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Showing 1–5 of 5 results for author: Mangler, C

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  1. arXiv:2109.08456  [pdf, other

    cond-mat.mtrl-sci physics.comp-ph

    Towards Exotic Layered Materials: 2D Cuprous Iodide

    Authors: Kimmo Mustonen, Christoph Hofer, Peter Kotrusz, Alexander Markevich, Martin Hulman, Clemens Mangler, Toma Susi, Timothy J. Pennycook, Karol Hricovini, Christine M. Richter, Jannik C. Meyer, Jani Kotakoski, Viera Skakalova

    Abstract: Heterostructures composed of two-dimensional (2D) materials are already opening many new possibilities in such fields of technology as electronics and magnonics, but far more could be achieved if the number and diversity of 2D materials is increased. So far, only a few dozen 2D crystals have been extracted from materials that exhibit a layered phase in ambient conditions, omitting entirely the lar… ▽ More

    Submitted 3 December, 2021; v1 submitted 17 September, 2021; originally announced September 2021.

    Comments: 15 pages, 6 figures, separate supplementary material included

  2. arXiv:1809.08946  [pdf, other

    physics.app-ph cond-mat.mtrl-sci

    Direct visualization of the 3D structure of silicon impurities in graphene

    Authors: Christoph Hofer, Viera Skakalova, Mohammad Reza Ahmadpour Monazam, Clemens Mangler, Jani Kotakoski, Toma Susi, Jannik C. Meyer

    Abstract: We directly visualize the three-dimensional (3D) geometry and dynamics of silicon impurities in graphene as well as their dynamics by aberration-corrected scanning transmission electron microscopy. By acquiring images when the sample is tilted, we show that an asymmetry of the atomic position of the heteroatom in the projection reveals the non-planarity of the structure. From a sequence of images,… ▽ More

    Submitted 24 September, 2018; originally announced September 2018.

  3. arXiv:1807.00677  [pdf, other

    physics.app-ph cond-mat.mes-hall

    Revealing the 3D Structure of Graphene Defects

    Authors: Christoph Hofer, Christian Kramberger, Mohammad Reza Ahmadpour Monazam, Clemens Mangler, Andreas Mittelberger, Giacomo Argentero, Jani Kotakoski, Jannik C. Meyer

    Abstract: We demonstrate insights into the three-dimensional structure of defects in graphene, in particular grain boundaries, obtained via a new approach from two transmission electron microscopy images recorded at different angles. The structure is obtained through an optimization process where both the atomic positions as well as the simulated imaging parameters are iteratively changed until the best pos… ▽ More

    Submitted 2 July, 2018; originally announced July 2018.

    Comments: submitted

  4. arXiv:1608.04676  [pdf, other

    physics.ins-det cond-mat.mtrl-sci

    Isotope analysis in the transmission electron microscope

    Authors: Toma Susi, Christoph Hofer, Giacomo Argentero, Gregor T. Leuthner, Timothy J. Pennycook, Clemens Mangler, Jannik C. Meyer, Jani Kotakoski

    Abstract: The Ångström-sized probe of the scanning transmission electron microscope can visualize and collect spectra from single atoms. This can unambiguously resolve the chemical structure of materials, but not their isotopic composition. Here we differentiate between two isotopes of the same element by quantifying how likely the energetic imaging electrons are to eject atoms. First, we measure the displa… ▽ More

    Submitted 16 August, 2016; originally announced August 2016.

    Comments: 35 pages, 6 figures, 1 table

  5. Towards weighing individual atoms by high-angle scattering of electrons

    Authors: G. Argentero, C. Mangler, J. Kotakoski, F. R. Eder, J. C. Meyer

    Abstract: We consider theoretically the energy loss of electrons scattered to high angles when assuming that the primary beam can be limited to a single atom. We discuss the possibility of identifying the isotopes of light elements and of extracting information about phonons in this signal. The energy loss is related to the mass of the much heavier nucleus, and is spread out due to atomic vibrations. Import… ▽ More

    Submitted 22 January, 2015; originally announced January 2015.

    Comments: 19 pages, 6 figures

    Journal ref: Ultramicroscopy 151, 23-30 (2015)