Laboratory-based X-ray Absorption Spectroscopy on a Working Pouch Cell Battery at Industrially-Relevant Charging Rates
Authors:
Evan P. Jahrman,
Lisa A. Pellerin,
Alexander S. Ditter,
Liam R. Bradshaw,
Timothy T. Fister,
Bryant J. Polzin,
Steven E. Trask,
Alison R. Dunlop,
Gerald T. Seidler
Abstract:
Li-ion battery (LIB) research has continuing importance for the entire range of applications from consumer products to vehicle electrification and grid stabilization. In many cases, standard electrochemical methods only provide an overall voltage or specific capacity, giving an inadequate description of parallel redox processes or chemical gradients at the particle and pack level. X-ray absorption…
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Li-ion battery (LIB) research has continuing importance for the entire range of applications from consumer products to vehicle electrification and grid stabilization. In many cases, standard electrochemical methods only provide an overall voltage or specific capacity, giving an inadequate description of parallel redox processes or chemical gradients at the particle and pack level. X-ray absorption fine structure (XAFS) is frequently used to augment bulk electrochemical data, as it provides element-specific changes in oxidation state and local atomic structure. Such microscopic descriptors are crucial for elucidating charge transfer and structural changes associated with bonding or site mixing, two key factors in evaluating state of charge and modes of cell failure. However, the impact of XAFS on LIB research has been significantly constrained by a logistical barrier: contemporary XAFS work is performed almost exclusively at synchrotron x-ray light sources, where beamtime is infrequent and experiment time-frames are limited. Here we show that modern laboratory based XAFS can not only be applied to, e.g., characterization of ex situ LIB electrode materials, but can also be used for operando studies at industrially-relevant charging rates in a standard pouch cell preparation. Such capability enables accelerated discovery of new materials and improved operation modes for LIBs.
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Submitted 24 May, 2019;
originally announced May 2019.
Vacuum Formed Temporary Spherical and Toroidal Bent Crystal Analyzers for High Resolution X-ray Spectroscopy
Authors:
Evan P. Jahrman,
William M. Holden,
Alexander S. Ditter,
Stosh A. Kozimor,
Scott L. Kihara,
Gerald T. Seidler
Abstract:
We demonstrate that vacuum forming of 10-cm diameter silicon wafers of various crystallographic orientations under an x-ray permeable, flexible window can easily generate spherically bent crystal analyzers (SBCA) and toroidally bent crystal analyzers (TBCA) with ~1-eV energy resolution and a 1-m major radius of curvature. In applications at synchrotron light sources, x-ray free electron lasers, an…
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We demonstrate that vacuum forming of 10-cm diameter silicon wafers of various crystallographic orientations under an x-ray permeable, flexible window can easily generate spherically bent crystal analyzers (SBCA) and toroidally bent crystal analyzers (TBCA) with ~1-eV energy resolution and a 1-m major radius of curvature. In applications at synchrotron light sources, x-ray free electron lasers, and laboratory spectrometers these characteristics are generally sufficient for many x-ray absorption fine structure (XAFS), x-ray emission spectroscopy (XES), and resonant inelastic x-ray scattering (RIXS) applications in the chemical sciences. Unlike existing optics manufacturing methods using epoxy or anodic bonding, vacuum forming without adhesive is temporary in the sense that the bent wafer can be removed when vacuum is released and exchanged for a different orientation wafer. Therefore, the combination of an x-ray compatible vacuum-forming chamber, a library of thin wafers, and a small number of forms having different secondary curvatures can give extreme flexibility in spectrometer energy range. As proof of this method we determine the energy resolution and reflectivity for several such vacuum-formed bent crystal analyzers (VF-BCA) in laboratory based XAFS and XES studies using a conventional x-ray tube. For completeness we also show x-ray images collected on the detector plane to characterize the resulting focal spots and optical aberrations.
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Submitted 13 September, 2018;
originally announced September 2018.
