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Proton Irradiation Experiment for the X-ray Charge-Coupled Devices of the Monitor of All-sky X-ray Image mission onboard the International Space Station: I. Experimental Setup and Measurement of the Charge Transfer Inefficiency
Authors:
E. Miyata,
T. Kamazuka,
H. Kouno,
M. Fukuda M. Mihara,
K. Matsuta,
H. Tsunemi,
K. Tanaka,
T Minamisono,
H. Tomida,
K. Miyaguchi
Abstract:
We have investigated the radiation damage effects on a CCD to be employed in the Japanese X-ray astronomy mission including the Monitor of All-sky X-ray Image (MAXI) onboard the International Space Station (ISS). Since low energy protons release their energy mainly at the charge transfer channel, resulting a decrease of the charge transfer efficiency, we thus focused on the low energy protons in…
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We have investigated the radiation damage effects on a CCD to be employed in the Japanese X-ray astronomy mission including the Monitor of All-sky X-ray Image (MAXI) onboard the International Space Station (ISS). Since low energy protons release their energy mainly at the charge transfer channel, resulting a decrease of the charge transfer efficiency, we thus focused on the low energy protons in our experiments. A 171 keV to 3.91 MeV proton beam was irradiated to a given device. We measured the degradation of the charge transfer inefficiency (CTI) as a function of incremental fluence. A 292 keV proton beam degraded the CTI most seriously. Taking into account the proton energy dependence of the CTI, we confirmed that the transfer channel has the lowest radiation tolerance. We have also developed the different device architectures to reduce the radiation damage in orbit. Among them, the ``notch'' CCD, in which the buried channel implant concentration is increased, resulting in a deeper potential well than outside, has three times higher radiation tolerance than that of the normal CCD. We then estimated the charge transfer inefficiency of the CCD in the orbit of ISS, considering the proton energy spectrum. The CTI value is estimated to be 1.1e-5 per each transfer after two years of mission life in the worse case analysis if the highest radiation-tolerant device is employed. This value is well within the acceptable limit and we have confirmed the high radiation-tolerance of CCDs for the MAXI mission.
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Submitted 26 August, 2002;
originally announced August 2002.
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Application of the Mesh Experiment for the Back-Illuminated CCD: I. Experiment and the Charge Cloud Shape
Authors:
E. Miyata,
M. Miki,
J. Hiraga,
H. Kouno,
K. Yasui,
H. Tsunemi,
K. Miyaguchi,
K. Yamamoto
Abstract:
We have employed a mesh experiment for back-illuminated (BI) CCDs. BI CCDs possess the same structure to those of FI CCDs. Since X-ray photons enter from the back surface of the CCD, a primary charge cloud is formed far from the electrodes. The primary charge cloud expands through diffusion process until it reaches the potential well that is just below the electrodes. Therefore, the diffusion ti…
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We have employed a mesh experiment for back-illuminated (BI) CCDs. BI CCDs possess the same structure to those of FI CCDs. Since X-ray photons enter from the back surface of the CCD, a primary charge cloud is formed far from the electrodes. The primary charge cloud expands through diffusion process until it reaches the potential well that is just below the electrodes. Therefore, the diffusion time for the charge cloud produced is longer than that in the FI CCD, resulting a larger charge cloud shape expected.
The mesh experiment enables us to specify the X-ray point of interaction with a subpixel resolution. We then have measured a charge cloud shape produced in the BI CCD. We found that there are two components of the charge cloud shape having different size: a narrow component and a broad component. The size of the narrow component is $2.8-5.7 μ$m in unit of a standard deviation and strongly depends on the attenuation length in Si of incident X-rays. The shorter the attenuation length of X-rays is, the larger the charge cloud becomes. This result is qualitatively consistent with a diffusion model inside the CCD. On the other hand, the size of the broad component is roughly constant of $\simeq 13 μ$m and does not depend on X-ray energies. Judging from the design value of the CCD and the fraction of each component, we conclude that the narrow component is originated in the depletion region whereas the broad component is in the field-free region.
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Submitted 9 June, 2002;
originally announced June 2002.
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Direct X-ray Imaging of $μ$m precision using Back-Illuminated CCD
Authors:
E. Miyata,
M. Miki,
H. Tsunemi,
J. Hiraga,
H. Kouno,
K. Miyaguchi
Abstract:
A charge-coupled device (CCD) is a standard imager in optical region in which the image quality is limited by its pixel size. CCDs also function in X-ray region but with substantial differences in performance. An optical photon generates only one electron while an X-ray photon generates many electrons at a time. We developed a method to precisely determine the X-ray point of interaction with sub…
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A charge-coupled device (CCD) is a standard imager in optical region in which the image quality is limited by its pixel size. CCDs also function in X-ray region but with substantial differences in performance. An optical photon generates only one electron while an X-ray photon generates many electrons at a time. We developed a method to precisely determine the X-ray point of interaction with subpixel resolution. In particular, we found that a back-illuminated CCD efficiently functions as a fine imager. We present here the validity of our method through an actual imaging experiment.
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Submitted 1 April, 2002;
originally announced April 2002.
