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Superconducting Pulse Conserving Logic and Josephson-SRAM
Authors:
Quentin Herr,
Trent Josephsen,
Anna Herr
Abstract:
Superconducting digital Pulse-Conserving Logic (PCL) and Josephson SRAM (JSRAM) memory together enable scalable circuits with energy efficiency 100x beyond leading-node CMOS. Circuit designs support high throughput and low latency when implemented in an advanced fabrication stack with high-critical-current-density Josephson junctions of 1000$μ$A/$μ$m$^2$. Pulse-conserving logic produces one single…
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Superconducting digital Pulse-Conserving Logic (PCL) and Josephson SRAM (JSRAM) memory together enable scalable circuits with energy efficiency 100x beyond leading-node CMOS. Circuit designs support high throughput and low latency when implemented in an advanced fabrication stack with high-critical-current-density Josephson junctions of 1000$μ$A/$μ$m$^2$. Pulse-conserving logic produces one single-flux-quantum output for each input, and includes a three-input, three-output gate producing logical or3, majority3 and and3. Gate macros using dual-rail data encoding eliminate inversion latency and produce efficient implementations of all standard logic functions. A full adder using 70 Josephson junctions has a carry-out latency of 5ps corresponding to an effective 12 levels of logic at 30 GHz. JSRAM (Josephson SRAM) memory uses single-flux-quantum signals throughout an active array to achieve throughput at the same clock rate as the logic. The unit cell has eight Josephson junctions, signal propagation latency of 1ps, and a footprint of 2$μ$m$^2$. Projected density of JSRAM is 4 MB/cm$^2$, and computational density of pulse-conserving logic is on par with leading node CMOS accounting for power densities and clock rates.
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Submitted 29 March, 2023;
originally announced March 2023.
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Scaling NbTiN-based ac-powered Josephson digital to 400M devices/cm$^2$
Authors:
Anna Herr,
Quentin Herr,
Steve Brebels,
Min-Soo Kim,
Ankit Pokhrel,
Blake Hodges,
Trent Josephsen,
Sabine ONeal,
Ruiheng Bai,
Katja Nowack,
Anne-Marie Valente-Feliciano,
Zsolt Tökei
Abstract:
We describe a fabrication stackup for digital logic with 16 superconducting NbTiN layers, self-shunted a-silicon barrier Josephson Junctions (JJs), and low loss, high-$κ$ tunable HZO capacitors. The stack enables 400 MJJ/cm$^2$ device density, efficient routing, and AC power distribution on a resonant network. The materials scale beyond 28nm lithography and are compatible with standard high-temper…
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We describe a fabrication stackup for digital logic with 16 superconducting NbTiN layers, self-shunted a-silicon barrier Josephson Junctions (JJs), and low loss, high-$κ$ tunable HZO capacitors. The stack enables 400 MJJ/cm$^2$ device density, efficient routing, and AC power distribution on a resonant network. The materials scale beyond 28nm lithography and are compatible with standard high-temperature CMOS processes. We report initial results for two-metal layer NbTiN wires with 50nm critical dimension. A semi-ascendance wire-and-via process module using 193i lithography and 50nm critical dimension has shown cross-section uniformity of 1%=1s across the 300mm wafer, critical temperature of 12.5K, and critical current of 0.1mA at 4.2K. We also present a new design of the resonant AC power network enabled by NbTiN wires and HZO MIM capacitors. The design matches the device density and provides a 30 GHz clock with estimated efficiency of up to 90%. Finally, magnetic imaging of patterned NbTiN ground planes shows low intrinsic defectivity and consistent trapping of vorteces in 0.5 mm holes spaced on a 20 $μ$m x 20 $μ$m grid.
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Submitted 29 April, 2023; v1 submitted 29 March, 2023;
originally announced March 2023.
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Measurement and Data-Assisted Simulation of Bit Error Rate in RQL Circuits
Authors:
Quentin Herr,
Alex Braun,
Andrew Brownfield,
Ed Rudman,
Dan Dosch,
Trent Josephsen,
Anna Herr
Abstract:
A circuit-simulation-based method is used to determine the thermally-induced bit error rate of superconducting logic circuits. Simulations are used to evaluate the multidimensional Gaussian integral across noise current sources attached to the active devices. The method is data-assisted and has predictive power. Measurement determines the value of a single parameter, effective noise bandwidth, for…
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A circuit-simulation-based method is used to determine the thermally-induced bit error rate of superconducting logic circuits. Simulations are used to evaluate the multidimensional Gaussian integral across noise current sources attached to the active devices. The method is data-assisted and has predictive power. Measurement determines the value of a single parameter, effective noise bandwidth, for each error mechanism. The errors in the distributed networks of comparator-free RQL logic nucleate across multiple Josephson junctions, so the effective critical current is about three times that of the individual devices. The effective noise bandwidth is only 6-23% of the junction plasma frequency at a modest clock rate of 3.4GHz, which is 1% of the plasma frequency. This analysis shows the ways measured bit error rate comes out so much lower than simplistic estimates based on isolated devices.
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Submitted 20 April, 2021; v1 submitted 14 April, 2021;
originally announced April 2021.
