Axis-dependent carrier polarity in polycrystalline NaSn$_2$As$_2$
Authors:
Naoto Nakamura,
Yosuke Goto,
Yoshikazu Mizuguchi
Abstract:
Transverse thermoelectric devices consist of only one thermoelectric material, unlike conventional longitudinal thermoelectric devices that require two types of thermoelectric materials with p- and n-type polarities. However, scalable synthesis of materials that demonstrate axis-dependent carrier polarity, which is a prospective component to demonstrate the transverse thermoelectric device, is cha…
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Transverse thermoelectric devices consist of only one thermoelectric material, unlike conventional longitudinal thermoelectric devices that require two types of thermoelectric materials with p- and n-type polarities. However, scalable synthesis of materials that demonstrate axis-dependent carrier polarity, which is a prospective component to demonstrate the transverse thermoelectric device, is challenging. This paper reports that polycrystalline NaSn$_2$As$_2$, which was prepared by using uniaxial hot pressing, displayed axis-dependent carrier polarity. The preferred orientation of the sample was confirmed through X-ray diffraction measurements. Seebeck coefficient measurements indicate that carrier polarity depends on the measurement direction, which is consistent with recently reported results on single crystals of NaSn$_2$As$_2$. Given that our sample preparation procedure is readily scalable, the present work shows the possibility for preparing transverse thermoelectric devices using polycrystalline NaSn$_2$As$_2$ with a preferred orientation.
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Submitted 1 April, 2021;
originally announced April 2021.
Large local disorder in the superconducting K_{0.8}Fe_{1.6}Se_{2} studied by extended x-ray absorption fine structure
Authors:
Antonella Iadecola,
Boby Joseph,
Laura Simonelli,
Alessandro Puri,
Yoshikazu Mizuguchi,
Hiroyuki Takeya,
Yoshihiko Takano,
Naurang Lal Saini
Abstract:
We have measured local structure of superconducting K_{0.8}Fe_{1.6}Se_{2} chalcogenide (T_{c}=31.8 K) by temperature dependent polarized extended x-ray absorption fine structure (EXAFS) at the Fe and Se K-edges. We find that the system is characterized by a large local disorder. The Fe-Se and Fe-Fe distances are found to be shorter than the distances measured by diffraction, while the correspondin…
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We have measured local structure of superconducting K_{0.8}Fe_{1.6}Se_{2} chalcogenide (T_{c}=31.8 K) by temperature dependent polarized extended x-ray absorption fine structure (EXAFS) at the Fe and Se K-edges. We find that the system is characterized by a large local disorder. The Fe-Se and Fe-Fe distances are found to be shorter than the distances measured by diffraction, while the corresponding mean square relative displacements reveal large Fe-site disorder and relatively large c-axis disorder. The local force constant for Fe-Se bondlength (k ~ 5.8 eV/Å^{2}) is similar to the one found in the binary FeSe superconductor, however, the Fe-Fe bondlength appears to get flexible (k ~ 2.1 eV/Å^{2}) in comparison to the binary FeSe (k ~ 3.5 eV/Å^{2}), an indication of partly relaxed Fe-Fe networks in K_{0.8}Fe_{1.6}Se_{2}. The results suggest glassy nature of the title system, with the superconductivity being similar to the one in the granular materials.
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Submitted 3 April, 2012;
originally announced April 2012.
