Contactless Excitation of Acoustic Resonance in Insulating Wafers
Authors:
Gan Zhai,
Yizhou Xin,
Cameron J. Kopas,
Ella Lachman,
Mark Field,
Josh Y. Mutus,
Katarina Cicak,
Jose Aumentado,
Zuhawn Sung,
William P. Halperin
Abstract:
Contactless excitation and detection of high harmonic acoustic overtones in a thin insulator single crystal are described using radio frequency spectroscopy techniques. Single crystal [001] silicon wafer samples were investigated, one side covered with a Nb thin film, the common starting point for fabrication of quantum devices. The coupling between electromagnetic signals and mechanical oscillati…
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Contactless excitation and detection of high harmonic acoustic overtones in a thin insulator single crystal are described using radio frequency spectroscopy techniques. Single crystal [001] silicon wafer samples were investigated, one side covered with a Nb thin film, the common starting point for fabrication of quantum devices. The coupling between electromagnetic signals and mechanical oscillation is achieved from the Lorentz force generated by an external magnetic field. This method is suitable for any sample with a metallic surface or covered with a thin metal film. High resolution measurements of the temperature dependence of the sound velocity and elastic constants of silicon are reported and compared with known results.
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Submitted 21 September, 2022; v1 submitted 25 July, 2022;
originally announced July 2022.