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Quantitative approaches for multi-scale structural analysis with atomic resolution electron microscopy
Authors:
Noah Schnitzer,
Lopa Bhatt,
Ismail El Baggari,
Robert Hovden,
Benjamin H. Savitzky,
Michelle A. Smeaton,
Berit H. Goodge
Abstract:
Atomic-resolution imaging with scanning transmission electron microscopy is a powerful tool for characterizing the nanoscale structure of materials, in particular features such as defects, local strains, and symmetry-breaking distortions. In addition to advanced instrumentation, the effectiveness of the technique depends on computational image analysis to extract meaningful features from complex d…
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Atomic-resolution imaging with scanning transmission electron microscopy is a powerful tool for characterizing the nanoscale structure of materials, in particular features such as defects, local strains, and symmetry-breaking distortions. In addition to advanced instrumentation, the effectiveness of the technique depends on computational image analysis to extract meaningful features from complex datasets recorded in experiments, which can be complicated by the presence of noise and artifacts, small or overlapping features, and the need to scale analysis over large representative areas. Here, we present image analysis approaches which synergize real and reciprocal space information to efficiently and reliably obtain meaningful structural information with picometer scale precision across hundreds of nanometers of material from atomic-resolution electron microscope images. Damping superstructure peaks in reciprocal space allows symmetry-breaking structural distortions to be disentangled from other sources of inhomogeneity and measured with high precision. Real space fitting of the wave-like signals resulting from Fourier filtering enables absolute quantification of lattice parameter variations and strain, as well as the uncertainty associated with these measurements. Implementations of these algorithms are made available as an open source Python package.
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Submitted 1 April, 2025;
originally announced April 2025.
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Ultra-Cold Cryogenic TEM with Liquid Helium and High Stability
Authors:
Emily Rennich,
Suk Hyun Sung,
Nishkarsh Agarwal,
Maya Gates,
Robert Kerns,
Robert Hovden,
Ismail El Baggari
Abstract:
Cryogenic transmission electron microscopy has revolutionized structural biology and materials science, but achieving temperatures below the boiling point of liquid nitrogen remains a long-standing aspiration. We introduce an ultra-cold liquid helium transmission electron microscope specimen holder, featuring continuous cryogen flow and vibration decoupling. This instrument is compatible with mode…
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Cryogenic transmission electron microscopy has revolutionized structural biology and materials science, but achieving temperatures below the boiling point of liquid nitrogen remains a long-standing aspiration. We introduce an ultra-cold liquid helium transmission electron microscope specimen holder, featuring continuous cryogen flow and vibration decoupling. This instrument is compatible with modern aberration-corrected microscopes and achieves sub-25 K base temperature, ${\pm}$2 mK thermal stability over many hours, and atomic resolution--setting the stage for a new era of cryogenic electron microscopy.
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Submitted 1 February, 2024;
originally announced February 2024.
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Autonomous Electron Tomography Reconstruction with Machine Learning
Authors:
William Millsaps,
Jonathan Schwartz,
Zichao Wendy Di,
Yi Jiang,
Robert Hovden
Abstract:
Modern electron tomography has progressed to higher resolution at lower doses by leveraging compressed sensing methods that minimize total variation (TV). However, these sparsity-emphasized reconstruction algorithms introduce tunable parameters that greatly influence the reconstruction quality. Here, Pareto front analysis shows that high-quality tomograms are reproducibly achieved when TV minimiza…
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Modern electron tomography has progressed to higher resolution at lower doses by leveraging compressed sensing methods that minimize total variation (TV). However, these sparsity-emphasized reconstruction algorithms introduce tunable parameters that greatly influence the reconstruction quality. Here, Pareto front analysis shows that high-quality tomograms are reproducibly achieved when TV minimization is heavily weighted. However, in excess, compressed sensing tomography creates overly smoothed 3D reconstructions. Adding momentum to the gradient descent during reconstruction reduces the risk of over-smoothing and better ensures that compressed sensing is well behaved. For simulated data, the tedious process of tomography parameter selection is efficiently solved using Bayesian optimization with Gaussian processes. In combination, Bayesian optimization with momentum-based compressed sensing greatly reduces the required compute time$-$an 80% reduction was observed for the 3D reconstruction of SrTiO$_3$ nanocubes. Automated parameter selection is necessary for large scale tomographic simulations that enable the 3D characterization of a wider range of inorganic and biological materials.
