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Single-shot X-ray ptychography as a structured illumination method
Authors:
Abraham Levitan,
Klaus Wakonig,
Zirui Gao,
Adam Kubec,
Bing Kuan Chen,
Oren Cohen,
Manuel Guizar-Sicairos
Abstract:
Single-shot ptychography is a quantitative phase imaging method wherein overlapping beams of light arranged in a grid pattern simultaneously illuminate a sample, allowing a full ptychographic dataset to be collected in a single shot. It is primarily used at optical wavelengths, but there is interest in using it for X-ray imaging. However, the constraints imposed by X-ray optics have limited the re…
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Single-shot ptychography is a quantitative phase imaging method wherein overlapping beams of light arranged in a grid pattern simultaneously illuminate a sample, allowing a full ptychographic dataset to be collected in a single shot. It is primarily used at optical wavelengths, but there is interest in using it for X-ray imaging. However, the constraints imposed by X-ray optics have limited the resolution achievable to date. In this work, we reinterpret single-shot ptychography as a structured illumination method by viewing the grid of beams as a single, highly structured illumination function. Pre-calibrating this illumination and reconstructing single-shot data using the randomized probe imaging algorithm allows us to account for the overlap and coherent interference between the diffraction arising from each beam. We achieve a resolution 3.5 times finer than the numerical aperture-based limit imposed by traditional algorithms for single-shot ptychography. We argue that this reconstruction method will work better for most single-shot ptychography experiments and discuss the implications for the design of future single-shot X-ray microscopes.
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Submitted 24 October, 2024;
originally announced October 2024.
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Fast Small-Angle X-ray Scattering Tensor Tomography: An Outlook into Future Applications in Life Sciences
Authors:
Christian Appel,
Margaux Schmeltz,
Irene Rodriguez-Fernandez,
Lukas Anschuetz,
Leonard C. Nielsen,
Ezequiel Panepucci,
Tomislav Marijolovic,
Klaus Wakonig,
Aleksandra Ivanovic,
Anne Bonnin,
Filip Leonarski,
Justyna Wojdyla,
Takashi Tomizaki,
Manuel Guizar-Sicairos,
Kate Smith,
John H. Beale,
Wayne Glettig,
Katherine McAuley,
Oliver Bunk,
Meitian Wang,
Marianne Liebi
Abstract:
Small Angle-X-ray Scattering Tensor Tomography (SAS-TT) is a relatively new, but powerful technique for studying the multiscale architecture of hierarchical structures, which is of particular interest for life science applications. Currently, the technique is very demanding on synchrotron beamtime, which limits its applications, especially for cases requiring a statistically relevant amount of sam…
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Small Angle-X-ray Scattering Tensor Tomography (SAS-TT) is a relatively new, but powerful technique for studying the multiscale architecture of hierarchical structures, which is of particular interest for life science applications. Currently, the technique is very demanding on synchrotron beamtime, which limits its applications, especially for cases requiring a statistically relevant amount of sample. This study reports the first SAS-TT measurement at a macromolecular X-ray crystallography beamline, PX-I at the SLS, with an improvement in data acquisition time from 96 h/Mvoxel in the pilot experiments to 6 h/Mvoxel, defining a new standard for fast SAS-TT and allowing the measurement of a full tomogram in 1.2 hours. Measurements were performed on the long and lenticular process of the incus bone, one of the three human auditory ossicles. The main orientation and degree of alignment of the mineralised collagen fibrils are characterised, as well as the size and shape of the mineral particles which show relevant variations in different tissue locations. The study reveals three distinct regions of high fibril alignment, most likely important pathways of sound throughout the ossicular chain, and highlights the potential of the technique to aid in future developments in middle ear reconstructive surgery.
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Submitted 19 June, 2024;
originally announced June 2024.
