful demonstration of trapping and shuttling ions in two identically constructed traps.
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Submitted 16 November, 2010; v1 submitted 5 August, 2010;
originally announced August 2010.
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Precision measurement of the lifetime of the 6p 2P_1/2 level of Yb+
Authors:
S. Olmschenk,
D. Hayes,
D. N. Matsukevich,
P. Maunz,
D. L. Moehring,
K. C. Younge,
C. Monroe
Abstract:
We present a precise measurement of the lifetime of the 6p 2P_1/2 excited state of a single trapped ytterbium ion (Yb+). A time-correlated single-photon counting technique is used, where ultrafast pulses excite the ion and the emitted photons are coupled into a single-mode optical fiber. By performing the measurement on a single atom with fast excitation and excellent spatial filtering, we are a…
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We present a precise measurement of the lifetime of the 6p 2P_1/2 excited state of a single trapped ytterbium ion (Yb+). A time-correlated single-photon counting technique is used, where ultrafast pulses excite the ion and the emitted photons are coupled into a single-mode optical fiber. By performing the measurement on a single atom with fast excitation and excellent spatial filtering, we are able to eliminate common systematics. The lifetime of the 6p 2P_1/2 state is measured to be 8.12 +/- 0.02 ns.
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Submitted 2 June, 2009;
originally announced June 2009.