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Submitted 8 September, 2023; v1 submitted 21 July, 2023;
originally announced August 2023.
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Imaging 3D Chemistry at 1 nm Resolution with Fused Multi-Modal Electron Tomography
Authors:
Jonathan Schwartz,
Zichao Wendy Di,
Yi Jiang,
Jason Manassa,
Jacob Pietryga,
Yiwen Qian,
Min Gee Cho,
Jonathan L. Rowell,
Huihuo Zheng,
Richard D. Robinson,
Junsi Gu,
Alexey Kirilin,
Steve Rozeveld,
Peter Ercius,
Jeffrey A. Fessler,
Ting Xu,
Mary Scott,
Robert Hovden
Abstract:
Measuring the three-dimensional (3D) distribution of chemistry in nanoscale matter is a longstanding challenge for metrological science. The inelastic scattering events required for 3D chemical imaging are too rare, requiring high beam exposure that destroys the specimen before an experiment completes. Even larger doses are required to achieve high resolution. Thus, chemical mapping in 3D has been…
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Measuring the three-dimensional (3D) distribution of chemistry in nanoscale matter is a longstanding challenge for metrological science. The inelastic scattering events required for 3D chemical imaging are too rare, requiring high beam exposure that destroys the specimen before an experiment completes. Even larger doses are required to achieve high resolution. Thus, chemical mapping in 3D has been unachievable except at lower resolution with the most radiation-hard materials. Here, high-resolution 3D chemical imaging is achieved near or below one nanometer resolution in a Au-Fe$_3$O$_4$ metamaterial, Co$_3$O$_4$ - Mn$_3$O$_4$ core-shell nanocrystals, and ZnS-Cu$_{0.64}$S$_{0.36}$ nanomaterial using fused multi-modal electron tomography. Multi-modal data fusion enables high-resolution chemical tomography often with 99\% less dose by linking information encoded within both elastic (HAADF) and inelastic (EDX / EELS) signals. Now sub-nanometer 3D resolution of chemistry is measurable for a broad class of geometrically and compositionally complex materials.
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Submitted 18 June, 2024; v1 submitted 24 April, 2023;
originally announced April 2023.
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Ronchigram Simulation and Training through Ronchigram.com
Authors:
Suk Hyun Sung,
Noah Schnitzer,
William Millsaps,
Lena F. Kourkoutis,
Robert Hovden
Abstract:
This article introduces a training simulator for electron beam alignment using Ronchigrams. The interactive web application, www.ronchigram.com, is an advanced educational tool aimed at making scanning transmission electron microscopy (STEM) more accessible and open. For experienced microscopists, the tool offers on-hand quantification of simulated Ronchigrams and their resolution limits.
This article introduces a training simulator for electron beam alignment using Ronchigrams. The interactive web application, www.ronchigram.com, is an advanced educational tool aimed at making scanning transmission electron microscopy (STEM) more accessible and open. For experienced microscopists, the tool offers on-hand quantification of simulated Ronchigrams and their resolution limits.
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Submitted 22 September, 2022;
originally announced September 2022.
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Imaging Atomic-Scale Chemistry from Fused Multi-Modal Electron Microscopy
Authors:
Jonathan Schwartz,
Zichao Wendy Di,
Yi Jiang,
Alyssa J. Fielitz,
Don-Hyung Ha,
Sanjaya D. Perera,
Ismail El Baggari,
Richard D. Robinson,
Jeffrey A. Fessler,
Colin Ophus,
Steve Rozeveld,
Robert Hovden
Abstract:
Efforts to map atomic-scale chemistry at low doses with minimal noise using electron microscopes are fundamentally limited by inelastic interactions. Here, fused multi-modal electron microscopy offers high signal-to-noise ratio (SNR) recovery of material chemistry at nano- and atomic- resolution by coupling correlated information encoded within both elastic scattering (high-angle annular dark fiel…
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Efforts to map atomic-scale chemistry at low doses with minimal noise using electron microscopes are fundamentally limited by inelastic interactions. Here, fused multi-modal electron microscopy offers high signal-to-noise ratio (SNR) recovery of material chemistry at nano- and atomic- resolution by coupling correlated information encoded within both elastic scattering (high-angle annular dark field (HAADF)) and inelastic spectroscopic signals (electron energy loss (EELS) or energy-dispersive x-ray (EDX)). By linking these simultaneously acquired signals, or modalities, the chemical distribution within nanomaterials can be imaged at significantly lower doses with existing detector hardware. In many cases, the dose requirements can be reduced by over one order of magnitude. This high SNR recovery of chemistry is tested against simulated and experimental atomic resolution data of heterogeneous nanomaterials.