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Hard X-ray grazing incidence ptychography: Large field-of-view nanostructure imaging with ultra-high surface sensitivity
Authors:
P. S. Jørgensen,
L. Besley,
A. M. Slyamov,
A. Diaz,
M. Guizar-Sicairos,
M. Odstrcil,
M. Holler,
C. Silvestre,
B. Chang,
C. Detlefs,
J. W. Andreasen
Abstract:
We demonstrate a technique that allows highly surface sensitive imaging of nanostructures on planar surfaces over large areas, providing a new avenue for research in materials science, especially for \textit{in situ} applications. The capabilities of hard X-ray grazing incidence ptychography combine aspects from imaging, reflectometry and grazing incidence small angle scattering in providing large…
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We demonstrate a technique that allows highly surface sensitive imaging of nanostructures on planar surfaces over large areas, providing a new avenue for research in materials science, especially for \textit{in situ} applications. The capabilities of hard X-ray grazing incidence ptychography combine aspects from imaging, reflectometry and grazing incidence small angle scattering in providing large field-of-view images with high resolution transverse to the beam, horizontally and along the surface normal. Thus, it yields data with resolutions approaching electron microscopy, in two dimensions, but over much larger areas and with a poorer resolution in the third spatial dimension, along the beam propagation direction. Similar to grazing incidence small angle X-ray scattering, this technique facilitates the characterization of nanostructures across statistically significant surface areas or volumes within potentially feasible time frames for \textit{in situ} experiments, while also providing spatial information.
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Submitted 4 July, 2023;
originally announced July 2023.
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Small-angle scattering tensor tomography algorithm for robust reconstruction of complex textures
Authors:
Leonard C. Nielsen,
Paul Erhart,
Manuel Guizar-Sicairos,
Marianne Liebi
Abstract:
The development of small-angle scattering tensor tomography has enabled the study of anisotropic nanostructures in a volume-resolved manner. It is of great value to have reconstruction methods that can handle many different nanostructural symmetries. For such a method to be employed by researchers from a wide range of backgrounds, it is crucial that its reliance on prior knowledge about the system…
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The development of small-angle scattering tensor tomography has enabled the study of anisotropic nanostructures in a volume-resolved manner. It is of great value to have reconstruction methods that can handle many different nanostructural symmetries. For such a method to be employed by researchers from a wide range of backgrounds, it is crucial that its reliance on prior knowledge about the system is minimized, and that it is robust under various conditions. Here, we present a method employing band-limited spherical functions to enable the reconstruction of reciprocal space maps of a wide variety of nanostructures. This method has been thoroughly tested and compared to existing methods in its ability to retrieve known reciprocal space maps, as well as its robustness to changes in initial conditions, using both simulations and experimental data. The anchoring of this method in a framework of integral geometry and linear algebra highlights its possibilities and limitations.
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Submitted 12 May, 2023;
originally announced May 2023.
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Accelerated deep self-supervised ptycho-laminography for three-dimensional nanoscale imaging of integrated circuits
Authors:
Iksung Kang,
Yi Jiang,
Mirko Holler,
Manuel Guizar-Sicairos,
A. F. J. Levi,
Jeffrey Klug,
Stefan Vogt,
George Barbastathis
Abstract:
Three-dimensional inspection of nanostructures such as integrated circuits is important for security and reliability assurance. Two scanning operations are required: ptychographic to recover the complex transmissivity of the specimen; and rotation of the specimen to acquire multiple projections covering the 3D spatial frequency domain. Two types of rotational scanning are possible: tomographic and…
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Three-dimensional inspection of nanostructures such as integrated circuits is important for security and reliability assurance. Two scanning operations are required: ptychographic to recover the complex transmissivity of the specimen; and rotation of the specimen to acquire multiple projections covering the 3D spatial frequency domain. Two types of rotational scanning are possible: tomographic and laminographic. For flat, extended samples, for which the full 180 degree coverage is not possible, the latter is preferable because it provides better coverage of the 3D spatial frequency domain compared to limited-angle tomography. It is also because the amount of attenuation through the sample is approximately the same for all projections. However, both techniques are time consuming because of extensive acquisition and computation time. Here, we demonstrate the acceleration of ptycho-laminographic reconstruction of integrated circuits with 16-times fewer angular samples and 4.67-times faster computation by using a physics-regularized deep self-supervised learning architecture. We check the fidelity of our reconstruction against a densely sampled reconstruction that uses full scanning and no learning. As already reported elsewhere [Zhou and Horstmeyer, Opt. Express, 28(9), pp. 12872-12896], we observe improvement of reconstruction quality even over the densely sampled reconstruction, due to the ability of the self-supervised learning kernel to fill the missing cone.
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Submitted 10 April, 2023;
originally announced April 2023.