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Submitted 5 November, 2023; v1 submitted 3 March, 2022;
originally announced March 2022.
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Optimal STEM Convergence Angle Selection using a Convolutional Neural Network and the Strehl Ratio
Authors:
Noah Schnitzer,
Suk Hyun Sung,
Robert Hovden
Abstract:
Selection of the correct convergence angle is essential for achieving the highest resolution imaging in scanning transmission electron microscopy (STEM). Use of poor heuristics, such as Rayleigh's quarter-phase rule, to assess probe quality and uncertainties in measurement of the aberration function result in incorrect selection of convergence angles and lower resolution. Here, we show that the St…
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Selection of the correct convergence angle is essential for achieving the highest resolution imaging in scanning transmission electron microscopy (STEM). Use of poor heuristics, such as Rayleigh's quarter-phase rule, to assess probe quality and uncertainties in measurement of the aberration function result in incorrect selection of convergence angles and lower resolution. Here, we show that the Strehl ratio provides an accurate and efficient to calculate criteria for evaluating probe size for STEM. A convolutional neural network trained on the Strehl ratio is shown to outperform experienced microscopists at selecting a convergence angle from a single electron Ronchigram using simulated datasets. Generating tens of thousands of simulated Ronchigram examples, the network is trained to select convergence angles yielding probes on average 85% nearer to optimal size at millisecond speeds (0.02% human assessment time). Qualitative assessment on experimental Ronchigrams with intentionally introduced aberrations suggests that trends in the optimal convergence angle size are well modeled but high accuracy requires extensive training datasets. This near immediate assessment of Ronchigrams using the Strehl ratio and machine learning highlights a viable path toward rapid, automated alignment of aberration-corrected electron microscopes.
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Submitted 23 July, 2020;
originally announced July 2020.
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Contamination of TEM Holders Quantified and Mitigated with Open-Hardware, High-Vacuum Bakeout System
Authors:
Yin Min Goh,
Jonathan Schwartz,
Emily Rennich,
Tao Ma,
Bobby Kerns,
Robert Hovden
Abstract:
Hydrocarbon contamination plagues high-resolution and analytical electron microscopy by depositing carbonaceous layers onto surfaces during electron irradiation, which can render carefully prepared specimens useless. Increased specimen thickness degrades resolution with beam broadening alongside loss of contrast. The large inelastic cross-section of carbon hampers accurate atomic species detection…
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Hydrocarbon contamination plagues high-resolution and analytical electron microscopy by depositing carbonaceous layers onto surfaces during electron irradiation, which can render carefully prepared specimens useless. Increased specimen thickness degrades resolution with beam broadening alongside loss of contrast. The large inelastic cross-section of carbon hampers accurate atomic species detection. Oxygen and water molecules pose problems of lattice damage by chemically etching the specimen during imaging. These constraints on high-resolution and spectroscopic imaging demand clean, high-vacuum microscopes with dry pumps. Here, we present an open-hardware design of a high-vacuum manifold for transmission electron microscopy (TEM) holders to mitigate hydrocarbon and residual species exposure. We quantitatively show that TEM holders are inherently dirty and introduce a range of unwanted chemical species. Overnight storage in our manifold reduces contaminants by 1-2 orders of magnitude and promotes 2-4 times faster vacuum recovery. A built-in bakeout system further reduces contaminants partial pressure to below $10^{-10}$ Torr (~4 orders of magnitude down from ambient storage) and alleviates monolayer adsorption during a typical TEM experiment. We determine that bakeout of TEM holder with specimen held therein is the optimal cleaning method. Our high-vacuum manifold design is published with open-source blueprints, parts list, and cost.
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Submitted 16 June, 2020;
originally announced June 2020.
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The Limits of Resolution and Dose for Aberration-Corrected Electron Tomography
Authors:
Reed Yalisove,
Suk Hyun Sung,
Peter Ercius,
Robert Hovden
Abstract:
Aberration-corrected electron microscopy can resolve the smallest atomic bond-lengths in nature. However, the high-convergence angles that enable spectacular resolution in 2D have unknown 3D resolution limits for all but the smallest objects ($< \sim$8nm). We show aberration-corrected electron tomography offers new limits for 3D imaging by measuring several focal planes at each specimen tilt. We p…
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Aberration-corrected electron microscopy can resolve the smallest atomic bond-lengths in nature. However, the high-convergence angles that enable spectacular resolution in 2D have unknown 3D resolution limits for all but the smallest objects ($< \sim$8nm). We show aberration-corrected electron tomography offers new limits for 3D imaging by measuring several focal planes at each specimen tilt. We present a theoretical foundation for aberration-corrected electron tomography by establishing analytic descriptions for resolution, sampling, object size, and dose---with direct analogy to the Crowther-Klug criterion. Remarkably, aberration-corrected scanning transmission electron tomography can measure complete 3D specimen structure of unbounded object sizes up to a specified cutoff resolution. This breaks the established Crowther limit when tilt increments are twice the convergence angle or smaller. Unprecedented 3D resolution is achievable across large objects. Atomic 3D imaging (1$\unicode{xC5}$) is allowed across extended objects larger than depth-of-focus (e.g. $>$ 20nm) using available microscopes and modest specimen tilting ($<$ 3$^\circ$). Furthermore, aberration-corrected tomography follows the rule of dose-fractionation where a specified total dose can be divided among tilts and defoci.
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Submitted 11 June, 2020;
originally announced June 2020.
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Electron tomography for functional nanomaterials
Authors:
Robert Hovden,
David A. Muller
Abstract:
Modern nanomaterials contain complexity that spans all three dimensions - from multigate semiconductors to clean energy nanocatalysts to complex block copolymers. For nanoscale characterization, it has been a long-standing goal to observe and quantify the three-dimensional (3D) structure - not just surfaces, but the entire internal volume and the chemical arrangement. Electron tomography estimates…
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Modern nanomaterials contain complexity that spans all three dimensions - from multigate semiconductors to clean energy nanocatalysts to complex block copolymers. For nanoscale characterization, it has been a long-standing goal to observe and quantify the three-dimensional (3D) structure - not just surfaces, but the entire internal volume and the chemical arrangement. Electron tomography estimates the complete 3D structure of nanomaterials from a series of two-dimensional projections taken across many viewing angles. Since its first introduction in 1968, electron tomography has progressed substantially in resolution, dose, and chemical sensitivity. In particular, scanning transmission electron microscope tomography has greatly enhanced the study of 3D nanomaterials by providing quantifiable internal morphology and spectroscopic detection of elements. Combined with recent innovations in computational reconstruction algorithms and 3D visualization tools, scientists can interactively dissect volumetric representations and extract meaningful statistics of specimens. This article highlights the maturing field of electron tomography and the widening scientific applications that utilize 3D structural, chemical, and functional imaging at the nanometer and subnanometer length scales.
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Submitted 2 June, 2020;
originally announced June 2020.
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Dynamic Compressed Sensing for Real-Time Tomographic Reconstruction
Authors:
Jonathan Schwartz,
Huihuo Zheng,
Marcus Hanwell,
Yi Jiang,
Robert Hovden
Abstract:
Electron tomography has achieved higher resolution and quality at reduced doses with recent advances in compressed sensing. Compressed sensing (CS) theory exploits the inherent sparse signal structure to efficiently reconstruct three-dimensional (3D) volumes at the nanoscale from undersampled measurements. However, the process bottlenecks 3D reconstruction with computation times that run from hour…
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Electron tomography has achieved higher resolution and quality at reduced doses with recent advances in compressed sensing. Compressed sensing (CS) theory exploits the inherent sparse signal structure to efficiently reconstruct three-dimensional (3D) volumes at the nanoscale from undersampled measurements. However, the process bottlenecks 3D reconstruction with computation times that run from hours to days. Here we demonstrate a framework for dynamic compressed sensing that produces a 3D specimen structure that updates in real-time as new specimen projections are collected. Researchers can begin interpreting 3D specimens as data is collected to facilitate high-throughput and interactive analysis. Using scanning transmission electron microscopy (STEM), we show that dynamic compressed sensing accelerates the convergence speed by 3-fold while also reducing its error by 27% for an Au/SrTiO3 nanoparticle specimen. Before a tomography experiment is completed, the 3D tomogram has interpretable structure within 33% of completion and fine details are visible as early as 66%. Upon completion of an experiment, a high-fidelity 3D visualization is produced without further delay. Additionally, reconstruction parameters that tune data fidelity can be manipulated throughout the computation without rerunning the entire process.
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Submitted 4 May, 2020;
originally announced May 2020.
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Sampling Limits for Electron Tomography with Sparsity-exploiting Reconstructions
Authors:
Yi Jiang,
Elliot Padgett,
Robert Hovden,
David A. Muller
Abstract:
Electron tomography (ET) has become a standard technique for 3D characterization of materials at the nano-scale. Traditional reconstruction algorithms such as weighted back projection suffer from disruptive artifacts with insufficient projections. Popularized by compressed sensing, sparsity-exploiting algorithms have been applied to experimental ET data and show promise for improving reconstructio…
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Electron tomography (ET) has become a standard technique for 3D characterization of materials at the nano-scale. Traditional reconstruction algorithms such as weighted back projection suffer from disruptive artifacts with insufficient projections. Popularized by compressed sensing, sparsity-exploiting algorithms have been applied to experimental ET data and show promise for improving reconstruction quality or reducing the total beam dose applied to a specimen. Nevertheless, theoretical bounds for these methods have been less explored in the context of ET applications. Here, we perform numerical simulations to investigate performance of l_1-norm and total-variation (TV) minimization under various imaging conditions. From 36,100 different simulated structures, our results show specimens with more complex structures generally require more projections for exact reconstruction. However, once sufficient data is acquired, dividing the beam dose over more projections provides no improvements - analogous to the traditional dose-fraction theorem. Moreover, a limited tilt range of +-75 or less can result in distorting artifacts in sparsity-exploiting reconstructions. The influence of optimization parameters on reconstructions is also discussed.
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Submitted 4 April, 2019;
originally announced April 2019.
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Image registration of low signal-to-noise cryo-STEM data
Authors:
Benjamin H. Savitzky,
Ismail El Baggari,
Colin Clement,
Emily Waite,
John P. Sheckelton,
Christopher Pasco,
Alemayehu S. Admasu,
Jaewook Kim,
Sang-Wook Cheong,
Tyrel M. McQueen,
Robert Hovden,
Lena F. Kourkoutis
Abstract:
Combining multiple fast image acquisitions to mitigate scan noise and drift artifacts has proven essential for picometer precision, quantitative analysis of atomic resolution scanning transmission electron microscopy (STEM) data. For very low signal-to-noise ratio (SNR) image stacks - frequently required for undistorted imaging at liquid nitrogen temperatures - image registration is particularly d…
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Combining multiple fast image acquisitions to mitigate scan noise and drift artifacts has proven essential for picometer precision, quantitative analysis of atomic resolution scanning transmission electron microscopy (STEM) data. For very low signal-to-noise ratio (SNR) image stacks - frequently required for undistorted imaging at liquid nitrogen temperatures - image registration is particularly delicate, and standard approaches may either fail, or produce subtly specious reconstructed lattice images. We present an approach which effectively registers and averages image stacks which are challenging due to their low-SNR and propensity for unit cell misalignments. Registering all possible image pairs in a multi-image stack leads to significant information surplus. In combination with a simple physical picture of stage drift, this enables identification of incorrect image registrations, and determination of the optimal image shifts from the complete set of relative shifts. We demonstrate the effectiveness of our approach on experimental, cryogenic STEM datasets, highlighting subtle artifacts endemic to low-SNR lattice images and how they can be avoided. High-SNR average images with information transfer out to 0.72 A are achieved at 300 kV and with the sample cooled to near liquid nitrogen temperature.
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Submitted 23 October, 2017;
originally announced October 2017.
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Nanomaterial datasets to advance tomography in scanning transmission electron microscopy
Authors:
Barnaby D. A. Levin,
Elliot Padgett,
Chien-Chun Chen,
M. C. Scott,
Rui Xu,
Wolfgang Theis,
Yi Jiang,
Yongsoo Yang,
Colin Ophus,
Haitao Zhang,
Don-Hyung Ha,
Deli Wang,
Yingchao Yu,
Hector D. Abruna,
Richard D. Robinson,
Peter Ercius,
Lena F. Kourkoutis,
Jianwei Miao,
David A. Muller,
Robert Hovden
Abstract:
Electron tomography in materials science has flourished with the demand to characterize nanoscale materials in three dimensions (3D). Access to experimental data is vital for developing and validating reconstruction methods that improve resolution and reduce radiation dose requirements. This work presents five high-quality scanning transmission electron microscope (STEM) tomography datasets in ord…
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Electron tomography in materials science has flourished with the demand to characterize nanoscale materials in three dimensions (3D). Access to experimental data is vital for developing and validating reconstruction methods that improve resolution and reduce radiation dose requirements. This work presents five high-quality scanning transmission electron microscope (STEM) tomography datasets in order to address the critical need for open access data in this field. The datasets represent the current limits of experimental technique, are of high quality, and contain materials with structural complexity. Included are tomographic series of a hyperbranched Co2P nanocrystal, platinum nanoparticles on a carbon nanofibre imaged over the complete 180° tilt range, a platinum nanoparticle and a tungsten needle both imaged at atomic resolution by equal slope tomography, and a through-focal tilt series of PtCu nanoparticles. A volumetric reconstruction from every dataset is provided for comparison and development of post-processing and visualization techniques. Researchers interested in creating novel data processing and reconstruction algorithms will now have access to state of the art experimental test data.
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Submitted 9 June, 2016;
originally announced June 2016.
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High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy
Authors:
Mark W. Tate,
Prafull Purohit,
Darol Chamberlain,
Kayla X. Nguyen,
Robert M. Hovden,
Celesta S. Chang,
Pratiti Deb,
Emrah Turgut,
John T. Heron,
Darrell G. Schlom,
Daniel C. Ralph,
Gregory D. Fuchs,
Katherine S. Shanks,
Hugh T. Philipp,
David A. Muller,
Sol M. Gruner
Abstract:
We describe a hybrid pixel array detector (EMPAD - electron microscope pixel array detector) adapted for use in electron microscope applications, especially as a universal detector for scanning transmission electron microscopy. The 128 x 128 pixel detector consists of a 500 um thick silicon diode array bump-bonded pixel-by-pixel to an application-specific integrated circuit (ASIC). The in-pixel ci…
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We describe a hybrid pixel array detector (EMPAD - electron microscope pixel array detector) adapted for use in electron microscope applications, especially as a universal detector for scanning transmission electron microscopy. The 128 x 128 pixel detector consists of a 500 um thick silicon diode array bump-bonded pixel-by-pixel to an application-specific integrated circuit (ASIC). The in-pixel circuitry provides a 1,000,000:1 dynamic range within a single frame, allowing the direct electron beam to be imaged while still maintaining single electron sensitivity. A 1.1 kHz framing rate enables rapid data collection and minimizes sample drift distortions while scanning. By capturing the entire unsaturated diffraction pattern in scanning mode, one can simultaneously capture bright field, dark field, and phase contrast information, as well as being able to analyze the full scattering distribution, allowing true center of mass imaging. The scattering is recorded on an absolute scale, so that information such as local sample thickness can be directly determined. This paper describes the detector architecture, data acquisition (DAQ) system, and preliminary results from experiments with 80 to 200 keV electron beams.
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Submitted 11 November, 2015;
originally announced November 2015.
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Breaking the Crowther Limit: Combining Depth-Sectioning and Tilt Tomography for High-Resolution, Wide-Field 3D Reconstructions
Authors:
Robert Hovden,
Peter Ercius,
Yi Jiang,
Deli Wang,
Yingchao Yu,
Hector D. Abruna,
Veit Elser,
David A. Muller
Abstract:
To date, high-resolution (< 1 nm) imaging of extended objects in three-dimensions (3D) has not been possible. A restriction known as the Crowther criterion forces a tradeoff between object size and resolution for 3D reconstructions by tomography. Further, the sub-Angstrom resolution of aberration-corrected electron microscopes is accompanied by a greatly diminished depth of field, causing regions…
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To date, high-resolution (< 1 nm) imaging of extended objects in three-dimensions (3D) has not been possible. A restriction known as the Crowther criterion forces a tradeoff between object size and resolution for 3D reconstructions by tomography. Further, the sub-Angstrom resolution of aberration-corrected electron microscopes is accompanied by a greatly diminished depth of field, causing regions of larger specimens (> 6 nm) to appear blurred or missing. Here we demonstrate a three-dimensional imaging method that overcomes both these limits by combining through-focal depth sectioning and traditional tilt-series tomography to reconstruct extended objects, with high-resolution, in all three dimensions. The large convergence angle in aberration corrected instruments now becomes a benefit and not a hindrance to higher quality reconstructions. A through-focal reconstruction over a 390 nm 3D carbon support containing over one hundred dealloyed and nanoporous PtCu catalyst particles revealed with sub-nanometer detail the extensive and connected interior pore structure that is created by the dealloying instability.
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Submitted 31 January, 2014;
originally announced February 2014.
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Bibliometrics for Internet Media: Applying the h-Index to YouTube
Authors:
Robert Hovden
Abstract:
The h-index can be a useful metric for evaluating a person's output of Internet media. Here we advocate and demonstrate adaption of the h-index and the g-index to the top video content creators on YouTube. The h-index for Internet video media is based on videos and their view counts. The index h is defined as the number of videos with >= h*10^5 views. The index g is defined as the number of videos…
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The h-index can be a useful metric for evaluating a person's output of Internet media. Here we advocate and demonstrate adaption of the h-index and the g-index to the top video content creators on YouTube. The h-index for Internet video media is based on videos and their view counts. The index h is defined as the number of videos with >= h*10^5 views. The index g is defined as the number of videos with >= g*10^5 views on average. When compared to a video creator's total view count, the h-index and g-index better capture both productivity and impact in a single metric.
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Submitted 4 March, 2013;
originally announced March 2013.
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Channeling of a sub-angstrom electron beam in a crystal mapped to two-dimensional molecular orbitals
Authors:
Robert Hovden,
Huolin L. Xin,
David A. Muller
Abstract:
The propagation of high-energy electrons in crystals is in general a complicated multiple scattering problem. However, along high-symmetry zone axes the problem can be mapped to the time evolution of a two-dimensional (2D) molecular system. Each projected atomic column can be approximated by the potential of a 2D screened hydrogenic atom. When two columns are in close proximity, their bound states…
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The propagation of high-energy electrons in crystals is in general a complicated multiple scattering problem. However, along high-symmetry zone axes the problem can be mapped to the time evolution of a two-dimensional (2D) molecular system. Each projected atomic column can be approximated by the potential of a 2D screened hydrogenic atom. When two columns are in close proximity, their bound states overlap and form analogs to molecular orbitals. For sub-angstrom electron beams, excitation of anti-symmetric orbitals can result in the failure of the simple incoherent imaging approximation. As a result, the standard resolution test and the one-to-one correspondence of atomic positions of a crystal imaged along a zone-axis with closely spaced projected columns ("dumbbells") can fail dramatically at finite and realistic sample thicknesses. This is demonstrated experimentally in high angle annular dark field scanning transmission electron microscope (HAADF STEM) images of [211]-oriented Si showing an apparent inter-column spacing of 1.28(+-.09) Angstroms, over 64% larger than the actual 0.78 Angstrom spacing. Furthermore, the apparent spacing can be tuned with sample thickness and probe size to produce a larger, smaller, or even the actual spacing under conditions when the peaks of two adjacent Si columns should not even have been resolved given the electron probe size.
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Submitted 5 December, 2012;
originally announced December 2012.
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Data Processing For Atomic Resolution EELS
Authors:
Paul Cueva,
Robert Hovden,
Julia A. Mundy,
Huolin L. Xin,
David A. Muller
Abstract:
The high beam current and sub-angstrom resolution of aberration-corrected scanning transmission electron microscopes has enabled electron energy loss spectroscopic (EELS) mapping with atomic resolution. These spectral maps are often dose-limited and spatially oversampled, leading to low counts/channel and are thus highly sensitive to errors in background estimation. However, by taking advantage of…
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The high beam current and sub-angstrom resolution of aberration-corrected scanning transmission electron microscopes has enabled electron energy loss spectroscopic (EELS) mapping with atomic resolution. These spectral maps are often dose-limited and spatially oversampled, leading to low counts/channel and are thus highly sensitive to errors in background estimation. However, by taking advantage of redundancy in the dataset map one can improve background estimation and increase chemical sensitivity. We consider two such approaches- linear combination of power laws and local background averaging-that reduce background error and improve signal extraction. Principal components analysis (PCA) can also be used to analyze spectrum images, but the poor peak-to-background ratio in EELS can lead to serious artifacts if raw EELS data is PCA filtered. We identify common artifacts and discuss alternative approaches. These algorithms are implemented within the Cornell Spectrum Imager, an open source software package for spectroscopic analysis.
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Submitted 13 December, 2011;
originally announced December 2011.
